Method for matching a model spectrum to a measured spectrum

Abstract

With technical surfaces, in particular in semiconductor manufacture, it is a regular requirement to obtain the reflection coefficient of an inspected object (12). To better match the calculated model spectrum (16) to the obtained measured spectrum (18) with respect to damping when thick layers are measured, the measuring system (10) is measured with respect to its line spread I(λ). The measured line spread I(λ) is iteratively used for calculating the damping of the model spectrum (16), so that a damped model spectrum (20) is obtained.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

Further advantages and advantageous embodiments of the invention are the subject matter of the subsequent figures and their descriptions, in which an illustration to scale has been omitted for clarity. In the figures:

FIG. 1 shows the schematic structure of the measuring system according to the present invention; and

FIG. 2 schematically shows the sequence of the method according to the present invention.

Claims

1. A method for matching a model spectrum to a measured spectrum of an object, of a multi-layer system, comprises the steps of: detecting the measured spectrum with a measuring system,calculating an associated model spectrum with a plurality of wavelengths and a number of intermediate points,measuring the measuring system in view of its line spread I(λ), anditeratively using the measured line spread I(λ) for calculating the damping of the model spectrum.

2. The method according to claim 1, wherein local mean values Ri are calculated for the intermediate points of the model spectrum.

3. The method according to claim 2, wherein the local mean values Ri are calculated by dividing, for all intermediate points, the sum of the values of a number of next neighboring intermediate points, weighted with a normalized flat Gaussian curve, by the sum of the weights used for the Gaussian curve.

4. The method according to claim 1, wherein a damped model spectrum is calculated by damping the amplitude by multiplying the model spectrum with a value LS and the height of the amplitude thus lost is compensated for by adding the local mean value of Ri, multiplied with a factor LD, wherein the value LS and the factor LD are equal to or smaller than one and greater than zero.

5. The method according to claim 4, wherein the damped model spectrum is convoluted with the measured line spread I(λ).

6. The method according to claim 5, wherein initial values for the values LS and the factor LD are set to 1, and then newly determined after each convolution of the damped model spectrum with the measured line spread, and the calculation of a newly damped model spectrum is carried out until the difference between the old and new values LS and the new factor LD normalized to the new value LS and the new factor LD is smaller than a predetermined percentage.

7. The method according to claim 6, wherein for determining each new value LS from the measured spectrum and the damped model spectrum, the value of the mean change A of the value of two respective neighboring intermediate points is calculated as:

8. The method according to claim 7, wherein the new value LS is calculated from the ratio of the values A of the measured spectrum relative to the damped model spectrum with the equation:

9. The method according to claim 6, wherein for determining the new factor LD from the measured spectrum (18) and the damped model spectrum, the mean value M of the averaged change of the value of two respective neighboring intermediate points is calculated as:

10. The method according to claim 9, wherein the new factor LD is calculated from the ratio of the values M of the measured spectrum relative to the damped model spectrum with the equation: