Time-of-flight spectrometers

Industry

CPC
H01J49/40

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/40Time-of-flight spectrometers

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight mass spectrometer with multiple reflection
- Patent number 12,205,814
- Issue date Jan 21, 2025
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed time of flight mass spectrometer
- Patent number 12,205,813
- Issue date Jan 21, 2025
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Airborne contaminant management method and system
- Patent number 12,202,015
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Ming Tsao
- B08 - CLEANING
Information Patent Grant
Compact time-of-flight mass analyzer
- Patent number 12,191,134
- Issue date Jan 7, 2025
- Spacetek Technology AG
- Jürg Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MALDI-TOF analysis plate with paper support and use thereof
- Patent number 12,186,754
- Issue date Jan 7, 2025
- bioMerieux
- Patrick Broyer
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
C peptide detection by mass spectrometry
- Patent number 12,188,943
- Issue date Jan 7, 2025
- Quest Diagnostics Investments Incorporated
- Nigel Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sample preparation for Maldi and automated system therefor
- Patent number 12,181,392
- Issue date Dec 31, 2024
- Becton, Dickinson and Company
- Timothy Wiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 12,183,564
- Issue date Dec 31, 2024
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,176,198
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture plate assembly
- Patent number 12,165,862
- Issue date Dec 10, 2024
- Micromass UK Limited
- Edward Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoding multiplexed mass spectral data
- Patent number 12,159,775
- Issue date Dec 3, 2024
- Micromass UK Limited
- Richard Denny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-turn time-of-flight mass spectrometer
- Patent number 12,154,778
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Yoshihiro Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 12,123,421
- Issue date Oct 22, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 12,125,694
- Issue date Oct 22, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analysis apparatus
- Patent number 12,111,286
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for pulsed mode charge detection mass spectrom...
- Patent number 12,112,936
- Issue date Oct 8, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting human ingested substance and ingestion times
- Patent number 12,099,052
- Issue date Sep 24, 2024
- XIAMEN LISI TECH SERVICE CO., LTD.
- Zhiyin Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry device and analysis method
- Patent number 12,087,569
- Issue date Sep 10, 2024
- Shimadzu Corporation
- Takuro Kishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated system for online detection of organic molecular impuriti...
- Patent number 12,055,530
- Issue date Aug 6, 2024
- Elemental Scientific, Inc.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,057,305
- Issue date Aug 6, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 12,051,583
- Issue date Jul 30, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,027,359
- Issue date Jul 2, 2024
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,027,360
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibration of high resolution mass spectrum
- Patent number 12,020,918
- Issue date Jun 25, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
A METHOD OF CONFIGURING A STRING OF PULSES
- Publication number 20250022699
- Publication date Jan 16, 2025
- WATERS TECHNOLOGIES IRELAND LIMITED
- Richard Denny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTIFYING A SUBSTANCE PRESENT IN A SAMPLE
- Publication number 20250006479
- Publication date Jan 2, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Pedro José Navarro Álvarez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...
- Publication number 20240426796
- Publication date Dec 26, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER AND METHODS OF PRO...
- Publication number 20240420944
- Publication date Dec 19, 2024
- Academia Sinica
- Yi-Sheng WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20240412967
- Publication date Dec 12, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ENHANCING INFORMATION IN DDA MASS SPECTROMETRY
- Publication number 20240404813
- Publication date Dec 5, 2024
- DH Technologies Development Pte. Ltd.
- Stephen A. TATE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC GAIN CONTROL
- Publication number 20240404808
- Publication date Dec 5, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN
- Publication number 20240404811
- Publication date Dec 5, 2024
- DH Technologies Development Pte. Ltd.
- Calin Bradau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...
- Publication number 20240395520
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES
- Publication number 20240395526
- Publication date Nov 28, 2024
- Zeteo Tech, Inc.
- Tim Cornish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTION MASS SPECTROMETER
- Publication number 20240395531
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE SUPPLY FOR MASS SPECTROMETER
- Publication number 20240395532
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Philipp Cochems
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF MASS SPECTROMETRY, A MASS SPECTROMETER AND COMPUTER SOFT...
- Publication number 20240393303
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20240379337
- Publication date Nov 14, 2024
- Zeteo Tech, Inc.
- Michael MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL INSTRUMENT CALIBRATION
- Publication number 20240371618
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Daniel Marc Mourad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...
- Publication number 20240369516
- Publication date Nov 7, 2024
- Bruker Daltonics GmbH & Co. KG
- Nikolas KESSLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORMS IN AN ION MOBILITY SPECTROMETER
- Publication number 20240361274
- Publication date Oct 31, 2024
- Battelle Memorial Institute
- Adam L. Hollerbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Mass Spectrometry and Mass Spectrometer
- Publication number 20240355609
- Publication date Oct 24, 2024
- Shimadzu Corporation
- Hiroko UEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENTRY/EXIT DEVICE
- Publication number 20240355606
- Publication date Oct 24, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Components Including Programmable Elements and De...
- Publication number 20240347332
- Publication date Oct 17, 2024
- PERKINELMER SCIENTIFIC CANADA ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE
- Publication number 20240339314
- Publication date Oct 10, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSIS SYSTEM
- Publication number 20240331994
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Space Charge Reduction in TOF-MS
- Publication number 20240312776
- Publication date Sep 19, 2024
- DH Technologies Development Pte. Ltd.
- Pavel RYUMIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPEDANCE-MATCHED COAXIAL CONDUCTOR, ELECTRICALLY CONDUCTING CONTAC...
- Publication number 20240304431
- Publication date Sep 12, 2024
- SPACETEK TECHNOLOGY AG
- Jürg JOST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM
- Publication number 20240297029
- Publication date Sep 5, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES
- Publication number 20240282568
- Publication date Aug 22, 2024
- Zeteo Tech, Inc.
- Michael McLoughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA STORAGE FOR TOF INSTRUMENTATION
- Publication number 20240282560
- Publication date Aug 22, 2024
- DH Technologies Development Pte. Ltd.
- Lyle L. BURTON
- H01 - BASIC ELECTRIC ELEMENTS

Time-of-flight spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time-of-flight mass spectrometer with multiple reflection

Multiplexed time of flight mass spectrometer

Airborne contaminant management method and system

Compact time-of-flight mass analyzer

MALDI-TOF analysis plate with paper support and use thereof

C peptide detection by mass spectrometry

Method of sample preparation for Maldi and automated system therefor

Mass spectrometry apparatus

Mass analysis apparatuses and methods

Aperture plate assembly

Ion trap array for high throughput charge detection mass spectrometry

Decoding multiplexed mass spectral data

Systems and methods for single particle analysis

Multi-turn time-of-flight mass spectrometer

Time of flight mass analyser with spatial focussing

Bench-top time of flight mass spectrometer

Ion mirror for multi-reflecting mass spectrometers

Ion mobility analysis apparatus

Apparatus and method for pulsed mode charge detection mass spectrom...

Method for the analytical measurement of sample material on a sampl...

Methods and systems for multi-pass encoded frequency pushing

Method for detecting human ingested substance and ingestion times

Time-of-flight mass spectrometry device and analysis method

Automated system for online detection of organic molecular impuriti...

Mass analysis apparatuses and methods

Ion entry/exit device

Ion analyzer

Bench-top Time of Flight mass spectrometer

Mass spectrometer

Self-calibration of high resolution mass spectrum

Patents Applicationslast 30 patents

A METHOD OF CONFIGURING A STRING OF PULSES

QUANTIFYING A SUBSTANCE PRESENT IN A SAMPLE

AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...

HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER AND METHODS OF PRO...

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

METHOD FOR ENHANCING INFORMATION IN DDA MASS SPECTROMETRY

AUTOMATIC GAIN CONTROL

METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN

METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES

MULTI-REFLECTION MASS SPECTROMETER

VOLTAGE SUPPLY FOR MASS SPECTROMETER

METHODS OF MASS SPECTROMETRY, A MASS SPECTROMETER AND COMPUTER SOFT...

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

ANALYTICAL INSTRUMENT CALIBRATION

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...

WAVEFORMS IN AN ION MOBILITY SPECTROMETER

Method for Mass Spectrometry and Mass Spectrometer

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

ION ENTRY/EXIT DEVICE

Mass Spectrometer Components Including Programmable Elements and De...

MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE

TIME OF FLIGHT MASS ANALYSIS SYSTEM

Space Charge Reduction in TOF-MS

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

IMPEDANCE-MATCHED COAXIAL CONDUCTOR, ELECTRICALLY CONDUCTING CONTAC...

SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES

DATA STORAGE FOR TOF INSTRUMENTATION