Method and apparatus of mass-correlated pulsed extraction for a time-of-flight mass spectrometer

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to time-of-flight (TOF) mass spectrometers and, in particular, to a mechanism for improving the quality of mass spectra obtained from a TOF mass spectrometer. The invention also relates to a method for improving mass resolution in such TOF instruments in which the initial velocity distribution of ions dominates other mechanisms, such as spatial and temporal distributions, that normally result in loss of mass resolution.

2. Background Information

The use of mass spectrometers in determining the identity and quantity of constituent materials in a gaseous, liquid or solid specimen or sample has long been known. Mass spectrometers or mass filters typically use the ratio of the mass of an ion to its charge, m/z, for analyzing and separating ions. The ion mass m is typically expressed in atomic mass units or Daltons (Da) and the ion charge z is the charge on the ion in terms of the number of electron charges e.

In recent years, the development of an ionization technique for mass spectrometers known as matrix-assisted laser desorption ionization (MALDI) has generated considerable interest in the use of TOF mass spectrometers and in improvements of their performance. MALDI is particularly effective in ionizing large biological molecules (e.g., peptides and proteins, carbohydrates and oligonucleotides), as well as other types of polymers.

The TOF mass spectrometer provides an advantage for MALDI analysis by simultaneously recording ions over a broad mass range, which is the so-called multichannel advantage. At the same time, it has become common to utilize a method for improving mass resolution in a TOF mass spectrometer (i.e., time-lag focusing) which compromises the multi-channel advantage because it is mass-dependent. That is, the magnitude of the time delay between ionization and ion extraction used to provide first-order velocity focusing depends upon mass, so that only a portion of the mass spectrum is in first-order focus.

Mass spectrometers are analytical instruments which determine chemical structures through measurement of the masses of intact molecules and structure-specific fragments. Mass spectrometers consist of a mechanism for ionizing molecules (i.e., an ionization source) so that they can be analyzed by movement, manipulation or selection in some combination of static or dynamic electric and/or magnetic fields (mass analyzer) before arriving at a detector. Common ionization sources include electron ionization (EI), chemical ionization (CI),fast atom bombardment (FAB), electrospray ionization (ESI) and matrix-assisted laser desorption ionization (MALDI). Mass analyzers include magnetic sector (B), quadrupole (Q), quadrupole ion trap (QIT), Fourier transform mass spectrometers (FTMS) and time-of-flight (TOF).

The simplest time-of-flight mass spectrometer consists of a short ion source region of length s (shown in

FIG. 1

) and a longer drift region D. Ions formed in the source are accelerated by the high electrical field E defined by the potential difference V between the front (i.e., grid) and rear (i.e., backing plate) of the ion source. Then, the ions enter the length of the drift region D (or flight tube) with kinetic energies eV=½ mv

2

and velocities v=(2 eV/m)

½

which are different for each mass m. The resultant mass spectrum (shown in

FIG. 2

) is obtained by recording the flight times of ions reaching the detector, with time, t, being approximated by:

t = {(\frac{m}{2 eV})}^{1 / 2} D

The earliest known time-of-flight mass spectrometers, see Stephens, W. E.,

Phys. Rev

., vol. 69, p. 691, 1946; U.S. Pat. No. 2,612,607; Keller, R.,

Helv. Phys. Acta

., vol. 22, p. 386, 1949, had very poor mass resolution (i.e., the ability to distinguish ions having nearly the same mass at different flight times). This arises because the actual flight time, t, of an ion reflects uncertainties in the time of ion formation, t

0

, and the initial position, s, and kinetic energy, U

0

, of an ion prior to acceleration:

t = \frac{{(2 m)}^{1 / 2}}{eE} [{(U_{0} + eEs)}^{1 / 2} \mp U_{0}^{1 / 2}] + \frac{{(2 m)}^{1 / 2} D}{2 {(U_{0} + eEs)}^{1 / 2}} + t_{0}

Later, an instrument that addressed the effects of initial temporal, spatial and kinetic energy (or velocity) distributions achieved considerably improved mass resolution. See Wiley, W. C., et al.,

Rev. Sci. Instrumen

., vol. 26, pp. 1150-57, 1955. In this instrument, an ion extraction pulse with a fast rise-time minimized the temporal distribution, while a dual-stage source (see

FIG. 3

) provided first-order space focusing when the detector was located at a distance:

d = 2 σ^{3 / 2} [\frac{1}{s_{0}^{1 / 2}} - \frac{2 s_{1}}{{s_{0}^{1 / 2} (σ^{1 / 2} + s_{0}^{1 / 2})}^{2}}]

wherein:

σ=s

0

+(E

1

/E

0

)s

1

, and E

0

and E

1

are the electric fields in the two regions s

0

and s

1

of the dual-stage source, respectively.

The so-called space-focus plane (d) is independent of mass. That is ions of all masses achieve first-order focusing at this location for given values of E

0

, E

1

, s

0

and s

1

. In addition, it is also possible, using specific values of E

0

, E

1

, s

0

and s

1

to achieve second-order, mass-independent focusing. First-order kinetic energy (velocity) focusing is achieved using a time delay between the ionization pulse and the extraction pulse, a scheme known as time-lag focusing. See U.S. Pat. No. 2,685,035.

Time-lag focusing is mass-dependent, with the optimal time delay for velocity focusing being different for each mass. Hence, methods used to obtain mass spectra utilize a boxcar approach in which the time-lag is scanned in each successive time-of-flight recording cycle. A time-of-flight (TOF) instrument based upon the design of this instrument is disclosed by Wiley, W. C., et al.,

Science

, vol. 124, pp. 817-20, 1956.

More recently, the development of methods that form ions directly from surfaces using fast pulse lasers and ion beams has generally reduced both the temporal and spatial distributions associated with ion formation, obviating the need for pulsed ion extraction. In these static TOF instruments, ion reflectrons, see Mamyrin, B. A., et al.,

Sov. Phys. JETP

, vol. 37, p. 45, 1973, provide a simple and mass-independent method for energy focusing.

However, pulsed ion extraction has been employed in instruments utilizing infrared laser desorption, see Van Breeman, R. B., et al.,

Int. J. Mass Spectrom. Ion Phys

., vol. 49, pp. 35-50, 1983, and Cotter, R. J.,

Biomed. Environ. Mass Spectrom

., vol. 18, pp. 513-32, 1989; pulsed ion beams, see Olthoff, J. K., et al.,

Anal. Chem

., vol. 59, pp. 999-1002, 1987; and matrix-assisted laser desorption, see Spengler, B.,

Anal. Chem

., vol. 67, pp. 793-96, 1990, as methods of ionization.

It is known to employ a time-delayed focusing scheme, which is operationally similar to that of the instrument of U.S. Pat. No. 2,685,035, to compensate for relatively broad ionization pulses and/or to enable observation of ions fragmenting over a long time period. See Cotter, R. J.,

Biomed. Environ. Mass Spectrom.

Subsequently, others have reported extraordinary improvements in MALDI mass spectra using pulsed ion extraction. See Whittal, R. M., et al,

Anal. Chem

., vol. 67, pp. 1950-54, 1995; Brown, R. S., et al.,

Anal. Chem

., vol. 67, pp. 1998-2003, 1995; and Vestal, M. L., et al.,

Rapid Commun. Mass Spectrom

., vol. 9, pp. 1022-50, 1995. Time-lag focusing, time-delayed extraction, and delayed extraction have been used to describe this method which is employed on modern MALDI time-of-flight mass spectrometers. Similar to the instrument of U.S. Pat. No. 2,685,035, such newer instruments utilize dual-stage extraction sources in which the first extraction field is pulsed, although there are some differences in which the source element is pulsed.

As shown in

FIG. 4

, the instrument of U.S. Pat. No. 2,685,035 uses a grounded ion source plate (Ue=0V), and a negative-going voltage pulse (Ua=−64V after a suitable delay) at the intermediate grid.

Referring to

FIG. 5

, the instruments disclosed in U.S. Pat. Nos. 5,625,184 and 5,627,369, and Edmondson, R. D., et al,

J. Am. Soc. Mass Spectrom

., vol. 7, pp. 995-1001, 1996, employ a high voltage source with a positive-going pulse on the ion source plate (Ue=18 kV to 20 kV) after a suitable delay, and a constant voltage (Ua=18 kV) at the intermediate grid.

As shown in

FIG. 6

, other instruments disclosed in U.S. Pat. No. 5,739,529 employ a high voltage source (Ue=20 kV) with a negative-going pulse on the intermediate grid (Ue=20 kV to less than 20 kV) after a suitable delay.

While the absence of a spatial distribution accounts for much of the improvement in mass resolution in MALDI instruments, see Colby, S. M., et al.,

Rapid Commun. Mass Spectrom

., vol. 8, p. 865, 1994, energy (velocity) focusing using time-delayed extraction remains mass-dependent and, hence, there is room for improvement.

A mass-correlated approach employing a single ion extraction stage is disclosed by Kovtoun, S. V.,

Rapid Commun. Mass Spectrom

., vol. 11, pp. 433-36, 1997.

Other dynamic methods of velocity (energy) focusing exist and can be divided into techniques that utilize square wave pulses (i.e., an electric field is switched between two discrete values) and methods providing continuously varying fields as each iso-mass ion packet passes through the field. Methods which employ square waveforms of pulses include: (1) conventional time-lag or delayed extraction methods described above; (2) impulse-field focusing, see Marable, N. L., et al.,

Int. J Mass Spectrom. Ion Phys

., vol. 13, pp. 185-94, 1974; and (3) post-source acceleration, see Kinsel, G. R., et al.,

Int. J. Mass Spectrom. Ion Phys

., vol. 91, pp. 157-76, 1989; Kinsel, G. R., et al.,

Int. J. Mass Spectrom. Ion Phys

., vol. 104, pp. 35-44, 1991; Kinsel, G. R., et al.,

J. Am. Soc. Mass Spectrom

., vol. 4, pp. 2-10, 1993; Grundwuermer, J. M., et al.,

Int. J. Mass Spectrom. Ion Phys

., vol. 131, pp. 139-48, 1994; and Amft, M., et al.,

Rapid Commun. Mass Spectrom

., vol. 12, pp. 1879-88, 1998.

In time-lag focusing, the electric field in the extraction region of the ion source, being initially at zero, is turned on after a specified delay, following the ionization pulse. The principle of this compensation mechanism is based on the assumption that the leading ions have a larger initial velocity, enter deeper into the extraction region compared to slower iso-mass ions and, thus, acquire less potential energy as the extraction pulse is applied. The time delay that enables ions of lower initial velocity to catch up to the leading ions as they reach the detector plane is mass dependent. This is a major drawback of a method which sacrifices mass resolution for all but a narrow portion of the mass spectrum.

Impulse-field focusing is technically similar to conventional time-lag focusing and also employs a two-field ion source. However, the electric field is turned on not from zero to a final value, but rather from an initial (high) E

τ

to a final (low) E

s

value. The idea is that the first-stage increases in draw-out field reduces the ion turnaround time. Then, after delay τ, the field E

s

takes the value typical of conventional focusing as disclosed by U.S. Pat. No. 2,685,035. For example, a significant extension of the mass range resolved is achieved for a 98 cm drift region with the calculated maximum focused mass m/z being increased from 220 to 2250 Da. Similarly, with a 167 cm drift region, the mass m/z is increased from 360 to 4300 Da, and increasing with τ. Nevertheless, the method is still mass-dependent because of the mass dependence of E

96

.

Post-source pulse focusing (PSPF) or post-source acceleration is also able to partially compensate for the initial velocity and time distributions in the iso-mass packet. The principle of compensation is based on the following model. Ions, having initial velocities equal in magnitude but of opposite direction (+ν and −ν), enter the drift tube with the same velocity +ν, being separated in space by a distance related to the turnaround time. The same spatial separation occurs for ions formed at different times in the ion source. Unlike the static field TOF mass spectrometer, the ions enter a short, initially field-free pulse-focusing region prior to the drift region. After all iso-mass ion packets of interest reach this region, a voltage pulse is applied. Thereafter, a mechanism similar to that of U.S. Pat. No. 2,685,035 is invoked in order that trailing ions acquire higher energy as the pulse-voltage field is on, compared to the leading ions. Hence, the compression of individual ion packets is achieved as they reach the detector.

As described in Kinsel, G. R., et al.,

J. Am. Soc. Mass Spectrom

., this approach provides focusing for a large portion, but not all, of the mass spectrum. However, this portion may be about 80% or larger. Increases in this mass range require lengthening the pulse-voltage region and also the focusing pulse voltage. For example, improvements in mass resolution of the MALDI spectrum of angiotensin II (MW 1046 Da) from 50 to 2750 may be observed by employing the PSPF technique with a 2 m linear TOF mass spectrometer which incorporates a 10 cm PSPF region adjacent to the ion source. See also Amft, M., et al.,

Rapid Commun. Mass Spectrom

., wherein the observed mass resolution for MALDI generated ions is about 7000. Each individual setting of PSPF parameters (the delay time and the amplitude of the square wave pulse) allowed the recording of a mass range about 2000 Da with high mass resolution.

Methods using monotonically time-varying fields may also be separated into those not employing time-lag and those that do. Methods of velocity compaction as disclosed by U.S. Pat. No. 4,458,149, and dynamic-field focusing (DFF) by Yefchak, G. E., et al.,

Int. J. Mass Spectrom. Ion Phys

., vol. 87, pp. 313-30, 1989, fall into the first category.

Velocity compaction uses a monotonically changing correction field adjusted in such a manner that ions having lower velocity receive a greater acceleration than ions moving at a faster velocity. Thus, iso-mass ions are compacted velocity-wise. Simultaneously, space-wise compaction is achieved if the trailing edge of the ion packet corresponds to lower initial velocity, which is generally true when the initial velocity distribution dominates other distributions. This model considers ions entering the varying acceleration region at the same time, but with different velocities. Upon entering the varying acceleration region, those ions are subjected to a time-varying increasing field such that all ions of a given mass simultaneously entering that region reach the same velocity upon leaving this region.

Velocity compaction is not the same as a velocity focusing because the latter does not require equal velocities, but rather fast ions in the iso-mass packet catch up with slower ions exactly at the detector plane. Velocity compaction does not account for the temporal spread of the ion packet before entering the varying acceleration region. Also, simultaneous velocity and space compaction has to be provided since the spatial spread of the ion packet occurs as ions are velocity compacted. There is a slight mass dependence of the focal position as both types of compaction are effected.

The velocity adjustment focusing principle, which characterizes dynamic-field focusing (DFF), is also dependent on designing an acceleration function which brings about focusing for ions of each mass individually. For this purpose, the conventional drift region is separated into two regions between which the DFF region is situated. As in the previous case, ions arriving later receive larger acceleration then leading ions. The applied acceleration is contoured in such a manner as to cause the trailing ions to catch up with the leading ions at the detector plane. This method needs an additional section to be inserted into the drift region where the first drift region serves to provide initial separation of iso-mass ions related to their velocities.

Among those methods utilizing time-varied fields in conjunction with time-lag focusing, and most suitable to MALDI conditions, are the method of functional wave time-lag focusing, see Whittal, R. M., et al.,

Anal. Chem

., vol. 69, pp. 2147-53, 1997, and U.S. Pat. No. 5,777,325; and spot focusing or wide-range focusing, see Franzen, J.,

Int. J. Mass Spectrom. Ion Phys

., vol. 164, pp. 19-34, 1997; and U.S. Pat. No. 5,969,348. Both of these methods employ in-source time-varying electric fields.

Functional wave time-lag focusing addresses the issue of improving mass accuracy, and a voltage pulse shape is derived so as to maintain constant total kinetic energy for all ions exiting the ion source. Experiments demonstrate improvements not only in mass accuracy but also in mass resolution. As described above, achievement of equal ion velocities, or (equivalently) equal kinetic energies, may correlate with, but does not necessarily imply, velocity (energy) focusing.

SUMMARY OF THE INVENTION

A particular extraction pulse amplitude and/or delay time results in focusing only a narrow range of mass. Therefore, to fully realize the multi-channel recording advantage of the TOF mass spectrometer, it is necessary to bring all of the ions into focus simultaneously. The wide-range focusing method disclosed herein addresses the issue of mass resolution improvement. Wide-range focusing by an in-source, time-varying extraction pulse which is properly contoured takes into account a suitable space-velocity correlation for MALDI ions. The present invention provides a pulsed extraction method for improving mass resolution that is not mass dependent, thereby resulting in identical first-order focusing conditions along an entire recorded mass range. In order to fully apply the multi-channel recording advantage of a TOF mass spectrometer, all of the ions may be brought into focus simultaneously by employing a time-dependent function which is correlated with mass.

In accordance with the invention, a time-of-flight mass spectrometer comprises: a sample holder for a sample; an ionizer for ionizing the sample to form ions; a first element spaced downstream from the sample holder; a second element spaced downstream from the first element; a drift region downstream of the second element; means for establishing an electric field between the sample holder and the first element at a time subsequent to ionizing the sample in order to extract the ions; means for establishing a time-dependent and mass-correlated electric field between at least one of: (a) the first element and the second element, and (b) the sample holder and the first element; and means for detecting the ions.

As another aspect of the invention, a time-of-flight mass spectrometer comprises: a sample holder for a sample; an ionizer for ionizing the sample to form ions; a first element spaced downstream from the sample holder; a second element spaced downstream from the first element; a drift region downstream of the second element; a power source electrically coupled to the first element for applying a constant first voltage thereto; means electrically coupled to the sample holder for applying the first voltage thereto for a time subsequent to ionizing the sample, and for applying a second voltage, which is different than the first voltage, after the time in order to extract the ions; means electrically coupled to the second element for applying a time-dependent and mass-correlated voltage thereto; and means for detecting the ions.

As a further aspect of the invention, a time-of-flight mass spectrometer comprises: a sample holder for a sample; an ionizer for ionizing the sample to form ions; an extraction plate electrically coupled to the sample holder; a first element spaced downstream from the extraction plate; a second element spaced downstream from the first element, with the extraction plate and the first element defining an extraction section therebetween, and with the first element and the second element defining an acceleration section therebetween; a drift region downstream of the second element; a power source electrically coupled to the first element for applying a constant first voltage thereto; means electrically coupled to the extraction plate for applying the first voltage thereto for a time subsequent to ionizing the sample, and for applying a second voltage, which is different than the first voltage, after the time in order to extract the ions; means electrically coupled to the second element for applying a time-dependent and mass-correlated voltage thereto; and means for detecting the ions.

As another aspect of the invention, a method of mass-correlating the extraction of ions for a time-of-flight mass spectrometer comprises: ionizing a sample to form ions; employing an extraction plate adjacent the sample; employing a first element spaced downstream from the extraction plate; employing a second element spaced downstream from the first element; employing a drift region downstream of the second element; establishing an electric field between the extraction plate and the first element at a time subsequent to ionizing the sample; extracting the ions; establishing a time-dependent and mass-correlated electric field between at least one of: (a) the first element and the second element, and (b) the extraction plate and the first element; and detecting the ions.

BRIEF DESCRIPTION OF THE DRAWINGS

A full understanding of the invention can be understood when read in connection with the accompanying drawings in which:

FIG. 1

is simplified block diagram of a time-of-flight mass spectrometer having a short ion source region and a longer drift region;

FIG. 2

is a plot of a mass spectrum of a time-of-flight mass spectrometer;

FIG. 3

is a block diagram of a linear, double-stage, ion source for a time-of-flight mass spectrometer;

FIG. 4

is a plot of voltages employed by a time-of-flight mass spectrometer;

FIG. 5

is a plot of voltages employed by a time-of-flight mass spectrometer;

FIG. 6

is a plot of voltages employed by a time-of-flight mass spectrometer;

FIG. 7

is a plot of voltages employed by a time-of-flight mass spectrometer in accordance with the present invention;

FIG. 8

is a plot of correction voltage versus time in accordance with the present invention in which the length of the extraction region is varied;

FIG. 9

is a plot of correction voltage versus time in accordance with the present invention in which the length of the acceleration region is varied;

FIG. 10

is a plot of correction voltage versus time in accordance with the present invention in which the approximately known initial velocity of desorbing ions after irradiation is varied;

FIG. 11

is a block diagram of a mass spectrometer in accordance with the present invention;

FIG. 12

is a schematic block diagram of a correction pulse generator for the mass spectrometer of

FIG. 11

;

FIG. 13

is a plot of theoretical and experimental pulse waveforms in accordance with the present invention;

FIGS. 14A-14L

are plots of mass spectra for various peptides with and without mass-correlated extraction;

FIG. 15

is a block diagram in schematic form of a reflectron TOF analyzer; and

FIGS. 16A-16R

are plots showing mass spectra for the mixture of various peptides as obtained with mass-correlated extraction employing the reflectron TOF analyzer of FIG.

15

.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

As employed herein, the term “ions” shall expressly include, but not be limited to, electrically charged particles formed from either atoms or molecules by extraction or attachment of electrons, protons or other charged species.

Several variations of voltage waveforms (e.g., linear, parabolic, exponential) may be simulated in a mathematical analysis of wide-range focusing. A suitable functional waveform of the acceleration field (i.e., not just any positive-going pulse) enables achievement of those focusing properties which provide the wide-range velocity focusing method disclosed herein.

Referring to

FIG. 7

, the present invention applies a time-dependent (and mass-correlated) function to the second extraction region of a dual-stage ion extraction source in which the first region is pulsed. This method may be employed with a wide variety of TOF mass spectrometers, including ion sources having initial temporal and spatial distributions of ions that are negligible compared to their initial velocity (energy) distributions. This includes a wide range of pulsed methods for ion production on the surface of the sample (e.g., ion bombardment, laser desorption, MALDI, which are extensively used for the analysis of biomolecules).

As shown in

FIG. 7

, an exemplary positive-going pulse is employed on the source (Ue=18.7 kV to 20.0 kV) after a suitable delay following ionizing the sample in order to extract the ions. A constant voltage (Ua=18.7 kV) is employed on the intermediate grid. A time-dependent (and mass-correlated) function is applied to the second extraction region (Uf=−3.2 kV to about 0 V).

Referring again to

FIG. 3

, a conventional linear, double-stage, ion source for a TOF mass spectrometer is shown. For a given mass M, the optimal delay T is obtained by solving a nonlinear equation, Equation 1, with respect to the unknown (substitute) parameter x:

\begin{matrix} β \cdot [- β + \frac{2}{\begin{matrix} D_{0} \cdot a_{z} \cdot (\frac{1}{\sqrt{1 + x}} - \frac{1}{\sqrt{z + x}}) - \\ L_{0} \cdot \frac{z}{{(1 + x)}^{3 / 2}} + \frac{1}{\sqrt{z + x}} \end{matrix}}] - x = 0 T = \frac{2 \cdot d_{e}}{V_{M_{0}}} \cdot (\frac{β}{2 z} - \frac{x}{2 β z}) & (1) \end{matrix}

Wherein:

D_{0} = \frac{d_{a}}{d_{e}}

L_{0} = \frac{L}{2 d_{e}}

z = \frac{U_{e}}{U_{a} + U_{e}} -

ratio of extraction to total acceleration voltages (U

a

+U

e

)

a_{z} = \frac{z}{1 - z}

V_{M_{0}} = \sqrt{\frac{2 e (U_{e} + U_{a})}{M_{0}}} -

final velocity, ions of mass M

0

reaching the exit of ion source, starting with zero initial velocity

β = \frac{V_{0}}{V_{M_{0}}} -

ratio of averaged initial to a final velocity of ions of mass M

0

d

e

is geometric length of the extraction region;

d

a

is geometric length of the acceleration region;

L is geometric length of the drift tube;

T is temporal delay time between ion production and extraction;

U

e

is electrical extraction voltage; and

U

a

is electrical acceleration voltage.

The foregoing parameters are suitable for ions varying in masses from hundreds of Daltons (Da) to several MDa.

With only a minor loss in accuracy, not exceeding about 2% for an embodiment considered, the time delay, T, of Equation 1 may be obtained from

\begin{matrix} T = \frac{2 d_{e}}{V_{M_{0}}} \cdot (\frac{β}{z} + \frac{1}{\sqrt{z} \cdot (L_{0} \cdot z^{3 / 2} + \frac{D_{0} \cdot z}{1 + \sqrt{z}} - 1)}) & (2) \end{matrix}

The time delay, T, of Equation 2 is mass-dependent which dependence comes from the final velocity term, V

M0

, and reduced velocity parameter, β, (i.e., one needs to adjust the delay while switching to another mass of the ions of interest). Also, in MALDI, the contribution to the delay time caused by the non-zero average velocity of desorbing ions (parameter β) appears to be more significant when referring to larger ion masses, since the value of the average initial velocity, V

0

, is approximately mass-independent, while the final velocity, V

M0

, is inversely proportional to the square of the mass. Low mass ions need shorter delay times, while high mass ions need longer delays. Also, for a given mass, M

0

, and its optimum delay time, T

M0

, (as follows from Equation 2), ions of mass M larger than reference mass M

0

are focused behind the detector plane, while relatively low mass (m <M

0

) ions are focused in front of it. This means that there is a mass-dependent spread of focal points across the detector plane, while the exact focus to the detector location is implemented only for reference mass M

0

ions.

Therefore, in the standard time-lag focusing technique applied to MALDI, assuming that the actual value of the initial velocity V

0

is not known, the delay time is calculated based on a rough estimation of V

0

, and, then, a final adjustment of the delay time (or extraction voltage) is made experimentally, based on the best mass resolution achieved.

The idea of a method of velocity focusing over the entire mass range as disclosed herein is to provide a mechanism for compensating the velocity distribution for those ions in the recorded mass range which have a non-optimal delay time. This compensation is accomplished in consecutive steps, for all ions in the spectrum of interest, by introducing an additional, time-varying potential to the existing static field. This provides a fine energy adjustment to each individual mass packet, and among packets, by supplying to those initially slow ions sufficient additional energy to catch up with initially faster ions at the same spatial location (i.e., the detector plane). This corresponds to satisfying the first order velocity focusing condition along the entire mass range of interest.

If the mass range to be recorded spans from a low value, m

0

, to a high value, M

0

, then the procedure for compensation may be implemented in a variety of ways which are sub-divided into two basic categories. First, correction of ion velocity (or kinetic energy) is carried out continuously from low to high mass ion packets, tracing each iso-mass packet as ions leave the region with a correction potential (i.e., low mass ions leave first). Here, the static-field optimization of geometry and static voltages provides first-order focusing at the detector plane only for the lowest mass m

0

ions, noted as the reference mass. Ions of this and lower mass are not subjected to correction. In the geometry observed, this may be achieved by applying a correction potential directly to the extraction electrode, from the moment ions of lowest mass m

0

in the spectrum leave the extraction region.

Alternatively, correction is applied while different mass ions are entering the region of correction potential (i.e., low mass ions enter first). This region may have both static and time-varied electric fields. In this case, opposite to the first option, the static field set-up provides first-order focusing only for the high mass end M

0

, (the reference mass in this case) ions, while other ions are subjected to a correction potential. The more the ion mass differs from the reference mass, the larger correction is required. The correction potential vanishes at the moment ions of mass M

0

, (or of greater mass) enter the correction region. This option has better flexibility and may also be implemented in different ways. For example, a correction region may be employed in a second stage of the ion source. Also, an additional section may be introduced immediately behind the ion source or a variable potential may be applied to the drift tube, thereby making this region indeed “field-free” only for ions of mass M

0

, or higher mass.

