Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Industry

CPC
G01R1/0408

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Chip-fixing device for a socket
- Patent number 12,142,868
- Issue date Nov 12, 2024
- CHROMA ATE INC.
- Hui-Jung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scalable tester for testing multiple devices under test
- Patent number 12,085,606
- Issue date Sep 10, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Grant
Electrical tree test device for silicone rubber material for cable...
- Patent number 12,055,577
- Issue date Aug 6, 2024
- XI'AN JIAOTONG UNIVERSITY
- Man Xu
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Pre-fabricated movable walk-in chamber for testing secondary cells
- Patent number 11,982,685
- Issue date May 14, 2024
- Northvolt AB
- Sean Stephenson
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture
- Patent number 11,933,815
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, or components for electrolytic corrosion prot...
- Patent number 11,906,547
- Issue date Feb 20, 2024
- Intel Corporation
- Minh Nhat Dang
- G01 - MEASURING TESTING
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 11,821,913
- Issue date Nov 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing error in time domain waveform of a s...
- Patent number 11,821,920
- Issue date Nov 21, 2023
- Keysight Technologies, Inc.
- Marlin E. Viss
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
- Patent number 11,809,552
- Issue date Nov 7, 2023
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing electronic apparatus, adhesive film for ma...
- Patent number 11,747,388
- Issue date Sep 5, 2023
- Mitsui Chemicals Tohcello, Inc.
- Eiji Hayashishita
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for singulated semiconductor dies with sliding layer
- Patent number 11,651,980
- Issue date May 16, 2023
- ams AG
- Christoph Reith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adapter device, holding clamp, and method for positioning a conduct...
- Patent number 11,630,125
- Issue date Apr 18, 2023
- BizLink Industry Germany GmbH
- Nikolaj Giske
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test apparatuses for semiconductor devices
- Patent number 11,604,220
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Hyung Il Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus which tests semiconductor chips
- Patent number 11,506,740
- Issue date Nov 22, 2022
- Samsung Electronics Co., Ltd.
- Ung Jin Jang
- G01 - MEASURING TESTING
Information Patent Grant
Ceramic, probe guiding member, probe card, and socket for package i...
- Patent number 11,485,686
- Issue date Nov 1, 2022
- FERROTEC MATERIAL TECHNOLOGIES CORPORATION
- Wataru Yamagishi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate testing apparatus
- Patent number 11,467,205
- Issue date Oct 11, 2022
- Samsung Electronics Co., Ltd.
- Kyoonwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and method of manufacturing the same
- Patent number 11,467,185
- Issue date Oct 11, 2022
- Sharp Kabushiki Kaisha
- Kazuo Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation method
- Patent number 11,460,424
- Issue date Oct 4, 2022
- Toyota Jidosha Kabushiki Kaisha
- Hisato Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical plug and methods for testing an electrical mains socket...
- Patent number 11,454,678
- Issue date Sep 27, 2022
- MEGGER INSTRUMENTS LTD
- Stanislaw Zurek
- G01 - MEASURING TESTING
Information Patent Grant
Contact device for electrical test
- Patent number 11,442,079
- Issue date Sep 13, 2022
- ISC CO., LTD.
- Young Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing system
- Patent number 11,435,396
- Issue date Sep 6, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic components
- Patent number 11,385,257
- Issue date Jul 12, 2022
- HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
- Jun Chen
- G01 - MEASURING TESTING
Information Patent Grant
Stiffener having an elastic portion
- Patent number 11,378,586
- Issue date Jul 5, 2022
- Samsung Electronics Co., Ltd.
- Joonsu Ji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive particles and test socket having the same
- Patent number 11,373,779
- Issue date Jun 28, 2022
- SNOW CO., LTD.
- Gyu Sun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system
- Patent number 11,360,115
- Issue date Jun 14, 2022
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Testing device with power protection and its testing platform
- Patent number 11,360,116
- Issue date Jun 14, 2022
- Chenbro Micom Co., Ltd.
- Cheng-Han Yu
- G01 - MEASURING TESTING
Information Patent Grant
Combined transmitted and reflected light imaging of internal cracks...
- Patent number 11,340,284
- Issue date May 24, 2022
- KLA Corporation
- Kristiaan Van Rossen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MOUNTING SYSTEM, AND METHODS THEREOF
- Publication number 20240337681
- Publication date Oct 10, 2024
- Ferroelectric Memory GmbH
- Michael BATHON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR PACKAGE
- Publication number 20240337688
- Publication date Oct 10, 2024
- TSE CO., LTD.
- Dae Hyun ROH
