Testing of integrated circuits [IC]

Industry

CPC
G01R31/2851

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2851Testing of integrated circuits [IC]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of generating device model and computing device performing t...
- Patent number 12,222,386
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Gwangnae Gil
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device and method for inspecting semicondu...
- Patent number 12,196,802
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan test in a single-wire bus circuit
- Patent number 12,092,689
- Issue date Sep 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus to identify faults in processors
- Patent number 12,085,610
- Issue date Sep 10, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement and method for testing an integrated circuit
- Patent number 12,085,607
- Issue date Sep 10, 2024
- Infineon Technologies AG
- Alessio Ciarcia
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit package with current sense element
- Patent number 12,066,459
- Issue date Aug 20, 2024
- Texas Instruments Incorporated
- Robert Allan Neidorff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus, measurement method and computer readable medium
- Patent number 12,055,570
- Issue date Aug 6, 2024
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Flexible input/output (I/O) allocation for integrated circuit scan...
- Patent number 12,032,015
- Issue date Jul 9, 2024
- Amazon Technologies, Inc.
- Ilan Strulovici
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LDO-based odometer to combat ic recycling
- Patent number 12,026,001
- Issue date Jul 2, 2024
- University of Florida Research Foundation, Incorporated
- Domenic J. Forte
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming probe head structure
- Patent number 12,019,097
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment method and device for chip output characteristics
- Patent number 12,002,751
- Issue date Jun 4, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum error-correction in microwave integrated quantum circuits
- Patent number 11,977,113
- Issue date May 7, 2024
- Rigetti & Co, LLC
- William J. Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and test method thereof, and non-transitory co...
- Patent number 11,977,463
- Issue date May 7, 2024
- Kioxia Corporation
- Kunihiko Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and method for diagnosing an integrated circuit
- Patent number 11,953,546
- Issue date Apr 9, 2024
- STMicroelectronics (Alps) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly
- Patent number 11,940,462
- Issue date Mar 26, 2024
- Jong Choen Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transducer built-in self-test
- Patent number 11,913,988
- Issue date Feb 27, 2024
- QUALCOMM Technologies, Inc.
- Michael Carfore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit with on-state diagnosis for driver channels
- Patent number 11,885,845
- Issue date Jan 30, 2024
- STMicroelectronics S.r.l.
- Gaudenzia Bagnati
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device including temperature sensing circuit
- Patent number 11,860,045
- Issue date Jan 2, 2024
- SK Hynix Inc.
- Dahoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Usage metering by bias temperature instability
- Patent number 11,835,572
- Issue date Dec 5, 2023
- International Business Machines Corporation
- Effendi Leobandung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip oscilloscope
- Patent number 11,835,551
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Single-event transient (SET) pulse measuring circuit capable of eli...
- Patent number 11,828,788
- Issue date Nov 28, 2023
- NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
- Bin Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixing device and fixing method for fixing chip in two orthogonal d...
- Patent number 11,815,546
- Issue date Nov 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Power profiling in an integrated circuit having a current sensing c...
- Patent number 11,808,804
- Issue date Nov 7, 2023
- NXP USA, INC.
- Antonio Mauricio Brochi
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and semiconductor device
- Patent number 11,789,061
- Issue date Oct 17, 2023
- Fuji Electric Co., Ltd.
- Isao Saito
- G01 - MEASURING TESTING
Information Patent Grant
Probe card integrated with a hall sensor
- Patent number 11,761,983
- Issue date Sep 19, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Guoquan Teo
- G01 - MEASURING TESTING
Information Patent Grant
Determining electronic component authenticity via electronic signal...
- Patent number 11,734,409
- Issue date Aug 22, 2023
- University of South Florida
- Yunghsiao Chung
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT
- Publication number 20250060407
- Publication date Feb 20, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Jhih-Hong CHENG
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT
- Publication number 20240369598
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Robert Allan NEIDORFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369616
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369617
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS
- Publication number 20240345160
- Publication date Oct 17, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT
- Publication number 20240345162
- Publication date Oct 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE UNDER TEST (DUT) STRUCTURES IN FILL REGIONS OF PRODUCT DIE F...
- Publication number 20240329114
- Publication date Oct 3, 2024
- Intel Corporation
- Sairam Subramanian
- G01 - MEASURING TESTING
Information Patent Application
TEST AID UNITS
- Publication number 20240329116
- Publication date Oct 3, 2024
- SK HYNIX INC.
- Deog Kyoon JEONG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONFIGURING A FAULT-SENSING RING OSCILLATOR CIRCUIT
- Publication number 20240329115
- Publication date Oct 3, 2024
- International Business Machines Corporation
- PAWEL OWCZARCZYK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROBE HEAD STRUCTURE
- Publication number 20240302410
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE OPERATION BASED ON DEVICE CHARACTERISTICS
- Publication number 20240255567
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Jihye Gale Shin
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF SECURITY SYSTEMS IN INTEGRATED CIRCUITS
- Publication number 20240160745
- Publication date May 16, 2024
- NXP B.V.
- Neha Srivastava
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING ELECTRONIC COMPONENT AUTHENTICITY VIA ELECTRONIC SIGNAL...
- Publication number 20240126864
- Publication date Apr 18, 2024
- University of South Florida
- Yunghsiao CHUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD
- Publication number 20240125881
- Publication date Apr 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Nico RIEDMANN
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR TESTING A CIRCUIT
- Publication number 20240103066
- Publication date Mar 28, 2024
- INFINEON TECHNOLOGIES AG
- Alessio CIARCIA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST ARRANGEMENT AND METHOD FOR TESTING AN INTEGRATED CIRCUIT
- Publication number 20240085471
- Publication date Mar 14, 2024
- INFINEON TECHNOLOGIES AG
- Alessio CIARCIA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DIAGNOSIS WITH DYNAMIC ROOT CAUSE DETECTION
- Publication number 20240070371
- Publication date Feb 29, 2024
- Siemens Industry Software Inc.
- Xiaoyuan Qi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
- Publication number 20240053391
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING SURFACE TRAP LEVEL CONSIDERING OXIDE THICKNES...
- Publication number 20240044970
- Publication date Feb 8, 2024
- University of Ulsan Foundation for Industry Cooperation
- Tae Woo KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO...
- Publication number 20230417824
- Publication date Dec 28, 2023
- YIK Corporation
- Yong Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST LOGIC METHOD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20230384363
- Publication date Nov 30, 2023
- EM Microelectronic-Marin SA
- Ovidiu SIMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR DETERMINING DETERIORATION OF SE...
- Publication number 20230369142
- Publication date Nov 16, 2023
- Fuji Electric Co., Ltd.
- Motohito HORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...
- Publication number 20230341447
- Publication date Oct 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT CALIBRATION SYSTEMS
- Publication number 20230333192
- Publication date Oct 19, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Perumal
- G01 - MEASURING TESTING
Information Patent Application
ANOMALY DETECTION AND PROTECTION
- Publication number 20230288470
- Publication date Sep 14, 2023
- ZERO-ERROR SYSTEMS PTE. LTD.
- Joseph Sylvester CHANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ON-STATE DIAGNOSIS FOR DRIVER CHANNELS
- Publication number 20230266382
- Publication date Aug 24, 2023
- STMicroelectronics S.r.l.
- Gaudenzia BAGNATI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS
- Publication number 20230266381
- Publication date Aug 24, 2023
- STMicroelectronics S.r.l.
- Gaudenzia BAGNATI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER
- Publication number 20230266387
- Publication date Aug 24, 2023
- STMicroelectronics International N.V.
- Rupesh SINGH
- G01 - MEASURING TESTING

Testing of integrated circuits [IC]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of generating device model and computing device performing t...

Semiconductor inspection device and method for inspecting semicondu...

Apparatus for testing electronic devices

Interface to full and reduced pin JTAG devices

Scan test in a single-wire bus circuit

Methods and apparatus to identify faults in processors

Test arrangement and method for testing an integrated circuit

Integrated circuit package with current sense element

Measurement apparatus, measurement method and computer readable medium

Flexible input/output (I/O) allocation for integrated circuit scan...

LDO-based odometer to combat ic recycling

Method for forming probe head structure

Adjustment method and device for chip output characteristics

Quantum error-correction in microwave integrated quantum circuits

Semiconductor device and test method thereof, and non-transitory co...

Integrated circuit and method for diagnosing an integrated circuit

Test socket assembly

Transducer built-in self-test

Integrated circuit with on-state diagnosis for driver channels

Apparatus for testing electronic devices

Semiconductor device including temperature sensing circuit

Usage metering by bias temperature instability

On-chip oscilloscope

Single-event transient (SET) pulse measuring circuit capable of eli...

Fixing device and fixing method for fixing chip in two orthogonal d...

Power profiling in an integrated circuit having a current sensing c...

Parameter space reduction for device testing

Integrated circuit and semiconductor device

Probe card integrated with a hall sensor

Determining electronic component authenticity via electronic signal...

Patents Applicationslast 30 patents

TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

INTEGRATED CIRCUIT PACKAGE WITH CURRENT SENSE ELEMENT

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

METHODS AND APPARATUS TO IDENTIFY FAULTS IN PROCESSORS

SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT

DEVICE UNDER TEST (DUT) STRUCTURES IN FILL REGIONS OF PRODUCT DIE F...

TEST AID UNITS

CONFIGURING A FAULT-SENSING RING OSCILLATOR CIRCUIT

PROBE HEAD STRUCTURE

MEMORY DEVICE OPERATION BASED ON DEVICE CHARACTERISTICS

TESTING OF SECURITY SYSTEMS IN INTEGRATED CIRCUITS

DETERMINING ELECTRONIC COMPONENT AUTHENTICITY VIA ELECTRONIC SIGNAL...

POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD

CIRCUIT AND METHOD FOR TESTING A CIRCUIT

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST ARRANGEMENT AND METHOD FOR TESTING AN INTEGRATED CIRCUIT

DEFECT DIAGNOSIS WITH DYNAMIC ROOT CAUSE DETECTION

APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF

METHOD FOR EXTRACTING SURFACE TRAP LEVEL CONSIDERING OXIDE THICKNES...

SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO...

TEST LOGIC METHOD FOR AN INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR DETERMINING DETERIORATION OF SE...

METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...

CIRCUIT CALIBRATION SYSTEMS

ANOMALY DETECTION AND PROTECTION

INTEGRATED CIRCUIT WITH ON-STATE DIAGNOSIS FOR DRIVER CHANNELS

INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS

LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER