Ion lenses, apertures, skimmers

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CPC
H01J49/067

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/067Ion lenses, apertures, skimmers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Low-power mass interrogation system and assay for determining vitam...
- Patent number 12,261,032
- Issue date Mar 25, 2025
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 12,243,734
- Issue date Mar 4, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-mode ionization apparatus and uses thereof
- Patent number 12,205,807
- Issue date Jan 21, 2025
- MSTM, LLC
- Milan Pophristic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometry
- Patent number 12,191,130
- Issue date Jan 7, 2025
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture plate assembly
- Patent number 12,165,862
- Issue date Dec 10, 2024
- Micromass UK Limited
- Edward Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer using unitary insert between first and second ion...
- Patent number 12,154,780
- Issue date Nov 26, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Outer source assembly and associated components
- Patent number 12,106,952
- Issue date Oct 1, 2024
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide with reduced noding effect
- Patent number 12,087,567
- Issue date Sep 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for transferring ions between trapping devices of variable...
- Patent number 12,080,535
- Issue date Sep 3, 2024
- Thermo Finnigan LLC.
- Jesse D. Canterbury
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ION interfaces and systems and methods using them
- Patent number 12,051,584
- Issue date Jul 30, 2024
- PerkinElmer Scientific Canada ULC
- Hamid Badiei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry ION source
- Patent number 12,033,843
- Issue date Jul 9, 2024
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increased dynamic range for the attenuation of an ion beam
- Patent number 12,027,357
- Issue date Jul 2, 2024
- DH Technologies Development Pte. Ltd.
- Bruce Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial CI source—off-axis electron beam
- Patent number 12,014,916
- Issue date Jun 18, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for reduced neutral contamination in a mass s...
- Patent number 12,002,672
- Issue date Jun 4, 2024
- DH Technologies Development Pte. Ltd.
- Bruce Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with charge up determiner using ion intensity signal
- Patent number 11,990,326
- Issue date May 21, 2024
- Shimadzu Corporation
- Kazuma Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 11,984,310
- Issue date May 14, 2024
- Analytik Jena GmbH
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filament assembly
- Patent number 11,972,937
- Issue date Apr 30, 2024
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining Vitam...
- Patent number 11,967,495
- Issue date Apr 23, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-device removal and installation tool
- Patent number 11,955,326
- Issue date Apr 9, 2024
- Agilent Technologies, Inc.
- Alan D. Loux
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Aperture device and analyzer arrangement
- Patent number 11,942,316
- Issue date Mar 26, 2024
- SCIENTA OMICRON AB
- Peter Amann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic equilibration time calculation to improve MS/MS dynamic range
- Patent number 11,923,183
- Issue date Mar 5, 2024
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion optics charging compensation
- Patent number 11,887,831
- Issue date Jan 30, 2024
- DH Technologies Development Pte. Ltd.
- Leigh Bedford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,887,832
- Issue date Jan 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing hydrogen and carbon products
- Patent number 11,873,219
- Issue date Jan 16, 2024
- SHELL USA, INC.
- Leonardo Spanu
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Mass spectrometer
- Patent number 11,869,759
- Issue date Jan 9, 2024
- Shimadzu Corporation
- Manabu Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 11,862,450
- Issue date Jan 2, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Charge detection mass spectrometry
- Patent number 11,837,452
- Issue date Dec 5, 2023
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion focusing
- Patent number 11,830,717
- Issue date Nov 28, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometer
- Publication number 20250046594
- Publication date Feb 6, 2025
- Shimadzu Corporation
- Takeshi UCHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20250029824
- Publication date Jan 23, 2025
- YOUNG IN ACE Co., Ltd.
- Sungwon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20250029825
- Publication date Jan 23, 2025
- YOUNG IN ACE Co., Ltd.
- Sungwon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS
- Publication number 20240420942
- Publication date Dec 19, 2024
- Micromass UK Limited
- Alastair BOOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240404810
- Publication date Dec 5, 2024
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Components Including Programmable Elements and De...
- Publication number 20240347332
- Publication date Oct 17, 2024
- PERKINELMER SCIENTIFIC CANADA ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20240339313
- Publication date Oct 10, 2024
- Agilent Technologies, Inc.
- Bruce D. QUIMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Elongated Electrodes
- Publication number 20240331996
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter Hauschild
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...
- Publication number 20240258093
- Publication date Aug 1, 2024
- QuadroCore Corp.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...
- Publication number 20240239653
- Publication date Jul 18, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Christoph WEHE
- C01 - INORGANIC CHEMISTRY
Information Patent Application
SEALING INTERFACE FOR CURTAIN CHAMBER
- Publication number 20240222104
- Publication date Jul 4, 2024
- DH Technologies Development Pte. Ltd.
- Stanislaw POTYRALA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DEVICE REMOVAL AND INSTALLATION TOOL
- Publication number 20240203721
- Publication date Jun 20, 2024
- Agilent Technologies, Inc.
- Alan D. LOUX
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
ION FOCUSING
- Publication number 20240186133
- Publication date Jun 6, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHABLE ION GUIDE
- Publication number 20240177985
- Publication date May 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning WEHRS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240136167
- Publication date Apr 25, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNING A MASS SPECTROMETER FILTER
- Publication number 20240087863
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20240063008
- Publication date Feb 22, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANAL...
- Publication number 20240055247
- Publication date Feb 15, 2024
- Exum Instruments
- Jeffrey WILLIAMS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Sampler Cones and Interfaces and Methods of Seali...
- Publication number 20240055248
- Publication date Feb 15, 2024
- PerkinElmer Scientific Canada ULC
- Hamid Badiei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING SAMPLES
- Publication number 20240047189
- Publication date Feb 8, 2024
- CMP Scientific Corp.
- Paul Nurmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIALLY PROGRESSIVE LENS FOR TRANSPORTING CHARGED PARTICLES
- Publication number 20240038521
- Publication date Feb 1, 2024
- Agilent Technologies, Inc.
- Tong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHABLE-PATH ION GUIDE
- Publication number 20240006173
- Publication date Jan 4, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE WITH REDUCED NODING EFFECT
- Publication number 20230343571
- Publication date Oct 26, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Henning WEHRS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range
- Publication number 20230335386
- Publication date Oct 19, 2023
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOTIP ION SOURCES AND METHODS
- Publication number 20230298878
- Publication date Sep 21, 2023
- Brown University
- Derek M. Stein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION FOCUSING
- Publication number 20230260772
- Publication date Aug 17, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230253197
- Publication date Aug 10, 2023
- SHIMADZU CORPORATION
- Yoshiharu YAMADA
- H01 - BASIC ELECTRIC ELEMENTS

