Scott Silverman, "Laser Microchemical Technology Enables Real-Time editing of First Run Silicon," Solid State Technology p. 113, 1996. |
Paul Winer, "IC Failure Analysis, E-Beam Tutorial," International Reliability and Physics Symposium, 1996. |
Scott Silverman, "Laser Microchemical Technology Enables Real-Time Editing of First-Run Silicon," Solid State Technology, 1996. |
Ann N. Campbell, Fault Localization with the Focused Ion Beam (FIB) System, in Microelectronic Failure Analysis, ASM International, 1996. |