In-circuit-testing

Industry

CPC
G01R31/2843

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2843In-circuit-testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Testing an electronic circuit having a voltage monitor circuit
- Patent number 12,163,997
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Nicola De Campo
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for diagnosing open circuit (OC) fault of T-type...
- Patent number 12,092,682
- Issue date Sep 17, 2024
- Wuhan University
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and corresponding self-test method
- Patent number 12,038,471
- Issue date Jul 16, 2024
- STMicroelectronics S.r.l.
- Mirko Dondini
- G01 - MEASURING TESTING
Information Patent Grant
Detecting capacitive faults and sensitivity faults in capacitive se...
- Patent number 11,953,533
- Issue date Apr 9, 2024
- CAPITAL ONE SERVICES, LLC
- Dan-Ioan-Dumitru Stoica
- G01 - MEASURING TESTING
Information Patent Grant
Bi-directional coupler with termination point for a test point
- Patent number 11,802,903
- Issue date Oct 31, 2023
- ARRIS Enterprises LLC
- Zhijian Sun
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of electronic device and electronic device
- Patent number 11,703,539
- Issue date Jul 18, 2023
- Innolux Corporation
- Ming-Jou Tai
- G01 - MEASURING TESTING
Information Patent Grant
Keyboard with wire aging self-adaptation, self-adaptation method fo...
- Patent number 11,630,155
- Issue date Apr 18, 2023
- Chicony Electronics Co., Ltd.
- Wei-Tse Hung
- G01 - MEASURING TESTING
Information Patent Grant
Maximization of side-channel sensitivity for trojan detection
- Patent number 11,579,185
- Issue date Feb 14, 2023
- University of Florida Research Foundation, Inc.
- Prabhat Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing electrode quality
- Patent number 11,555,846
- Issue date Jan 17, 2023
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- G01 - MEASURING TESTING
Information Patent Grant
Predictive chip-maintenance
- Patent number 11,531,056
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frequency-based built-in-test for discrete outputs
- Patent number 11,353,496
- Issue date Jun 7, 2022
- Hamilton Sundstrand Corporation
- Kevin C. Peterson
- G01 - MEASURING TESTING
Information Patent Grant
Scan cell architecture for improving test coverage and reducing tes...
- Patent number 10,963,612
- Issue date Mar 30, 2021
- Mentor Graphics Corporation
- Nilanjan Mukherjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NAND flash memory controller and storage apparatus applying the same
- Patent number 10,672,499
- Issue date Jun 2, 2020
- RAYMX MICROELECTRONICS CORP.
- Shih-Fu Huang
- G01 - MEASURING TESTING
Information Patent Grant
In-die transistor characterization in an IC
- Patent number 10,379,155
- Issue date Aug 13, 2019
- Xilinx, Inc.
- Ping-Chin Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for monitoring a capacitor bank
- Patent number 10,330,725
- Issue date Jun 25, 2019
- SCHNEIDER ELECTRIC USA, INC.
- David T. Tuckey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 10,175,293
- Issue date Jan 8, 2019
- SK Hynix Inc.
- Byung-Deuk Jeon
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage source inverter filter with resistor failure detection circuit
- Patent number 10,088,517
- Issue date Oct 2, 2018
- Yaskawa America, Inc.
- Mahesh M. Swamy
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for built-in self test of low dropout regulators
- Patent number 9,933,802
- Issue date Apr 3, 2018
- NXP USA, INC.
- Jae Woong Jeong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for detecting abnormalities within a circuit of...
- Patent number 9,895,186
- Issue date Feb 20, 2018
- Covidien
- James A. Gilbert
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Drive failure protection
- Patent number 9,625,519
- Issue date Apr 18, 2017
- Rockwell Automation Technologies, Inc.
- Yuan Xiao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Power device including current transformer and method for compensat...
- Patent number 9,612,275
- Issue date Apr 4, 2017
- LSIS Co., Ltd.
- Yong Kil Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
State of health estimation of power converters
- Patent number 9,494,657
- Issue date Nov 15, 2016
- University of Utah Research Foundation
- Faisal Khan
- G01 - MEASURING TESTING
Information Patent Grant
Fault protection for high-fanout signal distribution circuitry
- Patent number 9,397,663
- Issue date Jul 19, 2016
- Winbond Electronics Corporation
- Nir Tasher
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection and prediction for data storage elements
- Patent number 9,390,814
- Issue date Jul 12, 2016
- SanDisk Technologies LLC
- Robert W. Ellis
- G11 - INFORMATION STORAGE
Information Patent Grant
Using test elements of an integrated circuit for integrated circuit...
- Patent number 9,213,059
- Issue date Dec 15, 2015
- Honeywell International Inc.
- Robert Rabe
- G01 - MEASURING TESTING
Information Patent Grant
Operation check support device and operation check support method
- Patent number 9,134,363
- Issue date Sep 15, 2015
- Panasonic Corporation
- Kenji Mizutani
- G01 - MEASURING TESTING
Information Patent Grant
Methods for testing wireless electronic devices using automatic sel...
- Patent number 9,069,037
- Issue date Jun 30, 2015
- Apple Inc.
- Qishan Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit arrangement with a plurality of on-chip monitor circuits an...
- Patent number 9,041,422
- Issue date May 26, 2015
- Intel Mobile Communications GmbH
- Thomas Baumann
- G01 - MEASURING TESTING
Information Patent Grant
Circuits for detecting AC- or DC-coupled loads
- Patent number 9,035,642
- Issue date May 19, 2015
- Semiconductor Components Industries, LLC
- Mahbub Hasan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for testing electronic circuits
- Patent number 9,003,254
- Issue date Apr 7, 2015
- Ssu-Pin Ma
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONTROL DEVICE AND POWER CONVERSION DEVICE
- Publication number 20240380303
- Publication date Nov 14, 2024
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Daiki TERASHIMA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE
- Publication number 20240219453
- Publication date Jul 4, 2024
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240175914
- Publication date May 30, 2024
- InnoLux Corporation
- Ming-Jou Tai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ACTIVE BRIDGE FOR CHIPLET AND MODULE INTER-COMMUNICATION
- Publication number 20240103065
- Publication date Mar 28, 2024
- International Business Machines Corporation
- Arvind Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND IMAGE FORMING APPARATUS
- Publication number 20240069092
- Publication date Feb 29, 2024
- RICOH COMPANY, LTD.
- Kohhei Nagasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Equipment for Monitoring a Failure in a High-Voltage Cir...
- Publication number 20240042863
- Publication date Feb 8, 2024
- Christian ALLGAEUER
- B60 - VEHICLES IN GENERAL
Information Patent Application
Fault detection circuit, method AND power adapter
- Publication number 20230417823
- Publication date Dec 28, 2023
- Hynetek Semiconductor Co., Ltd.
- Renjian Xie
- G01 - MEASURING TESTING
Information Patent Application
POWER-LOSS DELAY CIRCUIT AND DETECTION CONTROL CIRCUIT THEREOF
- Publication number 20230341459
- Publication date Oct 26, 2023
- MORNSUN GUANGZHOU SCIENCE & TECHNOLOGY CO., LTD.
- Mengyang XU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEVICE AND METHOD FOR OUTPUTTING RESULT OF MONITORING
- Publication number 20230221364
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- Hyunseok NAM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE...
- Publication number 20230152364
- Publication date May 18, 2023
- Wuhan University
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
DETECTING CAPACITIVE FAULTS AND SENSIVITY FAULTS IN CAPACITIVE SENSORS
- Publication number 20220397593
- Publication date Dec 15, 2022
- INFINEON TECHNOLOGIES AG
- Dan-Ioan-Dumitru STOICA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD
- Publication number 20220065923
- Publication date Mar 3, 2022
- STMicroelectronics S.r.l
- Mirko DONDINI
- G01 - MEASURING TESTING
Information Patent Application
TESTING ELECTRODE QUALITY
- Publication number 20210356513
- Publication date Nov 18, 2021
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT
- Publication number 20210341532
- Publication date Nov 4, 2021
- ARRIS Enterprises LLC
- Zhijian SUN
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE CHIP-MAINTENANCE
- Publication number 20210325445
- Publication date Oct 21, 2021
- INFINEON TECHNOLOGIES AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE
- Publication number 20210173000
- Publication date Jun 10, 2021
- InnoLux Corporation
- Ming-Jou Tai
- G01 - MEASURING TESTING
Information Patent Application
MAXIMIZATION OF SIDE-CHANNEL SENSITIVITY FOR TROJAN DETECTION
- Publication number 20210003630
- Publication date Jan 7, 2021
- University of Florida Research Foundation, Inc.
- PRABHAT KUMAR MISHRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FREQUENCY-BASED BUILT-IN-TEST FOR DISCRETE OUTPUTS
- Publication number 20200355739
- Publication date Nov 12, 2020
- HAMILTON SUNDSTRAND CORPORATION
- Kevin C. Peterson
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT, ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND...
- Publication number 20190064256
- Publication date Feb 28, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Yong WANG
- G02 - OPTICS
Information Patent Application
VOLTAGE SOURCE INVERTER FILTER WITH RESISTOR FAILURE DETECTION CIRCUIT
- Publication number 20180100889
- Publication date Apr 12, 2018
- Yaskawa America, Inc.
- Mahesh M. Swamy
- G01 - MEASURING TESTING
Information Patent Application
FAULT PROTECTION FOR HIGH-FANOUT SIGNAL DISTRIBUTION CIRCUITRY
- Publication number 20160028394
- Publication date Jan 28, 2016
- Winbond Electronics Corporation
- Nir Tasher
- G01 - MEASURING TESTING
Information Patent Application
Fault Detection and Prediction for Data Storage Elements
- Publication number 20150270014
- Publication date Sep 24, 2015
- SanDisk Enterprise IP LLC
- Robert W. Ellis
- G01 - MEASURING TESTING
Information Patent Application
POWER DEVICE INCLUDING CURRENT TRANSFORMER AND METHOD FOR COMPENSAT...
- Publication number 20150160288
- Publication date Jun 11, 2015
- LSIS CO., LTD
- Yong Kil CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150060855
- Publication date Mar 5, 2015
- SK HYNIX INC.
- Byung-Deuk JEON
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS AND NOTIFICATION INFORMATION P...
- Publication number 20150022201
- Publication date Jan 22, 2015
- Samsung Electronics Co., Ltd.
- Jeong-ho HAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING ABNORMALITIES WITHIN A CIRCUIT OF...
- Publication number 20140258800
- Publication date Sep 11, 2014
- Covidien LP
- JAMES A. GILBERT
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING
- Publication number 20140247064
- Publication date Sep 4, 2014
- Honeywell International Inc.
- Robert Rabe
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR TESTING ELECTRONIC CIRCUITS
- Publication number 20140195870
- Publication date Jul 10, 2014
- Ssu-Pin Ma
- G01 - MEASURING TESTING
Information Patent Application
DRIVE FAILURE PROTECTION
- Publication number 20140132295
- Publication date May 15, 2014
- Rockwell Automation Technologies, Inc.
- Yuan Xiao
- G01 - MEASURING TESTING
Information Patent Application
State of Health Estimation of Power Converters
- Publication number 20140103937
- Publication date Apr 17, 2014
- The University of Utah
- Faisal Khan
- G01 - MEASURING TESTING

In-circuit-testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Testing an electronic circuit having a voltage monitor circuit

Method and system for diagnosing open circuit (OC) fault of T-type...

Electronic device and corresponding self-test method

Detecting capacitive faults and sensitivity faults in capacitive se...

Bi-directional coupler with termination point for a test point

Manufacturing method of electronic device and electronic device

Keyboard with wire aging self-adaptation, self-adaptation method fo...

Maximization of side-channel sensitivity for trojan detection

Testing electrode quality

Predictive chip-maintenance

Frequency-based built-in-test for discrete outputs

Scan cell architecture for improving test coverage and reducing tes...

NAND flash memory controller and storage apparatus applying the same

In-die transistor characterization in an IC

Systems, methods, and devices for monitoring a capacitor bank

Semiconductor device

Voltage source inverter filter with resistor failure detection circuit

Systems and methods for built-in self test of low dropout regulators

Systems and methods for detecting abnormalities within a circuit of...

Drive failure protection

Power device including current transformer and method for compensat...

State of health estimation of power converters

Fault protection for high-fanout signal distribution circuitry

Fault detection and prediction for data storage elements

Using test elements of an integrated circuit for integrated circuit...

Operation check support device and operation check support method

Methods for testing wireless electronic devices using automatic sel...

Circuit arrangement with a plurality of on-chip monitor circuits an...

Circuits for detecting AC- or DC-coupled loads

Methods and systems for testing electronic circuits

Patents Applicationslast 30 patents

CONTROL DEVICE AND POWER CONVERSION DEVICE

TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE

ELECTRONIC DEVICE

ACTIVE BRIDGE FOR CHIPLET AND MODULE INTER-COMMUNICATION

ELECTRONIC DEVICE AND IMAGE FORMING APPARATUS

Method and Equipment for Monitoring a Failure in a High-Voltage Cir...

Fault detection circuit, method AND power adapter

POWER-LOSS DELAY CIRCUIT AND DETECTION CONTROL CIRCUIT THEREOF

DEVICE AND METHOD FOR OUTPUTTING RESULT OF MONITORING

METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE...

DETECTING CAPACITIVE FAULTS AND SENSIVITY FAULTS IN CAPACITIVE SENSORS

ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD

TESTING ELECTRODE QUALITY

BI-DIRECTIONAL COUPLER WITH TERMINATION POINT FOR A TEST POINT

PREDICTIVE CHIP-MAINTENANCE

MANUFACTURING METHOD OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE

MAXIMIZATION OF SIDE-CHANNEL SENSITIVITY FOR TROJAN DETECTION

FREQUENCY-BASED BUILT-IN-TEST FOR DISCRETE OUTPUTS

TEST CIRCUIT, ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND...

VOLTAGE SOURCE INVERTER FILTER WITH RESISTOR FAILURE DETECTION CIRCUIT

FAULT PROTECTION FOR HIGH-FANOUT SIGNAL DISTRIBUTION CIRCUITRY

Fault Detection and Prediction for Data Storage Elements

POWER DEVICE INCLUDING CURRENT TRANSFORMER AND METHOD FOR COMPENSAT...

SEMICONDUCTOR DEVICE

MAGNETIC RESONANCE IMAGING APPARATUS AND NOTIFICATION INFORMATION P...

SYSTEMS AND METHODS FOR DETECTING ABNORMALITIES WITHIN A CIRCUIT OF...

INTEGRATED CIRCUIT TESTING

METHODS AND SYSTEMS FOR TESTING ELECTRONIC CIRCUITS

DRIVE FAILURE PROTECTION

State of Health Estimation of Power Converters