This application claims the benefit of the German patent application No. 102015221095.2 filed on Oct. 28, 2015, the entire disclosures of which are incorporated herein by way of reference.
The present invention relates to a method for detecting surface residues on fiber composite plastic material components using UV radiation. In particular, the present invention deals with detecting production-related surface residues on carbon-fiber-reinforced plastic material components for use in aircraft or spacecraft.
Although applicable in numerous applications for analyzing surfaces of a wide range of structures and various materials, the present invention and the problems on which it is based are described in greater detail in relation to surface analysis of aircraft structures made of carbon-fiber-reinforced plastic material.
For the industrial manufacture of molded components from fiber-reinforced plastic material (FRP), in particular carbon-fiber-reinforced plastic material (CFRP), molding tools are often used, in which the components are shaped. For this purpose, for example a fiber material semi-finished product, for example mats made of carbon fiber layers, can be impregnated with a liquid matrix material, for example epoxy resin, and cured in the molding tool by applying pressure and temperature. The mold surface of the molding tool determines the surface contour of the finished component which is left behind after curing. Molding tools of this type are often coated with a release agent before use so as to be able to release the finished components from the molding tool as easily as possible. On the side of the component remote from the molding tool, a peel-ply made of nylon or polyester or the like may be placed on the laminate construction of the component to be formed before curing, the peel-ply receiving the liquid matrix material and being removable again after curing. During curing, the peel-ply produces a defined and simultaneously roughened surface, which may be advantageous during further processing, for example for subsequent gluing to further components or subsequent coating of the component. After the component is demolded and the peel-ply is removed, undesired release agent residues or peel-ply residues may be left behind on the component, depending on the manufacturing method. These residues can influence the adhesion of glues or coatings.
Generally, it is desirable to form and obtain FRP components having as precisely defined and clean a surface as possible, so as to provide for further use or machining. Thus, for example, the adhesive properties of a component can be influenced if the surface thereof is soiled or comprises residues of undesired substances. Furthermore, good adhesion properties are advantageous for painting or coating a component. Accordingly, there is a need for methods which detect residues on surfaces of FRP components.
For example, X-ray photoelectron spectroscopy (XPS) makes it possible to analyze the chemical composition of the surface of small substance samples in a non-destructive manner in laboratory conditions. Furthermore, the wetting properties of a surface by liquids may be characteristic of the soiling or adhesiveness of the surface. If individual liquid drops are applied to the surface, conclusions can be drawn as regards the cleanness of the surface using contact angle measurements (CAM). In aerosol wetting, aerosol mist is sprayed onto surfaces over a large area, so as to determine the wetting properties similarly to using CAM. Furthermore, the wetting properties can also be used in further methods. So, for example, in a water brake test, the wetting of surfaces can be broadly determined using relatively large amounts of water. A sufficiently precise contact angle measurement of a structured surface, such as may be left behind after peel-ply removal, is found to be difficult.
One of the ideas of the present invention is to find solutions for simple detection methods which make it possible to measure surface impurities over a large area even on structured and potentially rough surfaces, without soiling the surfaces with additional substances.
Accordingly, a method for detecting surface residues on fiber composite plastic material components is provided. The method comprises irradiating a surface of the component with ultraviolet radiation using an ultraviolet radiation source. The method further comprises detecting fluorescent radiation which is emitted by the surface of the component as a result of the irradiation with the ultraviolet radiation. The method further comprises characterizing surface residues on the basis of the detected fluorescent radiation.
One of the findings in the present invention involves using ultraviolet radiation for non-destructive analysis of surfaces of fiber-reinforced plastic material components. Particular peel-plies and other release agents have fluorescent properties under UV radiation. Production-related residues of these materials on surfaces can thus be made visible by illuminating the surfaces of the components with UV light. Under normal illumination in the visible spectrum, these residues are typically not visible. The fiber-reinforced plastic material, for example CFK or epoxy resin located on the surface, does not fluoresce in this case, and appears dark or black under UV radiation. The emitted fluorescent radiation can thus be used to characterize residues on the surface or material impurities thereon. In principle, in this way discrepancies in, damage to or contaminations of the surface can also be detected if they are apparent in the emitted fluorescent radiation.
A particular advantage of the solution according to the invention is that manufacturing errors or manufacture-related residues (for example peel-ply residues, fiber tears etc.) or the like can be established over a large area rapidly and directly on the analyzed component. For visual observation, for example even a UV emitter such as a black light emitter may be sufficient. Surface residues can be detected visually and subsequently eliminated or corrected. For example, surface treatment in the form of grinding may be provided, or the surface may be treated using an atmospheric pressure plasma or a laser. The method is thus particularly simple and cost-effective, among other things. In the case of the present invention, there is in particular no risk of contaminations or other changes in the surface as a result of the means used for the analysis.
Advantageous embodiments and developments may be derived from the further, dependent claims and from the description with reference to the drawings.
In some embodiments, detecting the fluorescent radiation may comprise detecting the fluorescent radiation using a fluorescent radiation detector. In this development, the fluorescent radiation may thus also be quantitatively detected, in such a way that it can for example be analyzed by appropriate means.
Detecting the fluorescent radiation may comprise measuring characteristic measurement variables of the detected fluorescent radiation. The characteristic measurement variables may for example be used as a basis for a subsequent analysis of the quality of the surface. In principle, a person skilled in the art can choose, depending on the requirements and the application, whether a relatively simple and thus robust analysis of a surface is preferred. Alternatively or in addition, for example, complex multivariate measurement variables may also be detected, on the basis of which the quality of a surface can be analyzed thoroughly and precisely.
The characteristic measurement variables may comprise radiation spectra and/or intensity distributions of the detected fluorescent radiation. For example, in this development, purely visual detection and characterization of the surface residues can be supplemented by or replaced with an intensity measurement. In this development, the method still requires extremely little expense, and can be used cost-effectively during small- or large-scale production. In principle, however, more complex spectroscopic measurements are also possible and provided within the scope of the invention.
In some embodiments, characterizing the surface residues may comprise analyzing the characteristic measurement variables of the detected fluorescent radiation using an analysis device. The analysis device may for example be set up to be fully or semi-automatic and for example contain a microprocessor and/or be connected to a data processing apparatus, a computer or the like. In principle, in this development the analysis may thus run automatically, it being possible, in particular, to make use of all of the tools and aids of electronic data analysis.
The analysis device may compare the characteristic measurement variables with one or more reference surfaces. For example, components may be provided comprising surfaces which are cleaned or which are soiled in a defined manner. Alternatively, components comprising specially prepared surfaces may be used. By calibrating the method according to the invention, it can for example be applied to reference components of this type having known properties. Analysis of the unknown surface residues of a component can be supplemented with the use of calibration components or calibration surfaces of this type, or the precision of said analysis can be improved by the use thereof.
In some embodiments, the method for detecting surface residues may be carried out on a surface of a carbon-fiber-reinforced plastic material (CFRP) component. Carbon-fiber-reinforced plastic material, in particular the epoxy resin used as a matrix material, appears dark or black under irradiation with ultraviolet radiation, in such way that fluorescent residues located thereon show up particularly well.
In some embodiments, the surface residues may comprise components of release agents for producing FRP components.
In some embodiments, the surface residues may comprise peel-ply residues. Peel-plies may for example be present in the form of nylon and/or polyester plies or the like.
The components of release agents may be characterized on the basis of area portions of the surface having increased intensity of the detected fluorescent radiation. For example, typical peel-plies or the coatings thereof fluoresce under UV radiation, in such a way that residues of plies of this type are clearly visible on a component of non-fluorescing or scarcely fluorescing CFRP.
In some embodiments, the surface residues may include surface damage. Whilst residues of peel-plies typically fluoresce strongly, fiber tears or the like of carbon fibers in a CFRP component appear particularly dark under irradiation with UV light, and can thus also be distinguished.
The surface damage may be characterized on the basis of area portions of the surface having a minimal intensity of the detected fluorescent radiation.
In some embodiments, the ultraviolet radiation source may be formed to emit ultraviolet radiation in near ultraviolet at wavelengths in the range of 310 nm to 400 nm. The ultraviolet radiation source may accordingly in particular be a UVA-A light source, in other words emit black light.
The above embodiments and developments can be combined in any desired manner, within reason. Further possible embodiments, developments and implementations of the invention also include combinations not explicitly mentioned of features of the invention which are disclosed above or in the following in relation to the embodiments. In particular, a person skilled in the art will also add individual aspects to the relevant basic form of the present invention as improvements or additions.
In the following, the present invention is described in greater detail by way of the embodiments set out in the schematic drawings, in which:
The accompanying drawings are intended to provide further understanding of the embodiments of the invention. They illustrate embodiments and are intended to explain principles and concepts of the invention in conjunction with the description. Other embodiments and many of the aforementioned advantages may be seen from the drawings. The elements of the drawings are not necessarily to scale.
In the drawings, like, functionally equivalent and equivalently acting elements, features and components are provided with like reference numerals in each case, unless indicated otherwise.
In
As is schematically shown in
Peel-plies and other surface residues 6 can fluoresce as soon as they are irradiated with the ultraviolet radiation 3 (see
In some embodiments, the method M may provide that the fluorescent radiation 12 is not merely visually detected, but rather analyzed more precisely using spectroscopic intensity measurements or similar methods. For this purpose, the method M may comprise detecting the fluorescent radiation 12 using a fluorescent radiation detector 2 (see
In principle, the method M is basically similar to the method disclosed in connection with
In the above detailed description, various features have been combined in one or more examples to improve the cogency of what is described. However, it should be clear that the above description is merely illustrative and in no way limiting in nature. It is intended to cover all alternatives, modifications and equivalents of the various features and embodiments. Many other examples will be immediately and directly apparent to a person skilled in the art in view of the above description as a result of his expert knowledge.
The embodiments have been selected and described so as to be able to represent as clearly as possible the principles behind the invention and the possible applications thereof in practice. As a result, skilled persons can modify and use the invention and the various embodiments thereof optimally in relation to the intended purpose of use. In the claims and description, the terms “containing” and “having” are used as neutral terms for the corresponding concepts “comprising”. Furthermore, the use of the terms “a”, “an” and “one” does not in principle exclude the possibility of a plurality of the features and components thus described.
In addition, in this disclosure, the terms “comprise” or “comprising” do not exclude other elements or steps and the term “or” means either or both. Furthermore, characteristics or steps which have been described may also be used in combination with other characteristics or steps and in any order unless the disclosure or context suggests otherwise. This disclosure hereby incorporates by reference the complete disclosure of any patent or application from which it claims benefit or priority.
Number | Date | Country | Kind |
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102015221095.2 | Oct 2015 | DE | national |