Claims
- 1. A method for inferring an optical parameter in a predictive spectral range outside of a measurement spectral range, comprising:a) obtaining “measured” values of said optical parameter in said measurement spectral range from 190 nm to 1000 nm at a wavelength resolution of about 1 nm; b) constructing an analytical expression for describing said optical parameter by use of a theoretical function, such that said analytical expression yields said “measured” values of said optical parameter in said measurement spectral range; and c) using said analytical expression to infer said optical parameter in said predictive spectral range.
- 2. The method of claim 1, wherein said optical parameter is an index of refraction of said sample.
- 3. The method of claim 2, wherein said step of obtaining is carried out by way of the “n&k” method.
- 4. The method of claim 2, wherein said theoretical function comprises the Forouhi-Bloomer dispersion equation for index of refraction.
- 5. The method of claim 2, wherein said predictive spectral range is above 1000 nm in wavelength.
- 6. The method of claim 5, wherein said index of refraction is used to determine a dielectric constant of said sample.
- 7. The method of claim 1, wherein said optical parameter is an extinction coefficient of said sample.
- 8. The method of claim 7, wherein said step of obtaining is carried out by way of the “n&k” method.
- 9. The method of claim 7, wherein said theoretical function comprises the Forouhi-Bloomer dispersion equation for extinction coefficient.
- 10. The method of claim 1, wherein said predictive spectral range is less than 190 nm in wavelength.
- 11. The method of claim 1, wherein said predictive spectral range is greater than 1000 nm in wavelength.
- 12. A method of using the n&k method for inferring an optical parameter in a predictive spectral range outside of a measurement spectral range, comprising:(a) obtaining “measured” values of said optical parameter in said measurement spectral range from 190 nm to 1000 nm at a wavelength resolution of about 1 nm; (b) constructing an analytical expression for describing said optical parameter by use of a theoretical function, such that said analytical expression yields said “measured” values of said optical parameter in said measurement spectral range; and (c) using said analytical expression to infer said optical parameter in said predictive spectral range.
- 13. The method of claim 12, wherein said optical parameter is an index of refraction of said sample.
- 14. The method of claim 13, wherein said predictive spectral range is above 1000 nm in wavelength.
- 15. The method of claim 14, wherein said index of refraction is used to determine a dielectric constant of said sample.
- 16. The method of claim 12, wherein said optical parameter is an extinction coefficient of said sample.
- 17. The method of claim 12, wherein said predictive spectral range is less than 190 nm in wavelength.
- 18. The method of claim 12, wherein said predictive spectral range is greater than 1000 nm in wavelength.
CROSS-REFERENCE TO RELATED APPLICATIONS
This application is cross-referenced to and claims priority from U.S. Provisional application 60/232,667 filed Sep. 14, 2000, which is hereby incorporated by reference.
US Referenced Citations (9)
Non-Patent Literature Citations (1)
Entry |
Lide, David R. (Editor), CRC Handbook of Chemistry and Physics, 1993, CRC press, 74th edition, (12) 109-113. |
Provisional Applications (1)
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Number |
Date |
Country |
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60/232667 |
Sep 2000 |
US |