MEMORY DEVICES SUPPORTING READ/MODIFY/WRITE MEMORY OPERATIONS INVOLVING BOTH VOLATILE MEMORY AND NONVOLATILE MEMORY

Abstract
Exemplary apparatus includes a nonvolatile memory, a volatile memory separate from the nonvolatile memory, and a controller configured to access the volatile memory and the nonvolatile memory. Exemplary volatile memory is configured to function as a read/write cache. The controller may be configured to perform a read/modify/write memory operation that involves both the volatile memory and the nonvolatile memory. Exemplary devices may have a host interface and may include a data connection configured to perform double data rate data transfer. Exemplary volatile memory may support byte-granularity memory read operations, and the density of the volatile memory may be substantially less than the density of the nonvolatile memory.
Description
BACKGROUND

Nonvolatile memory systems, subsystems and integrated circuits are used in multiple consumer, computer and communications applications. They can be a NAND flash memory IC or NOR flash memory. Part of the memory system may contain volatile memory like static random access memory (SRAM) or dynamic random access memory (DRAM). They can be many IC's mounted on a memory card or module. A subsystem may contain at least one such module and a memory controller. A system may contain several subsystems as well as multi core CPU's (Central Processing Unit). The memory integrated circuits used in such a system may be SLC (single level) or MLC (multi level) storage. The read/write access ports to the system may be single ported or multi ported.


Today's dominant memory is flash. In flash, the dominant architecture is NAND flash. In spite of the fact that the internal IC architecture of NAND (or for that matter other flash architectures like NOR, OneNAND™) has “page” architecture for read and write access, the performance (read time, program/write time) is slow compared to volatile memory systems built with SRAMs and DRAMs. The “page” architecture in NAND indeed has “static latches” that can temporarily store data as a buffer (one page per block), and sometimes have an additional “write cache buffer” for the whole IC. The page is 1 KB (1,024 bytes) to 2 KB (2,048 bytes). Each nonvolatile memory block of NAND flash memory cells, may have 64 to 128 pages (or, 128 KB to 256 KB). Still, the performance is relatively poor to mediocre at best from a randomly and independently accessible perspective per each byte of data. The “page buffered architecture” of today's NAND flash memory does not lend itself to true, fast, read and write memory access for SSD (solid state disk) and similar commercial applications in PCs and servers for data computation, storage and multimedia execution.


The invention described in this utility patent application focuses on ways to modify the already existing “buffers” in an optimal manner to enhance the random access performance of nonvolatile IC, subsystem and system. The volatile random access memory (RAM) in a preferred embodiment is a 6-transistor SRAM memory cell at the core, and complete peripheral address decoding circuitry for independent accessible access (read, write etc) at a fine grain level of a bit, or byte. In another embodiment, the volatile RAM in each block can be an 8-transistor dual-ported SRAM. In another embodiment, the nonvolatile memory can be a DRAM. The invention is applicable to other nonvolatile or pseudo non volatile memories like PCM (phase change memory), nano crystalline memory, charge trapped memory, ferroelectric memory, magnetic memory, plastic memory and similar embodiments.


SUMMARY

The preferred embodiment adds new commands to be executed in the Command Register of the NVM (nonvolatile memory). In other embodiments, these commands can be shared between the NVM IC and memory controller. Prior art NVM IC's have limited commands like (1) read page in flash; (2) erase block in flash; (3) program page in flash, etc. With this invention, new additional commands are executed: (4) read page in the SRAM of the block only; (5) read new page from the nonvolatile memory (NVM) block; (6) write page into SRAM of the block, but, not program into the NVM block until such a command is additionally given. This invention provides every page of each NVM block as an independently accessible random access memory to perform load/store applications, as well as a coupled memory to the assigned NVM block. Each NVM NAND flash may have 1,024 such blocks. Each block is typically 64 kilobytes in density. Page for each block is typically 1 to 2 kilobytes and each bit is independently addressable in a random manner, as well as accessed in a random manner. Error correction and detection to the memory on a page basis can be implemented as well either on the NVM IC or in the memory controller.


Another preferred embodiment selects any of the currently unused blocks and uses the SRAM pages in those blocks to perform other operations as necessary. Such data manipulating operations can be arithmetic and/or logic operations. In another preferred embodiment, the “volatile memory of a page” is a DRAM. That DRAM, again, is independently accessible and addressable in a random manner.





BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding, reference is now made to the following description taken in conjunction with the accompanying Drawings in which:



FIG. 1 is a diagram showing a nonvolatile memory system with features as described for the present invention.



FIG. 2 shows an exemplary NAND memory integrated circuit as one element of the NVMS (nonvolatile memory system).



