Vistec Semiconductor Systems Jena GmbH

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for automatic detection of incorrect measurements...
- Patent number 8,154,595
- Issue date Apr 10, 2012
- Vistec Semiconductor Systems Jena GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for the determination of the position of a dis...
- Patent number 8,125,653
- Issue date Feb 28, 2012
- Vistec Semiconductor Systems Jena GmbH
- Gert Weniger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calculating a model spectrum
- Patent number 7,561,984
- Issue date Jul 14, 2009
- Vistec Semiconductor Systems Jena GmbH
- Christian Halm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for inspecting a disk-shaped object
- Patent number 7,426,024
- Issue date Sep 16, 2008
- Vistec Semiconductor Systems Jena GmbH
- René Schenck
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for thin-layer metrology
- Patent number 7,349,106
- Issue date Mar 25, 2008
- Vistec Semiconductor Systems Jena GmbH
- Matthias Slodowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system with an optical measurement arrangement
- Patent number 7,277,190
- Issue date Oct 2, 2007
- Vistec Semiconductor Systems Jena GmbH
- Matthias Slodowski
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for inspecting unpatterned wafers
- Patent number 7,084,965
- Issue date Aug 1, 2006
- Vistec Semiconductor Systems Jena GmbH
- Joachim Wienecke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR THE DETERMINATION OF THE POSITION OF A DIS...
- Publication number 20100085582
- Publication date Apr 8, 2010
- Vistec Semiconductor Systems Jena GmbH
- Gert Weniger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device for holding disk-shaped objects
- Publication number 20090309285
- Publication date Dec 17, 2009
- Vistec Semiconductor Systems Jena GmbH
- Rene Schenck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR AUTOMATIC DETECTION OF INCORRECT MEASUREMENTS...
- Publication number 20080202201
- Publication date Aug 28, 2008
- Vistec Semiconductor Systems Jena GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for holding disk-like objects
- Publication number 20080203636
- Publication date Aug 28, 2008
- VISTEC Semiconductor Systems Jena GmbH
- Rene Schenck
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Method for matching a model spectrum to a measured spectrum
- Publication number 20070174014
- Publication date Jul 26, 2007
- VISTEC SEMICONDUCTOR SYSTEMS JENA GmbH
- Christian Halm
- G01 - MEASURING TESTING
Information Patent Application
Method for calculating a model spectrum
- Publication number 20070171429
- Publication date Jul 26, 2007
- VISTEC SEMICONDUCTOR SYSTEMS JENA GmbH
- Christian Halm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for inspecting a wafer
- Publication number 20070076943
- Publication date Apr 5, 2007
- Vistec Semiconductor Systems Jena GmbH
- Joachim Wienecke
- G06 - COMPUTING CALCULATING COUNTING

Vistec Semiconductor Systems Jena GmbH

Organization

Patents Grantslast 30 patents

Device and method for automatic detection of incorrect measurements...

Apparatus and method for the determination of the position of a dis...

Method for calculating a model spectrum

System for inspecting a disk-shaped object

Apparatus and method for thin-layer metrology

Measurement system with an optical measurement arrangement

Arrangement and method for inspecting unpatterned wafers

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR THE DETERMINATION OF THE POSITION OF A DIS...

Device for holding disk-shaped objects

DEVICE AND METHOD FOR AUTOMATIC DETECTION OF INCORRECT MEASUREMENTS...

Apparatus for holding disk-like objects

Method for matching a model spectrum to a measured spectrum

Method for calculating a model spectrum

Method and apparatus for inspecting a wafer

Trademarklast 30 trademarks