for testing bipolar transistors

Industry

CPC
G01R31/2608

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2608for testing bipolar transistors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detection method for sensitive parts of ionization damage in bipola...
- Patent number 12,153,082
- Issue date Nov 26, 2024
- Harbin Institute of Technology
- Xingji Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for diagnosing open circuit (OC) fault of T-type...
- Patent number 12,092,682
- Issue date Sep 17, 2024
- Wuhan University
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device configured for gate dielectric monitoring
- Patent number 12,032,014
- Issue date Jul 9, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate detection circuit of insulated gate bipolar transistor
- Patent number 12,019,115
- Issue date Jun 25, 2024
- GREAT WALL MOTOR COMPANY LIMITED
- Man Shang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 12,000,883
- Issue date Jun 4, 2024
- Mitsubishi Electric Corporation
- Yukihiko Wada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor component test device and method of testing semicondu...
- Patent number 11,994,551
- Issue date May 28, 2024
- Qualtec Co., Ltd.
- Shigeo Sakata
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for predicting insulated gate bipolar transistor...
- Patent number 11,953,538
- Issue date Apr 9, 2024
- WUHAN UNIVERSITY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation method and system of microgrid inverter IGBT...
- Patent number 11,913,986
- Issue date Feb 27, 2024
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for automatically testing a switching member
- Patent number 11,879,929
- Issue date Jan 23, 2024
- Siemens Aktiengesellschaft
- Hubert Schierling
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for online monitoring of health status of insulat...
- Patent number 11,656,266
- Issue date May 23, 2023
- WUHAN UNIVERSITY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for measuring current of semiconduc...
- Patent number 11,600,705
- Issue date Mar 7, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Masashi Tsubuku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IGBT/MOSFET fault protection
- Patent number 11,531,054
- Issue date Dec 20, 2022
- Semiconductor Components Industries, LLC
- Taesung Kwon
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and circuit for testing the functionality of a transistor co...
- Patent number 11,519,955
- Issue date Dec 6, 2022
- Infineon Technologies AG
- Alfons Graf
- G01 - MEASURING TESTING
Information Patent Grant
Device analysis apparatus and device analysis method
- Patent number 11,460,497
- Issue date Oct 4, 2022
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring non-uniform capacitor and IGBT degradation with current...
- Patent number 11,428,750
- Issue date Aug 30, 2022
- SMART WIRES INC.
- Antonio Ginart
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
IGBT module reliability evaluation method and device based on bondi...
- Patent number 11,378,613
- Issue date Jul 5, 2022
- WUHAN UNIVERSITY
- Yigang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IGBT-module condition monitoring equipment and method
- Patent number 11,249,129
- Issue date Feb 15, 2022
- Tsinghua University
- Pinjia Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Gate driver with VGTH and VCESAT measurement capability for the sta...
- Patent number 11,239,839
- Issue date Feb 1, 2022
- Texas Instruments Incorporated
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device and method to establish degradation state of elec...
- Patent number 11,169,201
- Issue date Nov 9, 2021
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the output voltage of a transistor
- Patent number 11,099,225
- Issue date Aug 24, 2021
- ALSTOM TRANSPORT TECHNOLOGIES
- Vincent Escrouzailles
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and circuitry for semiconductor device performance character...
- Patent number 11,099,224
- Issue date Aug 24, 2021
- Marvell Israel (M.I.S.L) Ltd.
- Reuven Ecker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Equi-resistant probe distribution for high-accuracy voltage measure...
- Patent number 11,041,900
- Issue date Jun 22, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test circuit, semiconductor test apparatus, and semic...
- Patent number 10,996,260
- Issue date May 4, 2021
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, methods and computer program products for inverter short...
- Patent number 10,951,111
- Issue date Mar 16, 2021
- Eaton Intelligent Power Limited
- Irving A. Gibbs
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling health of multi-die power module and multi-d...
- Patent number 10,886,871
- Issue date Jan 5, 2021
- Mitsubishi Electric Corporation
- Jeffrey Ewanchuk
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test system
- Patent number 10,816,590
- Issue date Oct 27, 2020
- Sintokogio, Ltd.
- Nobuyuki Takita
- G01 - MEASURING TESTING
Information Patent Grant
Gate driver with VGTH and VCESAT measurement capability for the sta...
- Patent number 10,771,052
- Issue date Sep 8, 2020
- Texas Instruments Incorporated
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Grant
Power transistor, driver and output stage including an active regio...
- Patent number 10,649,021
- Issue date May 12, 2020
- Robert Bosch GmbH
- Alexander Mann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method for performing dynamic and...
- Patent number 10,578,663
- Issue date Mar 3, 2020
- Sintokogio, Ltd.
- Yoichi Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Electric-current sensing device, load driving system, and method fo...
- Patent number 10,444,275