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND EARLY WARNING SYSTEM
- Publication number 20240329079
- Publication date Oct 3, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YING-QUAN ZHAO
- G01 - MEASURING TESTING
Information Patent Application
Probe Device
- Publication number 20240288472
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Naoki SAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRE-FABRICATED MOVABLE WALK-IN CHAMBER FOR TESTING SECONDARY CELLS
- Publication number 20240255544
- Publication date Aug 1, 2024
- NORTHVOLT AB
- Sean Stephenson
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC ELECTROCONDUCTIVE SHEET, METHOD FOR PRODUCING SAME, ELE...
- Publication number 20240219422
- Publication date Jul 4, 2024
- MITSUI CHEMICALS, INC.
- Katsunori NISHIURA
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET
- Publication number 20240094251
- Publication date Mar 21, 2024
- TSE CO., LTD
- Chang Su OH
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Test Equipment and Method of Performing Current and V...
- Publication number 20240053400
- Publication date Feb 15, 2024
- JCET STATS ChipPAC Korea Limited
- YongJu Lee
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
- Publication number 20240027492
- Publication date Jan 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
Sensor Assembly Outputting a Condition of a Sensor
- Publication number 20230384354
- Publication date Nov 30, 2023
- MEASUREMENT SPECIALTIES, INC.
- Jeffrey Creak
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN, INSPECTION APPARATUS, AND MOLD...
- Publication number 20230384346
- Publication date Nov 30, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, APPARATUSES, OR COMPONENTS FOR ELECTROLYTIC CORROSION PROT...
- Publication number 20230358783
- Publication date Nov 9, 2023
- Intel Corporation
- Minh Nhat DANG
- G01 - MEASURING TESTING
Information Patent Application
Method for Extracting Characteristics of Broadband Passive Element...
- Publication number 20230266404
- Publication date Aug 24, 2023
- Huwin Co.,Ltd.
- Jaeyong CHO
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONDUCTIVE SHEET, METHOD FOR MANUFACTURING ANISOTROPIC...
- Publication number 20230209711
- Publication date Jun 29, 2023
- Mitsui Chemicals, Inc.
- Katsunori Nishiura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRE-FABRICATED MOVABLE WALK-IN CHAMBER FOR TESTING SECONDARY CELLS
- Publication number 20230168276
- Publication date Jun 1, 2023
- NORTHVOLT AB
- Sean Stephenson
- G01 - MEASURING TESTING
Information Patent Application
SOCKETLESS OR FLUSH MOUNT QFN (QUAD FLAT NO LEAD) TEST BOARD, FIXTU...
- Publication number 20230137253
- Publication date May 4, 2023
- Raytheon Company
- David Yu Shan Sun
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
- Publication number 20230098635
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Kiljoong YUN
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC ELECTRONIC DEVICE
- Publication number 20230075038
- Publication date Mar 9, 2023
- PLESSEY SEMICONDUCTORS LIMITED
- John WHITEMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS
- Publication number 20230060495
- Publication date Mar 2, 2023
- ARRIS Enterprises LLC
- Sergio Alfredo Mendoza AGUIRRE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TREE TEST DEVICE FOR SILICONE RUBBER MATERIAL FOR CABLE...
- Publication number 20230026806
- Publication date Jan 26, 2023
- XI'AN JIAOTONG UNIVERSITY
- Man XU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE FIXATION MECHANISM FOR TEST WITH NANO-PROBE, APPARATUS FOR T...
- Publication number 20220381804
- Publication date Dec 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jiabao CHEN
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND ITS ELEMENT PICKUP MODULE
- Publication number 20220291256
- Publication date Sep 15, 2022
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
Scalable Tester for Testing Multiple Devices Under Test
- Publication number 20220252662
- Publication date Aug 11, 2022
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Application
CHIP-FIXING DEVICE FOR A SOCKET
- Publication number 20220200185
- Publication date Jun 23, 2022
- CHROMA ATE INC.
- HUI-JUNG WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUSES FOR SEMICONDUCTOR DEVICES
- Publication number 20220146571
- Publication date May 12, 2022
- Samsung Electronics Co., Ltd.
- Hyung Il KIM
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
- Publication number 20220137092
- Publication date May 5, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING SYSTEM
- Publication number 20220128621
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE TESTING APPARATUS
- Publication number 20220107355
- Publication date Apr 7, 2022
- Samsung Electronics Co., Ltd.
- Kyoonwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG SUPPORT TOOL, SUPPORT TOOL, AND INSPECTION JIG
- Publication number 20220082585
- Publication date Mar 17, 2022
- Yokowo Co., Ltd.
- Chikara MIURA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...
- Publication number 20220075869
- Publication date Mar 10, 2022
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING

Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chip-fixing device for a socket

Semi-automatic prober

Sample fixation mechanism for test with nano-probe, apparatus for t...

Scalable tester for testing multiple devices under test

Electrical tree test device for silicone rubber material for cable...

Test socket for performing a test on an electronic device

Pre-fabricated movable walk-in chamber for testing secondary cells

Test fixture

Systems, apparatuses, or components for electrolytic corrosion prot...

Shielded socket and carrier for high-volume test of semiconductor d...

System and method for reducing error in time domain waveform of a s...

Systems, methods, and apparatuses for intrusion detection and analy...

Method for manufacturing electronic apparatus, adhesive film for ma...

Testing apparatus for singulated semiconductor dies with sliding layer

Adapter device, holding clamp, and method for positioning a conduct...

Test apparatuses for semiconductor devices

Test apparatus which tests semiconductor chips

Ceramic, probe guiding member, probe card, and socket for package i...

Substrate testing apparatus

Test socket and method of manufacturing the same

Evaluation method

Electrical plug and methods for testing an electrical mains socket...

Contact device for electrical test

Chip testing system

Apparatus for testing electronic components

Stiffener having an elastic portion

Conductive particles and test socket having the same

Inspection system

Testing device with power protection and its testing platform

Combined transmitted and reflected light imaging of internal cracks...

Patents Applicationslast 30 patents

MOUNTING SYSTEM, AND METHODS THEREOF

APPARATUS FOR TESTING SEMICONDUCTOR PACKAGE

TEST FIXTURE AND EARLY WARNING SYSTEM

Probe Device

PRE-FABRICATED MOVABLE WALK-IN CHAMBER FOR TESTING SECONDARY CELLS

ANISOTROPIC ELECTROCONDUCTIVE SHEET, METHOD FOR PRODUCING SAME, ELE...

TEST SOCKET

Semiconductor Test Equipment and Method of Performing Current and V...

SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...

Sensor Assembly Outputting a Condition of a Sensor

ELECTRICALLY CONDUCTIVE CONTACT PIN, INSPECTION APPARATUS, AND MOLD...

SYSTEMS, APPARATUSES, OR COMPONENTS FOR ELECTROLYTIC CORROSION PROT...

Method for Extracting Characteristics of Broadband Passive Element...

ANISOTROPIC CONDUCTIVE SHEET, METHOD FOR MANUFACTURING ANISOTROPIC...

PRE-FABRICATED MOVABLE WALK-IN CHAMBER FOR TESTING SECONDARY CELLS

SOCKETLESS OR FLUSH MOUNT QFN (QUAD FLAT NO LEAD) TEST BOARD, FIXTU...

TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE

MONOLITHIC ELECTRONIC DEVICE

ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS

ELECTRICAL TREE TEST DEVICE FOR SILICONE RUBBER MATERIAL FOR CABLE...

SAMPLE FIXATION MECHANISM FOR TEST WITH NANO-PROBE, APPARATUS FOR T...

TESTING APPARATUS AND ITS ELEMENT PICKUP MODULE

Scalable Tester for Testing Multiple Devices Under Test

CHIP-FIXING DEVICE FOR A SOCKET

TEST APPARATUSES FOR SEMICONDUCTOR DEVICES

SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...

CHIP TESTING SYSTEM

SUBSTRATE TESTING APPARATUS

INSPECTION JIG SUPPORT TOOL, SUPPORT TOOL, AND INSPECTION JIG

SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...