Number | Date | Country | Kind |
---|---|---|---|
11-182726 | Jun 1999 | JP |
Number | Name | Date | Kind |
---|---|---|---|
5572160 | Wadell | Nov 1996 | A |
5798649 | Smayling et al. | Aug 1998 | A |
5944847 | Sanada | Aug 1999 | A |
6139618 | Hayashi et al. | Oct 2000 | A |
6240372 | Gross et al. | May 2001 | B1 |
Number | Date | Country |
---|---|---|
09-33604 | Feb 1997 | JP |
09-211088 | Aug 1997 | JP |
10-301843 | Nov 1998 | JP |
11-2663 | Jan 1999 | JP |
11-94917 | Apr 1999 | JP |
Entry |
---|
Herbert H. Guttler and Jurgen H. Werner, Influence of barrier inhomogeneties on noise at Schottky contacts Nov. 13, 1989, American Institute of Physics, Appl. Phys. Lett., vol. 56, No. 12, pp. 1113-1115.* |
K. Sakaguchi, “Fault Diagnosis of IC based on Analyzing the Power Spectrum of a Supply Current”, Proceedings of the 198 IEICE General Conference C-12-8, pp. 99. |
M. Serra, “Digital IC Testing”, Digital Devices Testing, pp. 1808-1816. |