- Issue date Oct 15, 2019
- Renesas Electronics Corporation
- Kenji Takeuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD
- Publication number 20240385235
- Publication date Nov 21, 2024
- Fuji Electric Co., Ltd.
- Kenichi ISHII
- G01 - MEASURING TESTING
Information Patent Application
IGBT COLLECTOR CURRENT ONLINE DETECTION DEVICE AND METHOD BASED ON...
- Publication number 20240353469
- Publication date Oct 24, 2024
- WUHAN UNIVERSITY
- Meng HUANG
- G01 - MEASURING TESTING
Information Patent Application
Power-Semiconductor-Device Test Apparatus Facilitating Test-Connect...
- Publication number 20240310426
- Publication date Sep 19, 2024
- Qualtec Co., Ltd.
- Shigeo Sakata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Arrangement For Monitoring the Condition of a Power Semiconductor M...
- Publication number 20240280627
- Publication date Aug 22, 2024
- ABB Schweiz AG
- Mikko Kohvakka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ESTIMATING QUIESCENT CURRENT IN POWER AMPLI...
- Publication number 20240255562
- Publication date Aug 1, 2024
- Skyworks Solutions, Inc.
- Shiban K. TIKU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS
- Publication number 20240027513
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FA...
- Publication number 20230296661
- Publication date Sep 21, 2023
- Samsung Electronics Co., Ltd.
- Donghun Heo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE DETECTION CIRCUIT OF INSULATED GATE BIPOLAR TRANSISTOR
- Publication number 20230160945
- Publication date May 25, 2023
- GREAT WALL MOTOR COMPANY LIMITED
- Man SHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE...
- Publication number 20230152364
- Publication date May 18, 2023
- Wuhan University
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230111921
- Publication date Apr 13, 2023
- RENESAS ELECTRONICS CORPORATION
- Takashi TONEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD AND MANUFACTURING METHOD
- Publication number 20230069188
- Publication date Mar 2, 2023
- Fuji Electric Co., Ltd.
- Atsushi SHOJI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING INSULATED GATE BIPOLAR TRANSISTOR...
- Publication number 20220341986
- Publication date Oct 27, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING AGING-DICTATED DAMAGE OR DELAMIN...
- Publication number 20220260647
- Publication date Aug 18, 2022
- SIEMENS AKTIENGESELLSCHAFT
- Robert Baumgartner
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE
- Publication number 20220206057
- Publication date Jun 30, 2022
- Mitsubishi Electric Corporation
- Yukihiko WADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELIABILITY EVALUATION METHOD AND SYSTEM OF MICROGRID INVERTER IGBT...
- Publication number 20220120807
- Publication date Apr 21, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEGRADATION DETECTION DEVICE AND DEGRADATION DETECTION METHOD
- Publication number 20220091176
- Publication date Mar 24, 2022
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR AUTOMATICALLY TESTING A SWITCHING MEMBER
- Publication number 20210389363
- Publication date Dec 16, 2021
- Siemens Aktiengesellschaft
- Hubert SCHIERLING
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ONLINE MONITORING OF HEALTH STATUS OF INSULAT...
- Publication number 20210318373
- Publication date Oct 14, 2021
- WUHAN UNIVERSITY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
IGBT/MOSFET FAULT PROTECTION
- Publication number 20210293874
- Publication date Sep 23, 2021
- Semiconductor Components Industries, LLC
- Taesung KWON
- G01 - MEASURING TESTING
Information Patent Application
Method and Circuit for Testing the Functionality of a Transistor Co...
- Publication number 20210255235
- Publication date Aug 19, 2021
- INFINEON TECHNOLOGIES AG
- Alfons Graf
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
- Publication number 20210072304
- Publication date Mar 11, 2021
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IGBT-MODULE CONDITION MONITORING EQUIPMENT AND METHOD
- Publication number 20210063466
- Publication date Mar 4, 2021
- TSINGHUA UNIVERSITY
- Pinjia ZHANG
- G01 - MEASURING TESTING
Information Patent Application
GATE DRIVER WITH VGTH AND VCESAT MEASUREMENT CAPABILITY FOR THE STA...
- Publication number 20200412360
- Publication date Dec 31, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND CIRCUITRY FOR SEMICONDUCTOR DEVICE PERFORMANCE CHARACTER...
- Publication number 20200371151
- Publication date Nov 26, 2020
- Marvell Israel (M.I.S.L) Ltd.
- Reuven Ecker
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE AND METHOD TO ESTABLISH DEGRADATION STATE OF ELEC...
- Publication number 20200256912
- Publication date Aug 13, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
DEVICE ANALYSIS APPARATUS AND DEVICE ANALYSIS METHOD
- Publication number 20200110127
- Publication date Apr 9, 2020
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE WITH ISOLATION BARRIER AND FAULT DETECTION
- Publication number 20200096574
- Publication date Mar 26, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Xiong LI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR CONTROLLING HEALTH OF MULTI-DIE POWER MODULE AND MULTI-D...
- Publication number 20200021235
- Publication date Jan 16, 2020
- Mitsubishi Electric Corporation
- Jeffrey EWANCHUK
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, Methods and Computer Program Products for Inverter Short...
- Publication number 20190238047
- Publication date Aug 1, 2019
- EATON CORPORATION
- Irving A. Gibbs
- G01 - MEASURING TESTING
Information Patent Application
POWER TRANSISTOR, DRIVER AND OUTPUT STAGE
- Publication number 20190086467
- Publication date Mar 21, 2019
- ROBERT BOSCH GmbH
- Alexander Mann
- H03 - BASIC ELECTRONIC CIRCUITRY

for testing bipolar transistors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection method for sensitive parts of ionization damage in bipola...

Method and system for diagnosing open circuit (OC) fault of T-type...

Semiconductor device configured for gate dielectric monitoring

Gate detection circuit of insulated gate bipolar transistor

Semiconductor device and power conversion device

Semiconductor component test device and method of testing semicondu...

Method and system for predicting insulated gate bipolar transistor...

Reliability evaluation method and system of microgrid inverter IGBT...

Method and device for automatically testing a switching member

Method and system for online monitoring of health status of insulat...

Semiconductor device and method for measuring current of semiconduc...

IGBT/MOSFET fault protection

Method and circuit for testing the functionality of a transistor co...

Device analysis apparatus and device analysis method

Monitoring non-uniform capacitor and IGBT degradation with current...

IGBT module reliability evaluation method and device based on bondi...

IGBT-module condition monitoring equipment and method

Gate driver with VGTH and VCESAT measurement capability for the sta...

Diagnostic device and method to establish degradation state of elec...

Method for determining the output voltage of a transistor

Method and circuitry for semiconductor device performance character...

Equi-resistant probe distribution for high-accuracy voltage measure...

Semiconductor test circuit, semiconductor test apparatus, and semic...

Apparatus, methods and computer program products for inverter short...

Method for controlling health of multi-die power module and multi-d...

Test system

Gate driver with VGTH and VCESAT measurement capability for the sta...

Power transistor, driver and output stage including an active regio...

Inspection device and inspection method for performing dynamic and...

Electric-current sensing device, load driving system, and method fo...

Patents Applicationslast 30 patents

TEST METHOD

IGBT COLLECTOR CURRENT ONLINE DETECTION DEVICE AND METHOD BASED ON...

Power-Semiconductor-Device Test Apparatus Facilitating Test-Connect...

Arrangement For Monitoring the Condition of a Power Semiconductor M...

SYSTEMS AND METHODS FOR ESTIMATING QUIESCENT CURRENT IN POWER AMPLI...

AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS

SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FA...

GATE DETECTION CIRCUIT OF INSULATED GATE BIPOLAR TRANSISTOR

METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

TESTING METHOD AND MANUFACTURING METHOD

METHOD AND SYSTEM FOR PREDICTING INSULATED GATE BIPOLAR TRANSISTOR...

METHOD AND APPARATUS FOR DETECTING AGING-DICTATED DAMAGE OR DELAMIN...

SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE

RELIABILITY EVALUATION METHOD AND SYSTEM OF MICROGRID INVERTER IGBT...

DEGRADATION DETECTION DEVICE AND DEGRADATION DETECTION METHOD

METHOD AND DEVICE FOR AUTOMATICALLY TESTING A SWITCHING MEMBER

METHOD AND SYSTEM FOR ONLINE MONITORING OF HEALTH STATUS OF INSULAT...

IGBT/MOSFET FAULT PROTECTION

Method and Circuit for Testing the Functionality of a Transistor Co...

SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING

IGBT-MODULE CONDITION MONITORING EQUIPMENT AND METHOD

GATE DRIVER WITH VGTH AND VCESAT MEASUREMENT CAPABILITY FOR THE STA...

METHOD AND CIRCUITRY FOR SEMICONDUCTOR DEVICE PERFORMANCE CHARACTER...

DIAGNOSTIC DEVICE AND METHOD TO ESTABLISH DEGRADATION STATE OF ELEC...

DEVICE ANALYSIS APPARATUS AND DEVICE ANALYSIS METHOD

DEVICE WITH ISOLATION BARRIER AND FAULT DETECTION

METHOD FOR CONTROLLING HEALTH OF MULTI-DIE POWER MODULE AND MULTI-D...

Apparatus, Methods and Computer Program Products for Inverter Short...

POWER TRANSISTOR, DRIVER AND OUTPUT STAGE