Number | Name | Date | Kind |
---|---|---|---|
5079725 | Geer et al. | Jan 1992 | |
5155732 | Jarwala et al. | Oct 1992 | |
5173904 | Daniels et al. | Dec 1992 | |
5185745 | Marca, Jr. | Feb 1993 |
Entry |
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Fluke and Phillips Corporations, "The ABCs of Boundary-Scan Test", pp. 8-25. |
Texas Instruments Corporation, "Scope System Controllability/Observability Partitioning Environment", Oct. 1992, pp. 1-15. |