Ion lenses, apertures, skimmers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Low-power mass interrogation system and assay for determining vitam...

Switchable ion guide

Multi-mode ionization apparatus and uses thereof

Charge detection mass spectrometry

Aperture plate assembly

Systems and methods for single particle analysis

Mass spectrometer using unitary insert between first and second ion...

Outer source assembly and associated components

Ion guide with reduced noding effect

Methods for transferring ions between trapping devices of variable...

ION interfaces and systems and methods using them

Mass spectrometry ION source

Increased dynamic range for the attenuation of an ion beam

Axial CI source—off-axis electron beam

Apparatus and methods for reduced neutral contamination in a mass s...

Mass spectrometer with charge up determiner using ion intensity signal

Mass spectrometry apparatus

Filament assembly

Low-power mass interrogation system and assay for determining Vitam...

High resolution imaging apparatus and method

Multi-device removal and installation tool

Aperture device and analyzer arrangement

Dynamic equilibration time calculation to improve MS/MS dynamic range

Automated ion optics charging compensation

Mass spectrometer

Process for producing hydrogen and carbon products

Mass spectrometer

Switchable ion guide

Charge detection mass spectrometry

Ion focusing

Patents Applicationslast 30 patents

Mass Spectrometer

MASS SPECTROMETER

Mass Spectrometer

OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS

MASS SPECTROMETER AND METHOD

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

Improved Low-Power Mass Interrogation System and Assay For Determin...

Mass Spectrometer Components Including Programmable Elements and De...

ION SOURCE

Ion Trap with Elongated Electrodes

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

AN ELECTRON IMPACT IONIZATION WITHIN RADIO FREQUENCY CONFINEMENT FI...

METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...

SEALING INTERFACE FOR CURTAIN CHAMBER

MULTI-DEVICE REMOVAL AND INSTALLATION TOOL

ION FOCUSING

SWITCHABLE ION GUIDE

MASS SPECTROMETER AND METHOD

TUNING A MASS SPECTROMETER FILTER

CHARGE DETECTION MASS SPECTROMETRY

OFF-AXIS ION EXTRACTION AND SHIELD GLASS ASSEMBLIES FOR SAMPLE ANAL...

Mass Spectrometer Sampler Cones and Interfaces and Methods of Seali...

SYSTEMS AND METHODS FOR ANALYZING SAMPLES

AXIALLY PROGRESSIVE LENS FOR TRANSPORTING CHARGED PARTICLES

SWITCHABLE-PATH ION GUIDE

ION GUIDE WITH REDUCED NODING EFFECT

Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range

NANOTIP ION SOURCES AND METHODS

ION FOCUSING

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER