Analysing diffraction patterns

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CPC
G01N23/2055

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2055Analysing diffraction patterns

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
- Patent number 12,072,305
- Issue date Aug 27, 2024
- FYZIKALNI USTAV AV CR. V.V.I
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Grant
Soaking machine of single-crystal X-ray structure analysis sample,...
- Patent number 12,055,501
- Issue date Aug 6, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analyzing diffraction pattern of mixture, and...
- Patent number 12,031,927
- Issue date Jul 9, 2024
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of cause of degradation of lithium secondary battery
- Patent number 12,013,356
- Issue date Jun 18, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Crosslinked fluoropolymer resin and control method for same
- Patent number 11,946,924
- Issue date Apr 2, 2024
- PROTERIAL, LTD.
- Kazufumi Suenaga
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Orientation degree distribution calculation method, orientation deg...
- Patent number 11,921,061
- Issue date Mar 5, 2024
- National Institute of Advanced Industrial Science and Technology
- Rikio Soda
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Data-driven solutions for inverse elemental modeling
- Patent number 11,821,857
- Issue date Nov 21, 2023
- Baker Hughes Oilfield Operations LLC
- Robert Krumm
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method for identifying molecular structure
- Patent number 11,815,475
- Issue date Nov 14, 2023
- The University of Tokyo
- Makoto Fujita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of acquiring sample for evaluation of SiC single crystal
- Patent number 11,815,437
- Issue date Nov 14, 2023
- Resonac Corporation
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission X-ray critical dimension (T-XCD) characterization of s...
- Patent number 11,761,913
- Issue date Sep 19, 2023
- BRUKER TECHNOLOGIES LTD.
- Adam Ginsburg
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 11,692,953
- Issue date Jul 4, 2023
- Nova Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Estimating wear for BHA components using borehole hardness
- Patent number 11,579,329
- Issue date Feb 14, 2023
- Halliburton Energy Services, Inc.
- Ian David Campbell Mitchell
- E21 - EARTH DRILLING MINING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...
- Publication number 20250035570
- Publication date Jan 30, 2025
- Resonac Corporation
- Hiromasa SUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...
- Publication number 20250029683
- Publication date Jan 23, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- KOKI UENO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240328972
- Publication date Oct 3, 2024
- Rigaku Corporation
- Rieko SUENAGA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD
- Publication number 20240319122
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Yuki OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING MICROSTRUCTURAL DETERIORATION AND REMAINING...
- Publication number 20240280516
- Publication date Aug 22, 2024
- Aktiebolaget SKF
- Predrag ANDRIC
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...
- Publication number 20240272098
- Publication date Aug 15, 2024
- Centre National de la Recherche Scientifique
- Hocine KHEMLICHE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
NEGATIVE ELECTRODE FOR RECHARGEABLE LITHIUM BATTERY AND RECHARGEABL...
- Publication number 20240170655
- Publication date May 23, 2024
- Samsung SDI Co., Ltd.
- Yeongap KIM
- G01 - MEASURING TESTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20240167969
- Publication date May 23, 2024
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE DATABASE-BASED MATERIAL ANALYSIS METHOD AND SYSTE...
- Publication number 20240142394
- Publication date May 2, 2024
- PEKING UNIVERSITY SHENZHEN GRADUATE SCHOOL
- Feng PAN
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
- Publication number 20240133829
- Publication date Apr 25, 2024
- Rigaku Corporation
- Takumi OTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
- Publication number 20240077436
- Publication date Mar 7, 2024
- FEI Company
- Stefano VESPUCCI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
- Publication number 20240044819
- Publication date Feb 8, 2024
- NOVA LTD
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROCHEMICAL APPARATUS AND ELECTRONIC APPARATUS
- Publication number 20240038995
- Publication date Feb 1, 2024
- Ningde Amperex Technology Limited
- Xiaohu CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON PTYCHOGRAPHY METHOD AND APPARATUS FOR AUTOMATICALLY CORREC...
- Publication number 20230417690
- Publication date Dec 28, 2023
- TSINGHUA UNIVERSITY
- RONG YU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230393083
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRODE FOR POWER STORAGE DEVICES AND LITHIUM-ION SECONDARY BATTERY
- Publication number 20230361299
- Publication date Nov 9, 2023
- TDK Corporation
- Takuya AOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND COMPOSITIONS FOR LOW SALINITY ENHANCED OIL RECOVERY
- Publication number 20230358694
- Publication date Nov 9, 2023
- BP CORPORATION NORTH AMERICA INC.
- Huang Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONAQUEOUS ELECTROLYTE BATTERY AND BATTERY PACK
- Publication number 20230352682
- Publication date Nov 2, 2023
- Kabushiki Kaisha Toshiba
- Natsuki OTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
- Publication number 20230341325
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Lars LOETGERING
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLITE SIZE IN ROCK SAMPLES
- Publication number 20230333078
- Publication date Oct 19, 2023
- Chevron U.S.A. Inc.
- Rebecca Stokes
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20230324316
- Publication date Oct 12, 2023
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hitomi ADACHI
- G01 - MEASURING TESTING
Information Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Byron Freelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...
- Publication number 20230304948
- Publication date Sep 28, 2023
- Rigaku Corporation
- Ryouichi YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
- Publication number 20230296538
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Roelof De Vries
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
- Publication number 20230273134
- Publication date Aug 31, 2023
- PROTO PATENTS LTD.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING

Analysing diffraction patterns

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of detecting internal stress distribution of transparent mat...

Method for measuring the diameter of filament diffraction fringes b...

X-ray based measurements in patterned structure

Quantitative analysis apparatus, method and program and manufacturi...

Method for analysis and determination of heavy metal occurrence key...

Device and method for measuring short-wavelength characteristic X-r...

Quantum-limited extreme ultraviolet coherent diffraction imaging

Methods for determining crystal structure and apparatus for carryin...

Soaking machine of single-crystal X-ray structure analysis sample,...

Method and device for analyzing diffraction pattern of mixture, and...

Diagnosis of cause of degradation of lithium secondary battery

Method and system to determine crystal structure

Sample inspection system comprising a beam former to project a poly...

Crosslinked fluoropolymer resin and control method for same

Method for improving an EBSD/TKD map

System and method for in-situ X-ray diffraction-based real-time mon...

Orientation degree distribution calculation method, orientation deg...

Screening system

Structure for pressurization analysis, X-ray diffraction apparatus...

Quantitative phase analysis device, quantitative phase analysis met...

Data-driven solutions for inverse elemental modeling

Method for identifying molecular structure

Method of acquiring sample for evaluation of SiC single crystal

Methods and systems for acquiring three-dimensional electron diffra...

Transmission X-ray critical dimension (T-XCD) characterization of s...

Apparatus for inspecting semiconductor device and method for inspec...

X-ray based measurements in patterned structure

Electron microscopy analysis method

Energy-dispersive X-ray diffraction analyser comprising a substanti...

Estimating wear for BHA components using borehole hardness

Patents Applicationslast 30 patents

METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC S...

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING SYSTEM, AND N...

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM

ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD

X-Ray Scatterometry Based Measurements Of Memory Array Structures S...

METHOD FOR DETERMINING MICROSTRUCTURAL DETERIORATION AND REMAINING...

DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH...

NEGATIVE ELECTRODE FOR RECHARGEABLE LITHIUM BATTERY AND RECHARGEABL...

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

CRYSTAL STRUCTURE DATABASE-BASED MATERIAL ANALYSIS METHOD AND SYSTE...

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...

METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

ELECTROCHEMICAL APPARATUS AND ELECTRONIC APPARATUS

ELECTRON PTYCHOGRAPHY METHOD AND APPARATUS FOR AUTOMATICALLY CORREC...

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

ELECTRODE FOR POWER STORAGE DEVICES AND LITHIUM-ION SECONDARY BATTERY

METHODS AND COMPOSITIONS FOR LOW SALINITY ENHANCED OIL RECOVERY

NONAQUEOUS ELECTROLYTE BATTERY AND BATTERY PACK

WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...

CRYSTALLITE SIZE IN ROCK SAMPLES

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...

X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD