Claims
- 1. A method of producing contacts of an electrical component which are suitable for flip-chip mounting, wherein the electrical component has electrically conductive structures on a substrate tightly encapsulated with a cap cover and the cap cover is formed with a window in which terminal pads of the electrically conductive structures are disposed, the method which comprises:
- vapor-depositing at least one layer of solderable material over the cap cover and the window in the cap cover and forming a solderable layer contacting the contact pads of the electrically conductive structures;
- structuring the layer of solderable material applied in the vapor-depositing step; and
- forming individual solderable layers each contacting a respective contact pad of the electrically conductive structures.
- 2. The method according to claim 1, wherein the electrical component is a SAW component.
- 3. The method according to claim 1, wherein dimensions of the conductive layers are large relative to dimensions of the contact pads of the electrically conductive structures.
- 4. The method according to claim 1, which further comprises introducing bumps coming into contact with the solderable layers into the windows in the cap cover.
- 5. The method according to claim 1, which comprises vapor depositing over an entire surface of the cap cover and the window, and utilizing the cover as a mask such that the vapor-deposited layer on the conductive layers is not conductively connected to vapor-deposited layer on the cap cover.
- 6. A method of producing contacts of an electrical component which are suitable for flip-chip mounting, wherein the electrical component has electrically conductive structures on a substrate tightly encapsulated with a cap cover and the cap cover is formed with a window in which terminal pads of the electrically conductive structures are disposed, the method which comprises:
- providing a mask and vapor-depositing electrically conductive layers on the terminal pads of the electrically conductive structures through the mask.
- 7. The method according to claim 6, wherein the electrical component is a SAW component.
- 8. The method according to claim 6, wherein dimensions of the conductive layers are large relative to dimensions of the contact pads of the electrically conductive structures.
- 9. The method according to claim 6, which further comprises introducing bumps coming into contact with the solderable layers into the windows in the cap cover.
- 10. The method according to claim 6, which comprises vapor depositing over an entire surface of the cap cover and the window, and utilizing the cover as a mask such that the vapor-deposited layer on the conductive layers is not conductively connected to vapor-deposited layer on the cap cover.
CROSS-REFERENCE TO RELATED APPLICATION
This is a continuation of international application PCT/DE96/02412, filed Dec. 16, 1996, which designated the United States, now abandoned.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
4737742 |
Takoshima et al. |
Apr 1988 |
|
5172212 |
Baba |
Dec 1992 |
|
5329068 |
Hirata et al. |
Jul 1994 |
|
Foreign Referenced Citations (3)
Number |
Date |
Country |
0590780A1 |
Apr 1994 |
EPX |
0645807A1 |
Mar 1995 |
EPX |
4302171A1 |
Jul 1994 |
DEX |
Non-Patent Literature Citations (1)
Entry |
Japanese Patent Abstract No. 58047433 (Masanori), dated Sep. 29, 1984. |
Continuations (1)
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Number |
Date |
Country |
Parent |
PCTDE9602412 |
Dec 1996 |
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