Claims
- 1. A mass spectrometer, comprising:an ion source unit disposed in a substantially atmospheric pressure region, an ion trap type mass analyzer unit for mass analyzing the ions from said ion source unit, which is disposed in a vacuum region, an intermediate pressure region having a pressure greater than that of said vacuum region and less than that of said atmospheric pressure region, which is disposed between said substantially atmospheric pressure region and said vacuum region, a first electrode having an aperture for introducing the ions from said ion source unit into said intermediate pressure region; said first electrode being disposed between said substantially atmospheric pressure region and said intermediate pressure region, a second electrode having an aperture for introducing the ions from said intermediate pressure region into said ion trap type mass analyzer unit; said second electrode being disposed between said intermediate pressure region and said vacuum region, and an energy control unit for controlling the energy of the ions introduced in said ion trap type mass analyzer unit, wherein said energy control unit includes an electric power supply which applies a voltage on said second electrode for controlling the energy of the ions introduced in said ion trap type mass analyzer unit.
- 2. A mass spectrometer, comprising:an ion source for ionizing sample compounds, an ion trap type mass analyzer unit having an endcap electrode, which mass analyzes the ions from said ion source unit, a first electrode having an aperture, which is disposed between said ion source and said ion trap type mass analyzer, a second electrode having an aperture, which is disposed between said first electrode and said ion trap type mass analyzer, wherein each voltage of said endcap electrode, the first electrode and the second electrode differs from one another.
- 3. A mass spectrometer according to claim 2, further comprising:a detector for detecting ions ejected from said ion trap type mass analyzer, wherein voltages of said first electrode, said second electrode and said endcap electrode are defined according to the ion intensity detected by said detector.
- 4. A mass spectrometer according to claim 2, whereinthe voltage of said second electrode is less than that of said first electrode.
- 5. A mass spectrometer according to claim 2, whereinthe voltage of said second electrode is less than that of said endcap electrode.
Priority Claims (1)
Number |
Date |
Country |
Kind |
8-081186 |
Apr 1996 |
JP |
|
Parent Case Info
This a continuation application of U.S. application Ser. No. 09/447,578, filed Nov. 23, 1999, now U.S. Pat. No. 6,180,941, which is a continuation application of U.S. application Ser. No. 09/114,945, filed Jul. 14, 1998, now U.S. Pat. No. 6,011,260, which is a continuation of U.S. application Ser. No. 08/831,486, filed Mar. 31, 1997, now U.S. Pat. No. 5,825,027.
US Referenced Citations (5)
Non-Patent Literature Citations (1)
Entry |
Analytical Chemistry, 1990, vol. 62, No. 13, Jul. 1, 1990, “Electrospray Ionization Combined with Ion Trap Mass Spectrometry”, G. Van Berkel et al, pp. 1284-1295. |
Continuations (3)
|
Number |
Date |
Country |
Parent |
09/447578 |
Nov 1999 |
US |
Child |
09/739217 |
|
US |
Parent |
09/114945 |
Jul 1998 |
US |
Child |
09/447578 |
|
US |
Parent |
08/831486 |
Mar 1997 |
US |
Child |
09/114945 |
|
US |