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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

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G01Q70/10Shape or taper

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Patents Grantslast 30 patents

Information Patent Grant
Probe chip, scan head, scanning probe microscopy device and use of...
- Patent number 12,117,467
- Issue date Oct 15, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of providing a MEMS device comprising a pyramidal protrusion...
- Patent number 12,013,415
- Issue date Jun 18, 2024
- SmartTip B.V.
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
- Patent number 11,970,392
- Issue date Apr 30, 2024
- Zhejiang University
- Huan Hu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
- Patent number 11,719,719
- Issue date Aug 8, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Probe, method of manufacturing a probe and scanning probe microscop...
- Patent number 11,698,389
- Issue date Jul 11, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe having micro-tip, method and apparatus for manufactu...
- Patent number 11,579,169
- Issue date Feb 14, 2023
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,573,247
- Issue date Feb 7, 2023
- Xallent INC.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope probes and methods of manufacturing probes
- Patent number 11,499,990
- Issue date Nov 15, 2022
- Nanosurf AG
- Dominik Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing a probe device for scanning probe microscopy
- Patent number 11,480,588
- Issue date Oct 25, 2022
- Nanotools GmbH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,448,664
- Issue date Sep 20, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Tip-enhanced Raman spectroscope system
- Patent number 11,268,978
- Issue date Mar 8, 2022
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,237,188
- Issue date Feb 1, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,169,177
- Issue date Nov 9, 2021
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector for scanning probe microscope
- Patent number 11,169,176
- Issue date Nov 9, 2021
- JERUSALEM COLLEGE OF TECHNOLOGY (JCT), LEV ACADEMIC CENTER
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
AFM with suppressed parasitic signals
- Patent number 11,156,633
- Issue date Oct 26, 2021
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe having micro-tip, method and apparatus for manufactu...
- Patent number 11,156,636
- Issue date Oct 26, 2021
- National Institute of Metrology, China
- Zhen-Dong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,125,774
- Issue date Sep 21, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
In situ tribometer and methods of use
- Patent number 10,908,069
- Issue date Feb 2, 2021
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- G01 - MEASURING TESTING
Information Patent Grant
Conical nano-carbon material functionalized needle tip and preparat...
- Patent number 10,823,758
- Issue date Nov 3, 2020
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Large radius probe
- Patent number 10,802,045
- Issue date Oct 13, 2020
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
AFM with suppressed parasitic signals
- Patent number 10,794,930
- Issue date Oct 6, 2020
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating nano-scale structures on the edge and nano-sc...
- Patent number 10,782,313
- Issue date Sep 22, 2020
- Hangzhou Tanzhen Nanotech. Co., Ltd.
- Shuo Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and testing device
- Patent number 10,782,314
- Issue date Sep 22, 2020
- BOE Technology Group Co., Ltd.
- Pijian Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods for designing and processing a microcantilever-based probe...
- Patent number 10,739,379
- Issue date Aug 11, 2020
- Southwest Jiaotong University
- Linmao Qian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
- Publication number 20240002220
- Publication date Jan 4, 2024
- ZHEJIANG UNIVERSITY
- Huan HU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
- Publication number 20230417795
- Publication date Dec 28, 2023
- University of Central Florida Research Foundation, Inc.
- Laurene Tetard
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
- Publication number 20230324433
- Publication date Oct 12, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...
- Publication number 20230160924
- Publication date May 25, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...
- Publication number 20230113008
- Publication date Apr 13, 2023
- UNIVERSITAT BASEL
- Brendan SHIELDS
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...
- Publication number 20230046236
- Publication date Feb 16, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
Large Radius Probe
- Publication number 20230021148
- Publication date Jan 19, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
A METHOD OF PROVIDING A MEMS DEVICE COMPRISING A PYRAMIDAL PROTRUSI...
- Publication number 20220187336
- Publication date Jun 16, 2022
- SMARTTIP B.V.
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TIP-ENHANCED RAMAN SPECTROSCOPE SYSTEM
- Publication number 20220128596
- Publication date Apr 28, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20220128595
- Publication date Apr 28, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...
- Publication number 20220091069
- Publication date Mar 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus VAN ES
- G01 - MEASURING TESTING
Information Patent Application
PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD
- Publication number 20220050125
- Publication date Feb 17, 2022
- SHOWA DENKO K.K.
- Tsuyoshi KATO
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20220026464
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTU...
- Publication number 20220003799
- Publication date Jan 6, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- ZHEN-DONG ZHU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20210389346
- Publication date Dec 16, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...
- Publication number 20210318352
- Publication date Oct 14, 2021
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Lidia MARTINEZ ORELLANA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210318351
- Publication date Oct 14, 2021
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278435
- Publication date Sep 9, 2021
- Bar-llan University
- Zeev ZALEVSKY
- G01 - MEASURING TESTING
Information Patent Application
PROBE CHIP, SCAN HEAD, SCANNING PROBE MICROSCOPY DEVICE AND USE OF...
- Publication number 20210278436
- Publication date Sep 9, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Large Radius Probe
- Publication number 20210132110
- Publication date May 6, 2021
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
AFM with Suppressed Parasitic Signals
- Publication number 20200371134
- Publication date Nov 26, 2020
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20200341028
- Publication date Oct 29, 2020
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20200249255
- Publication date Aug 6, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES
- Publication number 20200124636
- Publication date Apr 23, 2020
- SCUBA PROBE TECHNOLOGIES LLC
- Dominik ZIEGLER
- G01 - MEASURING TESTING

Shape or taper

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe chip, scan head, scanning probe microscopy device and use of...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Method of providing a MEMS device comprising a pyramidal protrusion...

Self-packing three-arm thermal scanning probe for micro-nano manufa...

Large radius probe

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Metrology probe with built-in angle and method of fabrication thereof

Probe, method of manufacturing a probe and scanning probe microscop...

Atomic force microscopy cantilever, system and method

Scanning probe having micro-tip, method and apparatus for manufactu...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Atomic force microscope probes and methods of manufacturing probes

Method for providing a probe device for scanning probe microscopy

Large radius probe

Tip-enhanced Raman spectroscope system

Scanning probe and electron microscope probes and their manufacture

Scanning probe and electron microscope probes and their manufacture

Photodetector for scanning probe microscope

AFM with suppressed parasitic signals

Scanning probe having micro-tip, method and apparatus for manufactu...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Method and tip substrate for scanning probe microscopy

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

In situ tribometer and methods of use

Conical nano-carbon material functionalized needle tip and preparat...

Large radius probe

AFM with suppressed parasitic signals

Method of fabricating nano-scale structures on the edge and nano-sc...

Probe assembly and testing device

Methods for designing and processing a microcantilever-based probe...

Patents Applicationslast 30 patents

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Scanning Probe Microscope, Sample Observation Processing System, an...

SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

PROBE, METHOD OF MANUFACTURING A PROBE AND SCANNING PROBE MICROSCOP...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND...

METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY...

Large Radius Probe

A METHOD OF PROVIDING A MEMS DEVICE COMPRISING A PYRAMIDAL PROTRUSI...

TIP-ENHANCED RAMAN SPECTROSCOPE SYSTEM

Scanning Probe and Electron Microscope Probes and Their Manufacture

CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTU...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE

PROBE CHIP, SCAN HEAD, SCANNING PROBE MICROSCOPY DEVICE AND USE OF...

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

Large Radius Probe

METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY

AFM with Suppressed Parasitic Signals

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES