Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/IB96/00209 | 3/13/1996 | 9/14/1998 | 9/14/1998 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO97/34122 | 9/18/1997 |
Number | Name | Date | Kind |
---|---|---|---|
5276672 | Miyazaki et al. | Jan 1994 | |
5461907 | Tench et al. | Oct 1995 | |
5475318 | Marcus et al. | Dec 1995 | |
5540958 | Bothra et al. | Jul 1996 |
Number | Date | Country |
---|---|---|
472342 | Feb 1992 | EPX |
919073 | Oct 1954 | DEX |
60-161508 | Aug 1985 | JPX |
29894 | Dec 1994 | WOX |
Entry |
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IBM Technical Disclosure Bulletin, "Double Cantilever Sensor for Thin-Hardness Testing and Mass Storage Application", vol. 34, No. 10a, Mar. 1992, pp. 194-195. |
Mamin, "Thermal Writing Using a Heated Atomic Microscope Tip", Appl. Phys. Lett., vol. 69, No. 03, Jul. 15, 1996, pp. 433-435. |