FIG. 3 shows various components of a controller for the nonvolatile memory system (NVMS) of this invention.



FIG. 4 shows a novel implementation of block erase per this invention.



FIG. 5 shows a flash memory controller with block erase feature.



FIG. 6 shows a current NAND flash chip architecture by Samsung.



FIG. 7 shows a pin out for a 1 Gb Samsung flash memory.



FIG. 8 shows some operational features of the above Samsung flash memory.



FIG. 9 shows how the invention of this patent distinguishes itself from today's nonvolatile memory.



FIG. 10 shows improved features of this invention compared to currently available (commercial) multichip NVMS solutions.



FIG. 11 shows how the “random access memory” of this invention can be implemented in dual port access for enhanced performance.



FIG. 12 shows a high level architecture of the NVMS of this invention which comprises both nonvolatile and volatile memory.





DETAILED DESCRIPTION

Referring now to the drawings, wherein like reference numbers are used herein to designate like elements throughout, the various views and embodiments of nonvolatile memory systems with embedded fast read and write memories are illustrated and described, and other possible embodiments are described. The figures are not necessarily drawn to scale, and in some instances the drawings have been exaggerated and/or simplified in places for illustrative purposes only. One of ordinary skill in the art will appreciate the many possible applications and variations based on the following examples of possible embodiments.


Each NAND flash memory commercially available (in various pin outs/densities) today has a 512 B-1 KB-2 KByte page in a 64 Kb to 128K Byte block (a block contains at least one sector), 64 rows worth of data, 1 page/sector. To write one page takes about 200 μs. There are about 1,024 sectors in a 1 Gbit flash (NAND). So each NAND flash chip has 1 Mb SRAM (1 k pages). The invention requires each page to have “bit-to-bit” NVM back up (nonvolatile SRAM). So a page can be copied directly to the NVM as needed. This additional row can be in the sector itself. Address/control logic to accommodate this page can be easily done in the sector, if needed.


Page invention—Modify page as shown in Samsung K9F1G08R0A (1 Gbit NANDflash). In the Samsung device, Page is approximately 2 KByte+64 bits (for some kind of Ecc) in each 128 KByte block. There are 1K blocks, each of 128 KBytes (inclusive of Page). The Page has no direct identity (namely, it is not a register or RAM with independent random address and command executions)—it is temporary storage buffer to help execute read/write to nonvolatile array. Since each block (sector) is addressable, one can have a “Tag address bit”—if enabled it can activate “page addressing.”


Control Page-Nonvolatile array communication with a ‘Switch’ where volatile and nonvolatile memory can be accessed (unlike current art)—then page 2 Kbytes can be used as independent RAM for other useful purposes. One preferred embodiment—Select any of the currently unused blocks and use that/those pages as a modified SRAM; access that SRAM by currently used NC pins and rename them. Even with “concurrent Read/Write”, “write cache buffering” and other features, most blocks among the (1,024 or more) many in a NAND flash chip are unused while one or two blocks are being accessed (read, write, erase). The associated “page buffers” are also unused and wasted. In this preferred embodiment, a page of the currently unused block's page (2K Bytes×1K blocks is 2 MBytes of SRAM per chip—with a little overhead circuitry it can be 2 MBytes of SRAM with multiple port access as well) can be read and written (random page access, random access within a page, serial access from a page etc.). There are plenty of NC pins available in commercially available NAND flash ICs (one example is provided in FIG. 7)—we can configure NC pins to be used as Address, DATA, Command, Control in a combination. In parallel, the NAND flash can concurrently operate.


The concepts of SRAM mode by using available pages can also be implemented in Samsung's one NAND™ flash (for example), NOR flash or even Serial EEPROM flash—The exact implementation, page/latch size, command set may vary. The concepts of SRAM mode by using available pages can also be implemented in traditional NOR flash, as well, with slight modifications (e.g., one row equivalent page in every block or sector, on chip cache, boot code, data buffers). The concepts of SRAM mode can also be implemented in other nonvolatile memory devices (and their controllers) e.g., FeRAM, MRAM, Phase change RAM/memory, CNT RAM, NROM (Saifun) and similar ones. All these concepts can configure the multiple functions of the device or combination there of by (1) control/command signals, (2) programmable registers, (3) mode registers, (4) command register, etc-they can reside in part or in whole in controller, memory, special control, command, interface chip or even CPU.


It should be made clear that the “pages” and “buffers” mentioned in these pages titled “NVMS” do not necessarily have to be (1) static latches (6 transistor latches) or (2) traditional SRAM's. They can be DRAM's as is known widely in the industry. They can be MRAM, FeRAM (ferroelectric) or other similar concepts (molecular RAM etc). The implementation of a nonvolatile memory system may contain these configurable NVMS chips as described here (one or more). Configurable NVMS can be combined with commodity NOR/NAND/One NAND, flash chips, controllers, PSRAM's, DRAM's, or other similar functions to offer a total “system-in-package” (SIP) or “system-on-chip” (SOC).


In order to conserve operating power, the unselected, yet available pages can be in a “stand by” mode—namely, reduced Vcc (power supply voltage), until the access to that page is required. Such a, ‘cycle look ahead’, can be built into the memory chip, or provided by controller (on chip or off chip). A battery back up for the SRAM part of the device can be a very attractive option for a very large density total nonvolatile static random access memory (NVSRAM) that can go into a broad range of applications in computer, consumer, communications etc. Maxim supplies NVSRAM's-no flash IC in NVSRAM. A “power triggered switch-off/on” (Similar to what Simtek's NVSRAM's do) is also possible, thus eliminating the “battery option”.


Commands/Instructions are given as follows, in a preferred embodiment, which vary between NAND, One NAND, NOR, serial flash etc. Traditional flash: Read page in flash, Erase block in flash, Program page in flash, Etc. New commands with these inventions: Read page as SRAM/RAM, Write page as SRAM/RAM, Read/Modify/W Write page as SRAM/RAM, Read byte out of a page, etc; Write byte out of a page etc. Nibble mode/Serial access/double data rate are all possible.


The “address boundary” for a commercial NAND flash (especially in burst mode access e.g., burst READ) is different than a “2K byte” NAND flash page. The address boundary does/should not deter by using the inventions mentioned here for a superior READ (intelligent caching) or WRITE performance. Most flash systems are weighted to MOSTLY READ and FEW ERASE/PROGRAM (WRITE) due to the obvious endurance limitations (write/erase cycles limit). Hence, any performance in READ—Speed, and available Storage space—is always beneficial to a stand alone die and/or card, module, subsystem, system. To write to a page or pseudo page, WRITE command and immediately PROGRAM SUSPEND to invalidate writing into NVM. The data should be in page/pseudo page. This is one example.


As described in earlier pages, the page latches are available for reading. The pages can be read a byte (8 bits) or 2 bytes (16 bits) at a time. The whole page 2K bytes, can be sequentially accessed in 20-25 ns/byte. The subject invention uses the pages as a content addressable memory (CAM) and the NVM core as the stored data. The match lines (as used in CAM's—refer to U.S. Pat. Nos. 6,310,880 and 6,597,596 which use a DRAM storage) can be connected to the pages. The addresses in each block can be sequentially read, until the MATCH is found.

Claims
  • 1. An apparatus comprising: a nonvolatile memory;a volatile memory separate from the nonvolatile memory, wherein the volatile memory is configured to function as a read/write cache; anda controller configured to access the volatile memory and the nonvolatile memory, the controller configured to perform a read/modify/write memory operation that involves both the volatile memory and the nonvolatile memory,wherein the device has a host interface and the device further comprises a data connection configured to perform double data rate data transfer;wherein the volatile memory supports byte-granularity memory read operations; andwherein the density of the volatile memory is substantially less than the density of the nonvolatile memory.
  • 2. A device comprising: a nonvolatile memory;a volatile memory separate from the nonvolatile memory, wherein the volatile memory is configured to function as a cache; anda controller configured to access the volatile memory and the nonvolatile memory, the controller configured to perform a read/modify/write memory operation that involves both the volatile memory and the nonvolatile memory.
  • 3. The device of claim 2, wherein the device has a host interface and the device further comprises a data connection configured to perform double data rate data transfer.
  • 4. The device of claim 2, wherein the volatile memory supports byte-granularity memory read operations.
  • 5. The device of claim 2, further comprising an address decoder and an energy storage device.
  • 6. The device of claim 5, wherein the address decoder is distinct from the controller.
  • 7. The device of claim 2, wherein the cache is used as a static random access memory for more than one page of memory of the nonvolatile memory.
  • 8. The device of claim 2, wherein the controller includes an address generator.
  • 9. The device of claim 2, wherein the controller includes read/write combination control logic.
  • 10. The device of claim 2, wherein the controller includes an audio interface.
  • 11. The device of claim 2, wherein the controller includes a video interface.
  • 12. The device of claim 2, wherein the density of the volatile memory is substantially less than the density of the nonvolatile memory.
  • 13. The device of claim 2, wherein the density of the volatile memory is less than 10% of the density of the nonvolatile memory.
  • 14. The device of claim 2, wherein the volatile memory includes a register that is used in connection with the read/modify/write memory operation.
  • 15. The device of claim 2, wherein the nonvolatile memory operates in parallel with and concurrently with respect to the volatile memory.
  • 16. An apparatus comprising: a nonvolatile memory;a volatile memory separate from the nonvolatile memory, wherein the volatile memory is configured to function as a read/write cache; anda controller configured to access the volatile memory and the nonvolatile memory, the controller configured to perform a read/modify/write memory operation that involves both the volatile memory and the nonvolatile memory,wherein the device has a host interface and the device further comprises a data connection configured to perform double data rate data transfer;wherein the volatile memory supports byte-granularity memory read operations;wherein the density of the volatile memory is substantially less than the density of the nonvolatile memory; andwherein the nonvolatile memory is configured to operate in parallel with and concurrently with respect to the volatile memory.
  • 17. The device of claim 16, wherein the cache is used as a static random access memory for more than one page of memory of the nonvolatile memory.
  • 18. The device of claim 16, wherein the controller includes read/write combination control logic.
  • 19. The device of claim 16, wherein the density of the volatile memory is less than 10% of the density of the nonvolatile memory.
  • 20. The device of claim 16, wherein the controller is configured to perform a read page as volatile memory command and to perform a write page as volatile memory command.
  • 21. The device of claim 16, wherein the controller is configured to perform a read byte level command and to perform a write byte level command.
  • 22. The device of claim 16, wherein the controller is configured to perform a command to read a page in the volatile memory of a particular block of the nonvolatile memory.
  • 23. The device of claim 16, wherein the controller is configured to perform load/store operations with respect to the volatile memory and an assigned block of the nonvolatile memory.
CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Continuation of U.S. application Ser. No. 15/785,087, filed Oct. 16, 2017. U.S. application Ser. No. 15/785,087 is a Continuation of U.S. Application Ser. No. 15/018,599, filed Feb. 8, 2016, now U.S. Pat. No. 9,792,219 issuing Oct. 17, 2017 (Atty. Docket No. GRTD-32944). U.S. Application Ser. No. 15/018,599 is a Continuation of U.S. patent application Ser. No. 14/335,160, filed Jul. 18, 2014, now U.S. Pat. No. 9,257,184 issued on Feb. 9, 2016 (Atty. Docket No. GRTD-32618). U.S. application Ser. No. 14/335,160 is a Continuation of U.S. patent application Ser. No. 13/967,649, filed Aug. 15, 2013, now U.S. Pat. No. 8,817,537 issued on Aug. 26, 2014 (Atty. Docket No. GRTD-32617). U.S. application Ser. No. 13/967,649 is a Continuation of U.S. patent application Ser. No. 13/458,173, filed Apr. 27, 2012, now U.S. Pat. No. 8,531,880, issued on Sep. 10, 2013 (Atty. Docket No. GRTD-32616). U.S. application Ser. No. 13/458,173 is a Continuation of U.S. patent application Ser. No. 12/915,177, filed Oct. 29, 2010, now U.S. Pat. No. 8,194,452, issued on Jun. 5, 2012 (Atty. Docket No. GRTD-32615). U.S. application Ser. No. 12/915,177 is a Continuation of U.S. patent application Ser. No. 12/256,362, filed Oct. 22, 2008, now U.S. Pat. No. 7,855,916 issued on Dec. 21, 2010 (Atty. Docket No. GRTD-32614), application Ser. No. 12/256,362 claims benefit of U.S. Provisional Application No. 60/982,175, filed Oct. 24, 2007 (Atty. Dkt. No. GRTD-32623). application Ser. Nos. 15/018,599; 14/335,160; 13/967,649; 13/458,173; 12/915,177, 12/256,362; 60/982,175 and U.S. Pat. Nos. 9,792,219; 9,257,184; 8,817,537; 8,531,880; 8,194,452; and 7,855,916, along with the entire specifications of each of the applications and patents described in this related applications paragraph, are incorporated by reference herein in their entities for all purposes as though the same were reproduced herein verbatim.

Provisional Applications (1)
Number Date Country
60982175 Oct 2007 US
Continuations (7)
Number Date Country
Parent 15785087 Oct 2017 US
Child 18096034 US
Parent 15018599 Feb 2016 US
Child 15785087 US
Parent 14335160 Jul 2014 US
Child 15018599 US
Parent 13967649 Aug 2013 US
Child 14335160 US
Parent 13458173 Apr 2012 US
Child 13967649 US
Parent 12915177 Oct 2010 US
Child 13458173 US
Parent 12256362 Oct 2008 US
Child 12915177 US