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G01N2223/607
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/607
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Patents Grants
last 30 patents
Information
Patent Grant
Component residual stress testing platform based on neutron diffrac...
Patent number
12,146,845
Issue date
Nov 19, 2024
NCS TESTING TECHNOLOGY CO., LTD
Lixia Yang
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
X-ray beam shaping apparatus and method
Patent number
12,007,343
Issue date
Jun 11, 2024
Malvern Panalytical B.V.
Milen Gateshki
G01 - MEASURING TESTING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
Patent number
11,846,593
Issue date
Dec 19, 2023
PROTO PATENTS LTD.
James Pineault
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for evaluating rotor-mast fatigue damage
Patent number
11,738,887
Issue date
Aug 29, 2023
Textron Innovations Inc.
Steve Cates
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
Patent number
11,703,465
Issue date
Jul 18, 2023
Kioxia Corporation
Nobuhito Kuge
G01 - MEASURING TESTING
Information
Patent Grant
Thin film analyzing device and thin film analyzing method
Patent number
11,508,630
Issue date
Nov 22, 2022
Kioxia Corporation
Yuki Wakisaka
B24 - GRINDING POLISHING
Information
Patent Grant
Situ monitoring of stress for additively manufactured components
Patent number
11,292,198
Issue date
Apr 5, 2022
Hamilton Sundstrand Corporation
Joseph V. Mantese
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Method for measuring stress
Patent number
11,221,304
Issue date
Jan 11, 2022
Kobe Steel, Ltd.
Hiroyuki Takamatsu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for computed laminography x-ray fluorescence imaging
Patent number
11,143,605
Issue date
Oct 12, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring stress
Patent number
10,914,692
Issue date
Feb 9, 2021
Kobe Steel, Ltd.
Hiroyuki Takamatsu
G01 - MEASURING TESTING
Information
Patent Grant
ā4Dā dynamic tomography system
Patent number
10,739,281
Issue date
Aug 11, 2020
Centre National de la Recherche Scientifique
François Hild
G01 - MEASURING TESTING
Information
Patent Grant
System and method for performing nano beam diffraction analysis
Patent number
10,658,154
Issue date
May 19, 2020
International Business Machines Corporation
Marc Adam Bergendahl
G01 - MEASURING TESTING
Information
Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
Patent number
10,648,932
Issue date
May 12, 2020
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
Patent number
10,620,141
Issue date
Apr 14, 2020
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
Patent number
10,613,042
Issue date
Apr 7, 2020
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based fatigue inspection of downhole component
Patent number
10,539,518
Issue date
Jan 21, 2020
Weatherford Technology Holdings, LLC
Robert P. Badrak
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction device and method to measure stress with 2D detec...
Patent number
10,416,102
Issue date
Sep 17, 2019
Bob Baoping He
G01 - MEASURING TESTING
Information
Patent Grant
X-ray stress analysis apparatus, method, and program
Patent number
10,401,310
Issue date
Sep 3, 2019
Rigaku Corporation
Shoichi Yasukawa
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for determining strain distribution in a sample
Patent number
10,209,206
Issue date
Feb 19, 2019
Nova Measuring Instruments Ltd.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining lattice parameters of a strain...
Patent number
10,132,765
Issue date
Nov 20, 2018
Infineon Technologies Austria AG
Marija Borna Tutuc
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring depth of damage of wafer
Patent number
9,857,319
Issue date
Jan 2, 2018
LG SILTRON INCORPORATED
Kyu Hyung Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strain mapping in TEM using precession electron diffraction
Patent number
9,568,442
Issue date
Feb 14, 2017
Drexel University
Mitra Lenore Taheri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing an un-distorted dark field strain map at high s...
Patent number
9,551,674
Issue date
Jan 24, 2017
GLOBALFOUNDRIES, INC.
Yun-Yu Wang
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
Patent number
9,222,900
Issue date
Dec 29, 2015
Danmarks Tekniske Universitet of Anker Engelundsvej
Erik Mejdal Lauridsen
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
Patent number
9,222,901
Issue date
Dec 29, 2015
Danmarks Tekniske Universitet Anker Engelundsvej
Erik Mejdal Lauridsen
G01 - MEASURING TESTING
Information
Patent Grant
High-temperature strain cell for tomographic imaging
Patent number
9,057,681
Issue date
Jun 16, 2015
The Regents of the University of California
Alastair A. MacDowell
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive examination of structures having embedded particles
Patent number
9,042,516
Issue date
May 26, 2015
The Boeing Company
James A. Grossnickle
G01 - MEASURING TESTING
Information
Patent Grant
X-ray stress measurement apparatus
Patent number
8,855,266
Issue date
Oct 7, 2014
Rigaku Corporation
Shoichi Yasukawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...
Publication number
20230160843
Publication date
May 25, 2023
SINTOKOGIO, LTD.
Yuji KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
BALL-MAPPING SYSTEM AND METHOD OF OPERATING THE SAME
Publication number
20220034826
Publication date
Feb 3, 2022
PROTO PATENTS LTD.
James PINEAULT
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
Publication number
20210080408
Publication date
Mar 18, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FO...
Publication number
20210025863
Publication date
Jan 28, 2021
JTEKT Corporation
Yousuke NAGANO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING RESIDUAL STRESS
Publication number
20200340933
Publication date
Oct 29, 2020
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
Mariko MATSUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING STRESS
Publication number
20200141885
Publication date
May 7, 2020
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
Hiroyuki TAKAMATSU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING STRESS
Publication number
20200072769
Publication date
Mar 5, 2020
KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD)
Hiroyuki TAKAMATSU
G01 - MEASURING TESTING
Information
Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
Publication number
20190094158
Publication date
Mar 28, 2019
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
Publication number
20190094160
Publication date
Mar 28, 2019
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
Publication number
20190094159
Publication date
Mar 28, 2019
International Business Machines Corporation
Madhana Sunder
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Based Fatigue Inspection of Downhole Component
Publication number
20180328870
Publication date
Nov 15, 2018
Weatherford Technology Holdings, LLC.
Robert P. Badrak
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Determining Lattice Parameters of a Strain...
Publication number
20170343491
Publication date
Nov 30, 2017
Infineon Technologies Austria AG
Marija Borna Tutuc
G01 - MEASURING TESTING
Information
Patent Application
"4D" DYNAMIC TOMOGRAPHY SYSTEM
Publication number
20170131223
Publication date
May 11, 2017
Centre National de la Recherche Scientifique
François HILD
G01 - MEASURING TESTING
Information
Patent Application
STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM
Publication number
20170082561
Publication date
Mar 23, 2017
Rigaku Corporation
Shoichi YASUKAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING DEPTH OF DAMAGE OF WAFER
Publication number
20160238544
Publication date
Aug 18, 2016
LG SILTRON INCORPORATED
Kyu Hyung LEE
G01 - MEASURING TESTING
Information
Patent Application
Strain Mapping in TEM Using Precession Electron Diffraction
Publication number
20160139063
Publication date
May 19, 2016
Drexel University
Mitra Lenore Taheri
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
Publication number
20140307854
Publication date
Oct 16, 2014
CARL ZEISS X-RAY MICROSCOPY, INC.
Erik Mejdal LAURIDSEN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
Publication number
20140254763
Publication date
Sep 11, 2014
DANMARKS TEKNISKE UNIVERSITET
Erik Mejdal LAURIDSEN
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
Publication number
20140159161
Publication date
Jun 12, 2014
International Business Machines Corporation
Thomas N. Adam
G01 - MEASURING TESTING
Information
Patent Application
HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING
Publication number
20140161223
Publication date
Jun 12, 2014
The Regents of the University of California
Alastair A. MacDowell
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE EXAMINATION OF STRUCTURES HAVING EMBEDDED PARTICLES
Publication number
20140098936
Publication date
Apr 10, 2014
The Boeing Company
James A. Grossnickle
G01 - MEASURING TESTING
Information
Patent Application
Evaluation System and Evaluation Method of Plastic Strain
Publication number
20130089182
Publication date
Apr 11, 2013
Hitachi, Ltd
Yun WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING RUBBER COMPOUND WITH FILLER PARTICLES
Publication number
20130051656
Publication date
Feb 28, 2013
Wakana Ito
G01 - MEASURING TESTING
Information
Patent Application
X-RAY STRESS MEASUREMENT APPARATUS
Publication number
20130039469
Publication date
Feb 14, 2013
Rigaku Corporation
Shoichi Yasukawa
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
Publication number
20120146050
Publication date
Jun 14, 2012
International Business Machines Corporation
THOMAS N. ADAM
G01 - MEASURING TESTING
Information
Patent Application
Method for measuring an amount of strain of a bonded strained wafer
Publication number
20070166845
Publication date
Jul 19, 2007
Shin-Etsu Handotai Co., Ltd.
Isao Yokokawa
G01 - MEASURING TESTING