The second option is preferred, not only because of greater flexibility, but also because of less pronounced mass effects in the mass-dependent term of the second derivative of ion flight times with respect to the initial velocity.

An estimation of mass dependency in the dominant component in the second order correction term, Δt

2

, to total time of flight reduces to the expression shown in Equation 3:

\begin{matrix} Δ t_{2} = - (\frac{L}{2 V_{M}}) \cdot β_{0}^{2} \cdot Γ (z, d_{e}, d_{a}, L_{0}) \cdot (\frac{M}{M_{0}}) \approx {(\frac{M}{M_{0}})}^{3 / 2} & (3) \end{matrix}

where Γ(z, d

e

, d

a

, L

0

) is both geometry and z—dependent function.

And wherein:

V

M

is velocity of an ion of mass M.

Hence, the effect from this term, Δt

2

, may be significantly reduced when ions in a mass range of interest are lighter then the reference mass M<M

0

(second group) compared to the opposite case of M>m

0

(first group).

The following discloses a suitable algorithm for derivation of the corrected potential field applied to the second stage of a standard double-stage ion source TOF mass spectrometer. A linear TOF mass spectrometer configuration consists of a double-stage ion source, in which d

e

is the extraction region length, d

a

is the acceleration region length, and L is the length of the drift tube region as terminated with an ion detector. A time-varying electric field is applied, in addition to a static field, in the second section of the ion source, thereby providing first-order focusing conditions for a range of ion masses, spanning from low mass, m

0

, to high mass, M

0

. In the first (extraction) section, the electric field is initially equal to zero during the delay time, T, after the laser shot. Both voltages of the extraction and acceleration electrode are equal to the static potential U

0

. At time T, the voltage on the extraction electrode is switched rapidly from its initial value U

a

, to the total voltage U

0

of the ion source.

In summary:

ΔU=U

0

−U

a

=zU

0

is voltage, applied across the extraction region, after delay T, and U

a

=U

0

(1−z),

wherein z is ratio of energy which ions acquire in the extraction region to total energy.

The starting time for the flight time of all ions is defined to be the moment, following the interval T after the laser shot, as the extraction pulse is applied. The velocity of ions of mass m exiting the extraction region (at any point A on the time axis) is shown in Equation 5 as derived from Equation 4:

\begin{matrix} \frac{{mv}_{A}^{2}}{2} = \frac{{mv}_{0}^{2}}{2} + {eU}_{0} z (1 - \frac{v_{0} T}{d_{e}}) & (4) \\ v_{A} = \sqrt{{(\frac{v_{M_{0}}}{X})}^{2} \cdot (1 - \frac{v_{0} T}{d_{e}}) + v_{0}^{2}} = (\frac{v_{M_{0}}}{X}) \cdot \sqrt{1 - 2 β w + β^{2} X^{2}} & (5) \end{matrix}

Travel time t

A

through t his region is

\begin{matrix} t_{A} = \frac{\frac{v_{M_{0}}}{X} \cdot \sqrt{1 - 2 β w + β^{2} X^{2}}}{\frac{{ezU}_{0}}{{md}_{e}}} = τ X \cdot (\sqrt{1 - 2 β w + β^{2} X^{2}} - β X) & (6) \end{matrix}

wherein

τ = \frac{2 d_{e}}{v_{M_{0}}} -

time, ions of mass M

0

being initially at rest, spend in the extraction region

w=T

/τ−scaled delay time

X = \sqrt{\frac{zm}{M_{0}}} -

reduced mass parameter

In Equations 4-6, the ion of largest mass M

0

in the spectrum is taken as the reference. In the acceleration region, where both static and varying fields are applied, ion motion is described by Equation 7:

\begin{matrix} \frac{m ⅆ v}{ⅆ t} = \frac{e [U_{0} (1 - z) + U_{0} \cdot u (t)]}{d_{a}} & (7) \end{matrix}

wherein U(t)=U

0

·u(t) is a varying correction voltage applied to acceleration region along with a static counterpart U

0

(1−z). Integration of the last equation (7) gives the velocity, ions of mass m have at the specific moment ξ, while travelling in the acceleration region.

In this region, where both static and varying electric fields are applied, the velocity at any moment ξ is given by Equation 8:

\begin{matrix} v_{ξ} = \frac{{eU}_{0} (1 - z)}{{md}_{a}} \cdot (ξ - t_{A}) + \frac{{eU}_{0}}{{md}_{a}} \cdot \int_{A}^{ξ} u (ζ) ⅆ ζ + v_{A} & (8) \end{matrix}

Equation 9 is obtained upon integration of Equation 8:

\begin{matrix} d_{a} = \int_{t_{A}}^{t_{B}} v_{ξ} ⅆ ξ = \frac{{eU}_{0} (1 - z)}{2 {md}_{a}} {(t_{B} - t_{A})}^{2} + \frac{{eU}_{0}}{{md}_{a}} \cdot \int_{t_{A}}^{t_{B}} ⅆ ξ \cdot \int_{t_{A}}^{ξ} u (ζ) ⅆ ζ + v_{A} (t_{B} - t_{A}) & (9) \end{matrix}

The integral of Equation 9 may be reduced to the form of Equation 10:

\begin{matrix} \frac{{\tilde{d}}_{0}}{2} = (\frac{1 - z}{z}) \frac{1}{2 X^{2} {\tilde{d}}_{0}} \cdot {({\tilde{t}}_{B} - {\tilde{t}}_{A})}^{2} + \frac{1}{{zX}^{2} {\tilde{d}}_{0}} \int_{{\tilde{t}}_{A}}^{{\tilde{t}}_{B}} ⅆ ξ \cdot \int_{t_{A}}^{ξ} u (ζ) ⅆ ζ + \frac{\sqrt{1 - 2 β w + β^{2} {\underline{X}}^{2}}}{X} \cdot ({\tilde{t}}_{B} - {\tilde{t}}_{A}) & (10) \end{matrix}

wherein

{\tilde{d}}_{0} = \frac{d_{a}}{d_{e}} -

ion source geometric factor

{tilde over (

t

)}

B

=t

B

/τ, {tilde over (

t

)}

A

=t

A

/τ

The velocity of ions of mass m upon leaving the ion source (at any point B) is shown by Equation 11:

\begin{matrix} v_{B} = (\frac{v_{M_{0}}}{X}) [(\frac{1 - z}{z}) \cdot \frac{1}{{\tilde{d}}_{0}} (\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{X}) + \frac{1}{X {\tilde{d}}_{0} z} \cdot \int_{{\tilde{t}}_{A}}^{{\tilde{t}}_{B}} u (ζ) ⅆ ζ + \sqrt{1 - 2 β w + β^{2} X}] & (11) \end{matrix}

The total flight time, T

tof

, and its scaled value, {tilde over (T)}

tof

/τ, including the time of drift through the field-free region of length L, are defined by Equations 12 and 13, respectively:

\begin{matrix} T_{tof} = t_{B} + \frac{L}{v_{B}} & (12) \\ {\tilde{T}}_{tof} = \frac{T_{tof}}{τ} = {\tilde{t}}_{B} + \frac{\tilde{L} X}{\frac{{\tilde{t}}_{A}}{X} + β X + (\frac{1 - z}{z}) \cdot \frac{1}{{\tilde{d}}_{0}} (\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{X}) + \frac{1}{zX {\tilde{d}}_{0}} \int_{{\tilde{t}}_{A}}^{{\tilde{t}}_{B}} u (ζ^{'}) ⅆ ζ^{'}} & (13) \end{matrix}

The condition of first-order velocity focusing is defined as the first order derivative of total T

tof

with respect to initial velocity (or the velocity parameter β) and is equal to 0. To provide mass range velocity focusing, the result must be valid for ions of all masses ranging from low mass, m

0

, to high mass, M

0

, in the mass range of interest. If derivatives are taken of Equations 10 and 13 with respect to the velocity parameter β (with both left sides being equal to zero), and if the unknown derivatives dt

B

/dβ are equated in these equations, then an equation is obtained which links the time ions of each mass (with mass being hidden in the X parameter) enter (i e., time A on the time axis) or leave (i e., time B on the time axis) the acceleration region. A corresponding fragment of the correction waveform between these times is shown in Equation 14:

\begin{matrix} \frac{u ({\tilde{t}}_{A})}{ZX} (\frac{ⅆ {\tilde{t}}_{A}}{ⅆ β}) [\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{{\tilde{d}}_{0} \cdot I_{0} (X, u)} + \frac{X}{\frac{{\tilde{d}}_{0}}{\tilde{L}} \cdot I_{0}^{2} (X, u) - \frac{1 - z}{z} - \frac{u ({\tilde{t}}_{B})}{Z}}] = \frac{{\tilde{d}}_{0} X^{2} - (\frac{ⅆ {\tilde{t}}_{A}}{ⅆ β}) (\frac{1 - z}{z} - {\tilde{d}}_{0})}{\frac{{\tilde{d}}_{0}}{\tilde{L}} \cdot I_{0}^{2} (X, u) - \frac{1 - z}{z} - \frac{u ({\tilde{t}}_{B})}{Z}} - \frac{\begin{matrix} (\frac{ⅆ {\tilde{t}}_{A}}{ⅆ β}) \cdot [(\frac{1 - z}{z}) \frac{1}{{\tilde{d}}_{0}} (\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{X}) + (\frac{{\tilde{t}}_{A}}{X} + β X)] - \\ (\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{X}) \cdot (X^{2} + \frac{ⅆ {\tilde{t}}_{A}}{ⅆ β}) \end{matrix}}{I_{0} (X, u)} & (14) \end{matrix}

wherein:

\begin{matrix} \tilde{L} = \frac{L}{2 d_{e}} I_{0} (X, u) = (\frac{1 - z}{z}) \frac{1}{{\tilde{d}}_{0}} (\frac{{\tilde{t}}_{B} - {\tilde{t}}_{A}}{X}) + \frac{{\tilde{t}}_{A}}{X} + β X + \frac{1}{ZX {\tilde{d}}_{0}} \cdot \int_{{\tilde{t}}_{A}}^{{\tilde{t}}_{B}} u (ζ^{'}) ⅆ ζ^{'} & (15) \end{matrix}

The calculation of the correction waveform starts from the reference ion mass M

0

and the corresponding value of X

M0

for that mass M

0

(see the “reduced mass parameter” for Equation 6). By definition, the time delay is chosen to provide valid first-order focusing conditions exactly for this group of ions. This means that the correction voltage vanishes at the moment ions of mass M

0

enter the acceleration region (i.e., t≧t

A

(M

0

). The objective is to derive proper time dependence of the correction potential in the previous time period.

From the fact that u({tilde over (t)}

A

)=0 at t=t

A

(M

0

) and all subsequent moments (i.e., no corrections after t

A

(M

0

)) it follows that:

\begin{matrix} {u ({\tilde{t}}_{A})}_{m = M_{0}} = 0 \int_{{\tilde{t}}_{A}}^{{\tilde{t}}_{B}} u (ζ^{'}) ⅆ ζ^{'} = 0 & (16) \end{matrix}

For ions of lower mass ion m=M

0

−δM the corresponding instance, that ion enter the acceleration region, precedes that of for an ion M

0

,{tilde over (t)}

A

(m)={tilde over (t)}

A

(M

0

)−δ{tilde over (t)},δ{tilde over (t)}>0.

For these ions of mass m=M

0

−δM in the vicinity of M

0

, integrals in Equations 15 and 10 may be replaced by Equations 17 and 18, respectively:

\begin{matrix} \underset{m = M_{0} - δ M}{\int_{{\tilde{t}}_{A} (m)}^{{\tilde{t}}_{B}} u (ζ^{'}) ⅆ ζ^{'} = \frac{δ \tilde{t}}{2} u ({\tilde{t}}_{A} (m))} & (17) \\ \underset{m = M_{0} - δ M}{\int_{{\tilde{t}}_{A} (m)}^{{\tilde{t}}_{B}} ⅆ ξ \int_{{\tilde{t}}_{A} (m)}^{_{ξ}} u (ζ^{'}) ⅆ ζ^{'} = {(\frac{δ \tilde{t}}{2})}^{2} u ({\tilde{t}}_{A} (m))} & (18) \end{matrix}

Substituting the right sides of Equations 17 and 18 into Equations 10 and 14, respectively, there is a system of two non-linear algebraic equations that are solved numerically, until an accuracy of 10

−6

at each increment of mass is preferably achieved. Each incremented mass is considered, until the whole mass range from m

0

to M

0

is covered.

Only minor changes to the analytical procedure are employed for a reflectron-type TOF analyzer (see FIG.

15

). For that analyzer, a term

t_{R} = \frac{2 v_{B} d_{R} m}{{eU}_{R}} = τ (\frac{z}{z_{R}}) X {\tilde{d}}_{R} I_{0} (X, u),

which accounts for the time that an ion spends in the reflector part of the analyzer, is added to the sum in the right side of Equation 12. Here, U

R

is the voltage applied across the reflector of length d

R

, z is the ratio of U

R

to the total voltage U

0

, and {tilde over (d)}

R

=d

R

/d

e

. Formally, {tilde over (L)} is replaced by:

\tilde{L} - 2 (\frac{z}{z_{R}}) {\tilde{d}}_{R} \cdot I_{0}^{2} (X, u)

in Equation 14. Otherwise, the previous analysis is employed. Although an exemplary reflectron is disclosed, any suitable type (e.g., single, dual-stage, gridless, coaxial, non-linear) may be employed.

FIGS. 8-10

show the calculated dependencies of the correction voltage versus time u(t)=U(t)/U

0

under various experimental conditions. In

FIG. 8

, the length d

e

of the extraction region is varied, as other exemplary parameters are fixed. In

FIG. 9

, the length d

a

of the acceleration region is varied. In

FIG. 10

, the single varied parameter is the approximately known initial velocity, V

0

, of desorbing ions after irradiation. The ratio of M

0

to m

0

is considered to be about 10 (i.e., a mass range from 450 Da to 4541 Da).

Each choice of geometric parameters has a set of advantages and disadvantages. Selection of a shorter extraction region (see

FIG. 8

) gives a more linear, but steeper roll-off, of the correction voltage, while the maximum also increases for lower values of d

e

. Use of a shorter extraction region length d

e

results in more severe conditions for space focusing, because the contribution to energy spread from space irregularities may be roughly estimated as δU=ΔU*Δx/d

e

where Δx is the geometric size of irregularities.

An exemplary length of d

e

equal to 3.6 mm. may be employed as a non-limiting compromise value, although other suitable options exist.

For the d

a

parameter (see FIG.

9

), a choice is made between a maximum pulse amplitude and the feasibility of implementing the desired pulse shape. In order to provide mass-range velocity focusing, thereby covering all the mass range from m

0

to M

0

(450 to 4541 Da), the preferred choice is the upper (solid) curve, corresponding to d

a

=4.5 cm. A smaller value of d

a

employs lower voltages but provides focusing over a narrower mass range (e.g., for d

a

=1.5 cm, this ranges from about 1400 to 4541 Da; while for d

a

=3.0 cm, this ranges from 600 to 4541 Da. If a wide mass range is desired, then d

a

=4.5 cm may be employed.

FIG. 10

shows the most important source of ambiguity, which is related to poorly known average velocities V

0

of desorbing ions for a given matrix. As the value of V

0

varies, both the time of correction field turn-off, u(t)=0, and the rate of u(t) roll-off are changed. This is generally the same problem as a search for an optimum time delay in the conventional time-lag focusing method, where the unknown value of V

0

affects the calculated delay time. To carry out this procedure, available values of V

0

may be employed, or the time ions of mass M

0

enter the acceleration region may be established. The latter option may be accomplished by fine tuning delays between the extraction and correction pulses from low to high delay time, until the mass resolution begins to deteriorate. For example, the value of V

0

450 m/s may be employed.

Referring to

FIG. 11

, an exemplary TOF mass spectrometer

100

includes a dual-stage ion source

102

, a field-free drift region

104

, and a post-acceleration region

106

. The ion source

102

includes an extraction section

108

and an acceleration section

110

. The exemplary lengths of the extraction section

108

and acceleration section

110

are 0.364 cm and 4.46 cm, respectively. In order to produce a uniform field distribution through a relatively long acceleration region, the acceleration section

110

is split into three identical sub-sections

110

A,

110

B,

110

C. The sections

108

,

110

are defined by an extraction plate

121

, grid

122

, separating plates

123

,

124

and grid

125

. The acceleration section

110

employs a voltage divider of three series-connected, low-inductance resistors R

3

,R

4

,R

5

for the respective sub-sections

110

A,

110

B,

110

C. The exemplary geometric size of the extraction plate

121

, grids

122

,

125

, and separating plates

123

,

124

is 5.80 cm by 5.80 cm.

The exemplary thickness of the mesh holders (not shown) for the grids

122

,

125

and the plates

123

,

124

is 0.60 mm. The first grid

122

has an electroplated Ni mesh of

117

wires per inch which separates the extraction region

108

from the acceleration region

110

. The mesh is mounted on the extraction region side of the grid

122

. This grid

122

has an exemplary slot opening

112

of 4.0 mm by 16.5 mm, in order to provide laser irradiation of a sample disposed at the probe tip

118

, while holding the mesh tightly stretched. The same type of mesh (for the grid

125

) is employed to spatially separate the acceleration region

110

from the drift tube space

104

. The exemplary diameter of the centered holes

114

which provide transmission of ions in the sub-section electrodes

123

,

124

and the final mesh-affixed electrode

125

of the ion source

102

is 12.7 mm.

The sample holder or probe is a stainless steel rod

116

, having a separating PEEK (polyetheretherketone) isolator

117

and a stainless steel tip

118

where the sample (not shown) is loaded. The position of the tip

118

is preferably precisely aligned with the flat surface parallel to the extraction plate

121

surface, in order to produce a homogeneous electric field in the extraction region

108

.

The exemplary length of the drift tube region

104

is 102.05 cm. It is possible to either ground or float the perforated tube

119

(e.g., 38.6 mm diameter) that shields the inner drift tube space from EMI/RF and electrostatic field penetration. An outer perforated tube section may be slid into or out of a narrow slit in the support plate

120

to which the grid

125

is attached. In order to provide strict parallelism of the support plates on the opposite sides of the drift tube, a sturdy frame is employed including two exemplary 10.2 mm thick support plates

120

,

126

which are held together by four 9.54 mm diameter stainless steel rods

128

of precisely matched length. A perforated tube section

129

on the detector side (i.e., the downstream side) of the drift tube

119

is permanently held on plate

126

. The support plate

120

on the opposite side (i.e., the upstream ion source side) of the drift tube

119

may be isolated from the drift tube space by insertion of ceramic spacers

130

between the frame rods

128

and the support plates

120

and by situating a narrow gap (e.g., about 1 mm or less) between the sliding segment of the perforated tube

119

and this plate

120

.

To provide post-acceleration of the ions, an additional grid

131

is employed. The drift tube

119

is floated, while the potential at the front plate of the detector

132

is kept constant. This grid

131

, having a mesh of 117 wires per inch, has an exemplary 25.44 mm aperture

133

. The detector

132

is situated behind the grid

131

and is electrically isolated by ceramic spacers

134

. The exemplary distance between the grid

131

and the detector plane, comprising the post-acceleration region

106

, is 2.0 mm long. The vacuum chamber (not shown) is pumped by a suitable turbo-pump (not shown), with the pressure in the TOF mass spectrometer

100

preferably kept below 5×10

−7

Torr.

A suitable pulsed nitrogen laser

135

(e.g., capable of delivering a 300 μj energy and <4 ns width pulse at peak power of about 75 kW to the sample) is employed as an ionizer. The laser

135

generates a pulse of energy with a duration substantially greater than a time corresponding to required mass resolution. The beam is transmitted onto the sample, passing a flat mirror

136

, a variable optical density filter

137

, and an iris diaphragm

138

. The beam is focused on the target by a suitable UV lens

139

(e.g., having a 75 mm focal length), situated inside the vacuum chamber (not shown). Spectra are recorded at irradiances close to threshold of ion detection or only about 10-15% above. The incidence angle is about 60° with respect to the sample surface normal. The irradiated spot area is about 0.06 mm

2

and is imaged by thermal paper.

A suitable pulse generator

140

triggers the laser

135

externally. After he laser

135

fires, a trigger signal

141

from a suitable low-jitter (e.g., <1 ns, 1σ, typically <500 ps) output is supplied to another suitable pulse generator

142

. This four-channel generator

142

provides timing control of the mass spectra measurements. The exemplary delay between the laser output pulse and the output signal

141

is <50 ns, while keeping jitter low. The exemplary propagation delay of the generator

142

(external trigger to output) is 85 ns, jitter <60 ps. Preferably, low jitter is advantageously provided for MALDI TOF mass spectrometers. The pulse generator

142

also provides sync pulses

143

(e.g., 3 ns rise time) to trigger the oscilloscope

144

, fast high voltage (HV) switch

145

, and correction pulse generator

146

.

While for clarity of disclosure reference has been made herein to the exemplary oscilloscope

144

for displaying mass spectra information, it will be appreciated that such information may be stored, printed on hard copy, be computer modified, or be combined with other data. All such processing shall be deemed to fall within the terms “display” or “displaying” as employed herein.

The grid

122

is initially biased at 18.70 kV by HV power supply

147

and the same voltage is applied to the extraction plate

121

through resistor R

2

. Typically, the extraction plate

121

is pulsed from 18.70 kV to 20 kV by the fast HV switch (pulse amplifier)

145

(e.g., rising edge time of less than 20 ns) after a calculated, optimum time delay for a selected reference mass M

0

(i.e., high end of the mass range). The output of the HV switch

145

is connected through a vacuum feedthrough to the extraction plate (electrode)

121

through the series connection of a coupling low-inductance capacitor C

1

and a resistor R

1

. Correction of the applied pulse voltage to the exemplary plate

121

is in the order of about 3% and is employed to account for a voltage drop across the coupling capacitor C

1

. To prevent flyback voltage spikes on the grid

122

that may originate from both the pulse voltage applied to the extraction plate

121

and, later, from the correction voltage pulse, a ceramic low-inductance capacitor C

2

is employed shunt this grid

122

.

The electronic circuit of the correction pulse generator

146

is shown in FIG.

12

. In order to provide a quasi-ramp waveform correction pulse, a fast HV switch

151

operates in the bipolar mode and switches between two exemplary voltage levels: (1) a low level (start) which is initially biased at about −3350 V by HV power supply

148

; and (2) a high level (finish) which is equal to about +8000 V, as supplied by HV power supply

149

.

For cut-off, six positive polarity wave clamping fast-recovery diodes D

1

-D

6

, each shunted by corresponding resistors R

7

-R

12

, are connected parallel to the load (i.e., between grid

125

and ground in FIG.

11

). Capacitor C

6

, variable capacitor C

7

(for course adjustment), variable capacitor C

8

(for fine adjustment), the intrinsic capacitance of the grid, C(int), and the equivalent capacitance C(divider) of capacitors C

3

-C

5

of

FIG. 11

, determine two important factors: (1) the total capacitance of the load; and (2) the voltage partition between adjacent sub-sections

110

A,

110

B,

110

C of the acceleration region

110

of FIG.

11

. The first factor is important in implementing the true pulse shape, while the second factor contributes to providing a uniform spatial distribution of the correction field. The control signal

150

for the HV switch

151

of the correction pulse generator

146

is output by the pulse generator

142

of FIG.

11

.

The correction pulse shape for the series resonance circuit of

FIG. 12

is determined by total capacitance; the inductance of the high-frequency, high-current inductor L

1

; and the value of variable resistor R

13

. The fine adjustment of the pulse shape is performed by tuning the capacitance of variable HV capacitors C

7

,C

8

, the resistance of R

13

, and, optionally, the value of the second positive level as supplied by HV power supply

149

to the HV switch

151

.

Referring again to

FIG. 11

, a suitable dual micro-channel plate detector

132

having a conical anode

152

and an outer RF/EMI screen (not shown) is employed. The digital oscilloscope

144

records the ion signal

153

from the detector

132

. In order to provide better repeatability of spectra, an amplitude discrimination mode is preferably applied, by cutting off inputs above specified upper limits. The exemplary lower limit is set at about 10-40 mV and is dependent upon noise level, while an exemplary higher discrimination level of about 100-200 mV is set just short of saturation of the ion signal. Transfer to a personal computer (PC) (not shown) is accomplished by a suitable commercial software package (e.g., TOFWARE, marketed by Ilys Software). Typically, the ion signals from 30 to 120 individual laser shots, as delivered to a single spot, are averaged. It will be appreciated that while reference has been made to a PC, other processors such as, for example, microcomputers, microprocessors, workstations, minicomputers or mainframe computers may be employed.

Although a time-dependent (and mass-correlated) function is applied to the second extraction region (Uf=−3.2 kV to about 0 V) of

FIG. 7

, it will be appreciated that equivalent electric fields for the extraction region

108

and acceleration region

110

of

FIG. 11

may be provided by grounding the grid

125

(Uf =0 V) and applying a time-dependent (and mass-correlated) function to both of the source or extraction plate

121

(e.g., Ue=21.9 kV to 23.2 kV to 20 kV) and the intermediate grid or grid

122

(e.g., Ua=21.9 kV to about 18.7 kV).

A reflectron TOF analyzer is shown in FIG.

15

. Compared to a linear design, a relatively shorter second region of the ion source is employed (e.g., 3.10 cm instead of 4.46 cm). An Einzel lens assembly is added and positioned at the exit of the ion source. An exemplary reflectron section of 29.1 cm is mounted at the end of a shortened drift tube. The total ion drift path in this exemplary arrangement is 120.2 cm. An exemplary coaxial Hamamatsu MCP detector (model F4294-09) with a 6 mm central hole is employed for ion detection. The exemplary reflectron assembly contains a stack of 7.0 by 7.0 cm rectangular plates, with a 40 mm central hole, separated by ceramic spacers, each of which is 6.43 mm long. The total length of the exemplary reflector is 29.1 cm.

Referring to

FIG. 13

, a theoretical waveform (dashed line) is shown for a linear instrument assuming V

0

=450 m/s is the average velocity of desorbing ions. The time delay between the laser pulse and the extraction pulse is set to 555 ns, which, for the experimental parameters disclosed above, corresponds to focusing of MH

+

=4542 Da ions at the high-mass end. The time t=0 is taken to be the onset of acceleration. A significant portion of a voltage function within the time frame from about 470 to 880 ns could be well fitted by a decreasing linear function, thereafter the correction voltage is switched off. This linear part of the correction voltage corresponds to the period when ions within a mass window from 1200 to 4542 Da enter the acceleration region and are subjected to the combined effect of constant and time-dependent electric fields. The initial portion of the voltage function, taking part in correction for lighter ions MH

+

<1200 Da, indicates a more complex shape.

FIG. 13

shows the experimental waveform (solid line) generated by the exemplary correction pulse generator. Pulse polarity is negative if applied to the second acceleration grid. A close match of the calculated and experimental voltages is achieved, since the difference between these voltages does not exceed 3% in the middle portion of the waveforms and the curves are fairly close in the earlier t<360 ns and the later 880 ns>t>760 ns period. Nevertheless, there is a noticeable ringing after the time the correction voltage drops to zero. This may potentially affect the mass resolution, especially for heavier ions close to the high mass end.

Before the experimental test, it is highly desirable to have an alternative confirmation of the method and, also, to examine the appropriateness of different type waveforms that may easily be implemented. A simulation model of the experimental set-up with a correction time-dependent voltage function included is tested employing SIMION 3D v.6 software (Princeton Electronic Systems, Inc., Princeton, N.J. 08543). To model conditions with both a static and a time-varying field applied, an algorithm is generated. For example, one case includes a linear voltage function applied to the second grid of the acceleration region with a time rate of −5.28 kV/μs, terminated after t 880 ns. The time delay between the laser pulse and ion extraction is set to 555 ns. Static voltages and geometry parameters used in the simulation are identical to those in the experimental set-up. Because of a large uncertainty in initial velocity distribution of desorbing ions, ion velocities are assumed to range from 150 to 750 m/s for each iso-mass packet. In the simulation, a broad mass range from 574 to 4542 Da is covered.

Table 1 shows a comparison of the simulated flight times in a linear TOF instrument for different mass ions using a standard pulsed extraction as compared to when a correction is applied. In Table 1, the calculated time-of-flight values are shown and, also, dispersion of arrival times is referred to as a time spread. Both data sets, with a correction voltage applied and normal pulsed extraction mode (without correction), are modeled. The effect of correction on mass resolution is unambiguously seen by comparing the time spread for ions within an iso-mass packet. For ion packets of mass 4542 and 4183 Da, the difference between modes is quite small, but mass resolution is fairly appropriate, since the pulse extraction method itself provides good energy focusing in a narrow mass range.

From MH

+

=3820 Da to low masses, the effect of correction becomes clearly pronounced. Down to 574 Da (the low mass end), the time spread within the iso-mass packet does not exceed 3 ns in the correction mode, while it is increased with mass almost monotonically from 8 to 21 ns in the normal mode. Focusing of the lowest mass MH

+

=574 Da ions employs a correction pulse waveform that is substantially deviated from a simple linear U(t) dependence. Nevertheless, the correction using a simple linear waveform is still quite appropriate.

The results of the experimental verification of the method on the linear TOF analyzer are shown in

FIGS. 14A-14R

. In close agreement with SIMION simulation, both correction and normal mode give nealry identical peak shapes for ions in the mass range from 4542 Da, the high mass end, down to mass of 4183 Da. With a correction voltage applied, a substantial improvement is observed in mass resolution for lighter ions MH

+

<3820 Da, obtained in the same mass spectrum.

Table 3 shows a comparison of experimental values of mass resolution for individual peptides in two operational modes: with pulse correction and in standard pulsed extraction mode. In Table 3, “−”. refers to spectra without a distinctive isotopic pattern. For lower mass ions, the isotopic pattern is barely seen in the normal pulsed extraction mode, while with a correction, all peaks are isotopically resolved with high mass resolution, as summarized in Table 3. Throughout the entire range of ion mass from 901 to 4542 Da mass resolution, as determined by FWHM criteria (full width at half maximum), there are values in the range from 4500 to 7800 Da. In the normal mode, a distinctive isotopic pattern is observed only for two higher ion masses, 4542 and 4183 Da, followed by unresolved peaks for lower mass ions, which is quite in agreement with the pulse extraction theory.

A distinct isotopic pattern is observed even beyond the low mass limit (about 450 Da) for which a correction pulse was generated. This is due to the mass range near the peaks of matrix dimer ions of mass [2M+H]

+

=379 Da and [2M+H−

44

]

+

. In addition to the isotopic pattern of the last peak, several contributions to the local spectrum occur, while in the normal mode this information is hidden. This demonstrates that with a mass-correlated pulsed extraction mode applied to a linear TOF instrument, the entire range of mass from 335 to 4542 Da is effectively covered with much better than unit mass resolution.

The reflectron mode of TOF instrument with a correction option included is also tested experimentally. The calculated voltage function for a reflectron analyzer is substantially different from a linear waveform. Its shape takes a form of an asymmetrical bell.

Experimental mass spectra (reflectron mode) or the mixture of nine peptides (without correction and with correction) of Table 2 are shown in FIGS.

16

A-

16

R. The mass-correlated pulsed extraction method outperforms the normal mode already at MH

+

=4542 Da, which is only 20% off the high-mass end. For lower ion masses, the effect becomes even more pronounced.

The advantages of mass-correlated pulse extraction manifest themselves in quite uniform distributions of mass resolution over a wide mass range. For a further improvement of the performance of the method, more detailed information about initial velocity distribution for different mass ions may be employed. Preferably, a circuit design which includes eliminating ringing and closer fitting to a theoretical waveform promotes the achievement of a higher mass resolution.

Although exemplary grids, such as

122

,

125

of

FIG. 11

, are disclosed herein, the present invention is applicable to equivalent structures such as, for example, electrostatic lenses.

TABLE 1

Velocity,

TOF, μs

TOF, μs

TOF, μs

TOF, μs

TOF, μs

TOF, μs

m/s

correction

standard

correction

standard

correction

standard

MH

+

= 4542.1 Da

MH

+

= 4182.7 Da

MH

+

= 3819.5 Da

150

38.969

38.969

37.419

37.419

35.780

35.780

300

38.970

38.970

37.420

37.422

35.781

35.782

450

38.971

38.971

37.423

37.423

35.783

35.785

600

38.970

38.970

37.423

37.424

35.782

35.787

750

38.968

38.969

37.420

37.424

35.780

35.788

Time

3

2

4

5

3

8

spread, ns

MH

+

= 3660.2 Da

MH

+

= 3201.6 Da

MH

+

= 3009.4 Da

150

35.039

35.039

32.795

32.799

31.815

31.822

300

35.040

35.042

32.798

32.804

31.818

31.827

450

35.041

35.044

32.798

32.807

31.818

31.830

600

35.040

35.042

32.798

32.811

31.818

31.834

750

35.040

35.048

32.797

32.813

31.818

31.838

Time

2

9

3

14

3

16

spread, ns

MH

+

= 2645.9 Da

MH

+

= 2149.4 Da

MH

+

= 1640.8 Da

150

29.947

29.960

26.951

26.980

23.584

23.639

300

29.948

29.964

26.953

26.985

23.586

23.645

450

29.949

29.969

26.952

26.990

23.585

23.650

600

29.947

29.973

26.954

26.996

23.587

23.656

750

29.948

29.977

26.953

27.000

23.586

23.661

Time

2

17

3

20

3

22

spread, ns

MH

+

= 1348.6 Da

MH

+

= 901.1 Da

MH

+

= 573.7 Da

150

21.413

21.490

17.532

17.664

14.004

14.210

300

21.415

21.497

17.532

17.670

14.002

14.215

450

21.416

21.503

17.533

17.676

14.004

14.221

600

21.415

21.508

17.532

17.681

14.004

14.226

750

21.416

21.514

17.535

17.688

14.002

14.231

Time

3

24

3

24

3

21

spread, ns

TABLE 2

Molecular weight

(Da)

Linear mode of TOF MS

1. Adrenocorticotropic hormone, fragment 1-39

4541.1

2. Pancreatic polypeptide

4181.7

3. Biocytin-β-endorphin

3818.5

4. Adrenocorticotropic hormone, fragment 7-38

3659.2

5. Hepatitis B, pre-S region, fragment 120-145

3008.4

6. Diabetes associated peptide amide, fragment 8-37

3200.6

7. β-melanocyte stimulating hormone

2644.9

8. Parathyroid hormone, fragment 28-48

2148.4

9. Peptide sequencing standard

1639.8

10. Substance P

1347.6

11. Methionine enkephalin - Arg-Gly-Leu

900.1

Reflectron mode of TOF MS

1. Insulin (bovine)

5733.5

2. Adrenocorticotropic hormone, fragment 1-39

4541.1

3. Adrenocorticotropic hormone, fragment 7-38

3660.2

4. Somatostatin 28

3149.6

5. Dynorphin A

2148.5

6. Neurotensin

1673.9

7. Substance P

1347.6

8. des-Arg

9

-bradykinin

905.0

9. Bradykinin, fragment 1-7

755.9

TABLE 3

Standard

With

pulsed

Peptide

MH

+

, Da

correction

extraction

ACTH, fragment 1-39

4542.1

7800

7800

Pancreatic polypeptide

4182.7

5770

5900

Biocytin β-endorphin

3819.5

6950

—

ACTH, fragment 7-38

3660.2

6300

—

Diabetes associated peptide amide,

3201.6

6800

—

fragment 8-37

Hepatitis B, pre-S region, fragment

3009.4

5500

—

120-145

β-melanocyte stimulating hormone

2645.9

5700

—

Parathyroid hormone, fragment 28-48

2149.4

5950

—

Peptide sequencing standard

1640.8

4600

—

Substance P

1348.6

4600

—

Methionine-Enkephalin-Arg-Gly-Leu

901.1

4700

—

Whereas particular embodiments of the present invention have been described above for purposes of illustration, it will be appreciated by those skilled in the art that numerous variations in the details may be made without departing from the invention as described in the claims which are appended hereto.

Claims

1. A time-of-flight mass spectrometer comprising:a sample holder for a sample; an ionizer for ionizing the sample to form ions; a first element spaced downstream from said sample holder; a second element spaced downstream from said first element; a drift region downstream of said second element; means for establishing an electric field between said sample holder and said first element at a time subsequent to ionizing the sample in order to extract the ions; means for establishing a time-dependent and mass-correlated electric field between at least one of: (a) said first element and said second element, and (b) said sample holder and said first element; and means for detecting the ions.
2. The mass spectrometer of claim 1 wherein said ions include a first ion having a mass and a first velocity and a second ion having said mass and a second velocity, with said first velocity being different than said second velocity; and wherein said means for establishing a time-dependent and mass-correlated electric field compensates for the difference between said first and second velocities.
3. The mass spectrometer of claim 2 wherein said means for establishing a time-dependent and mass-correlated electric field includes means for establishing said time-dependent and mass-correlated electric field between said first element and said second element.
4. The mass spectrometer of claim 2 wherein said means for establishing a time-dependent and mass-correlated electric field includes means for establishing said time-dependent and mass-correlated electric field between said sample holder and said first element.
5. The mass spectrometer of claim 3 wherein said mass is a first mass; wherein said ions further include a third ion having a second mass, with said second mass being greater than said first mass; and wherein said means for establishing a time-dependent and mass-correlated electric field provides no compensation for said third ion when said second mass is greater than or equal to a predetermined mass.
6. The mass spectrometer of claim 4 wherein said mass is a first mass; wherein said ions further include a third ion having a second mass, with said second mass being less than said first mass; and wherein said means for establishing a time-dependent and mass-correlated electric field provides no compensation for said third ion when said second mass is less than or equal to a predetermined mass.
7. The mass spectrometer of claim 1 wherein said ionizer is a laser which generates a pulse of energy with a duration substantially greater than a time corresponding to required mass resolution.
8. The mass spectrometer of claim 1 wherein said first element comprises a grid.
9. The mass spectrometer of claim 1 wherein said second element comprises a grid.
10. The mass spectrometer of claim 1 wherein said first element comprises an electrostatic lens.
11. The mass spectrometer of claim 1 wherein said second element comprises an electrostatic lens.
12. The mass spectrometer of claim 1 wherein said ions include a first ion having a first mass and a first velocity; a second ion having said first mass and a second velocity, with said first velocity being different than said second velocity, a third ion having a second mass and a third velocity, and a fourth ion having said second mass and a fourth velocity, with said third velocity being different than said fourth velocity, with said first mass being less than said second mass, and with said first and second velocities being greater than said third and fourth velocities; and wherein said means for establishing a time-dependent and mass-correlated electric field compensates for the difference between said first and second velocities, and for the difference between said third and fourth velocities.
13. A time-of-flight mass spectrometer comprising:a sample holder for a sample; an ionizer for ionizing the sample to form ions; a first element spaced downstream from said sample holder; a second element spaced downstream from said first element; a drift region downstream of said second element; a power source electrically coupled to said first element for applying a constant first voltage thereto; means electrically coupled to said sample holder for applying said first voltage thereto for a time subsequent to ionizing the sample, and for applying a second voltage, which is different than said first voltage, after said time in order to extract the ions; means electrically coupled to said second element for applying a time-dependent and mass-correlated voltage thereto; and means for detecting the ions.
14. The spectrometer of claim 13 wherein said means electrically coupled to said sample holder applies a positive going pulse to said sample holder.
15. The spectrometer of claim 14 wherein said means electrically coupled to said sample holder applies said first voltage of about 18.7 kV and said second voltage of about 20.0 kV.
16. The spectrometer of claim 14 wherein said power source electrically coupled to said first element applies said first voltage of about 18.7 kV.
17. The spectrometer of claim 13 wherein said means electrically coupled to said second element applies a third voltage for a time subsequent to ionizing the sample and then applies said time-dependent and mass-correlated voltage.
18. The spectrometer of claim 17 wherein said means electrically coupled to said sample holder applies said first voltage thereto for a first time subsequent to ionizing the sample; and wherein said means electrically coupled to said second element applies said third voltage for a second time subsequent to ionizing the sample.
19. The spectrometer of claim 17 wherein said third voltage is about −3.2 kV for said second time subsequent to ionizing the sample.
20. The spectrometer of claim 17 wherein said means electrically coupled to said second element applies a voltage which increases with time from said third voltage to a fourth voltage in order to apply said time-dependent and mass-correlated voltage.
21. The spectrometer of claim 20 wherein said third voltage is about −3.2 kV; and wherein said fourth voltage is about 0 V.
22. The mass spectrometer of claim 13 wherein said ionizer is a laser which generates a pulse of energy with a duration substantially greater than a time corresponding to required mass resolution.
23. The mass spectrometer of claim 13 wherein said first element comprises a grid.
24. The mass spectrometer of claim 13 wherein said second element comprises a grid.
25. The mass spectrometer of claim 13 wherein said first element comprises an electrostatic lens.
26. The mass spectrometer of claim 13 wherein said second element comprises an electrostatic lens.
27. A time-of-flight mass spectrometer comprising:a sample holder for a sample; an ionizer for ionizing the sample to form ions; an extraction plate electrically coupled to said sample holder; a first element spaced downstream from said extraction plate; a second element spaced downstream from said first element, with said extraction plate and said first element defining an extraction section therebetween, and with said first element and said second element defining an acceleration section therebetween; a drift region downstream of said second element; a power source electrically coupled to said first element for applying a constant first voltage thereto; means electrically coupled to said extraction plate for applying said first voltage thereto for a time subsequent to ionizing the sample, and for applying a second voltage, which is different than said first voltage, after said time in order to extract the ions; means electrically coupled to said second element for applying a time-dependent and mass-correlated voltage thereto; and means for detecting the ions.
28. The mass spectrometer of claim 27 wherein said acceleration section includes at least one separating plate for dividing said acceleration section into a plurality of subsections, and further includes a plurality of series-connected resistors, with a first one of said resistors electrically connected between said first element and a first one of said at least one separating plate, and with a last one of said resistors electrically connected between said second element and a last one of said at least one separating plate, in order to divide said time-dependent and mass-correlated voltage between said sub-sections.
29. The mass spectrometer of claim 27 wherein said spectrometer is a reflectron.
30. A method of mass-correlating the extraction of ions for a time-of-flight mass spectrometer comprising:ionizing a sample to form ions; employing an extraction plate adjacent the sample; employing a first element spaced downstream from said extraction plate; employing a second element spaced downstream from said first element; employing a drift region downstream of said second element; establishing an electric field between said extraction plate and said first element at a time subsequent to ionizing the sample; extracting the ions; establishing a time-dependent and mass-correlated electric field between at least one of: (a) said first element and said second element, and (b) said extraction plate and said first element; and detecting the ions.
31. The method of claim 30 further comprising:employing as said ions a first ion having a mass and a first velocity and a second ion having said mass and a second velocity, with said first velocity being different than said second velocity; and employing said time-dependent and mass-correlated electric field to compensate for the difference between said first and second velocities.
32. The method of claim 31 further comprising:establishing said time-dependent and mass-correlated electric field between said first element and said second element.
33. The method of claim 31 further comprising:establishing said time-dependent and mass-correlated electric field between said extraction plate and said first element.
34. The method of claim 32 further comprising:employing as said mass a first mass; employing as said ions a third ion having a second mass, with said second mass being greater than said first mass; providing no compensation for said third ion when said second mass is greater than or equal to a predetermined mass.
35. The method of claim 33 further comprising:employing as said mass a first mass; employing as said ions a third ion having a second mass, with said second mass being less than said first mass; and providing no compensation for said third ion when said second mass is less than or equal to a predetermined mass.
36. The method of claim 30 further comprising:employing as said ions a first ion having a first mass and a first velocity, a second ion having said first mass and a second velocity, with said first velocity being different than said second velocity, a third ion having a second mass and a third velocity, and a fourth ion having said second mass and a fourth velocity, with said third velocity being different than said fourth velocity, with said first mass being less than said second mass, and with said first and second velocities being greater than said third and fourth velocities; employing said time-dependent and mass-correlated electric field to compensate for the difference between said first and second velocities, and for the difference between said third and fourth velocities.

CROSS REFERENCE TO RELATED APPLICATION

This application claims the benefit of U.S. Provisional Application Ser. No. 60/138,711, filed Jun. 11, 1999.

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Provisional Applications (1)

	Number	Date	Country
	60/138711	Jun 1999	US

Method and apparatus of mass-correlated pulsed extraction for a time-of-flight mass spectrometer

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Patent Number

Date Filed

Date Issued

Inventors

Original Assignees

Examiners

Agents

CPC

US Classifications

Field of Search

US

International Classifications