N&K Technology. Inc.

Organization

Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Three dimensional characterization of silicon wafer Vias from combi...
- Patent number 9,513,112
- Issue date Dec 6, 2016
- n&k Technology, Inc.
- Christopher Rush
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for phase-compensated sensitivity-enhanced spe...
- Patent number 8,125,641
- Issue date Feb 28, 2012
- n&k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Combined transmittance and angle selective scattering measurement o...
- Patent number 7,999,936
- Issue date Aug 16, 2011
- n&k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Automated spatial flipping apparatus and system for photomasks and...
- Patent number 7,962,242
- Issue date Jun 14, 2011
- n&k Technology Inc.
- Marc T. Aho
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Implementation of rigorous coupled wave analysis having improved ef...
- Patent number 7,756,677
- Issue date Jul 13, 2010
- n&k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Broadband optical metrology with reduced wave front distortion, chr...
- Patent number 7,755,775
- Issue date Jul 13, 2010
- n&k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Compact multiple diameters wafer handling system with on-chuck wafe...
- Patent number 7,717,661
- Issue date May 18, 2010
- n&k Technology, Inc.
- Marc T. Aho
- G01 - MEASURING TESTING
Information Patent Grant
System and method for optical photomask inspection through pellicle
- Patent number 7,679,736
- Issue date Mar 16, 2010
- n&k Technology, Inc.
- Marc T. Aho
- G01 - MEASURING TESTING
Information Patent Grant
Disc clamping device for multiple standard discs
- Patent number 7,616,301
- Issue date Nov 10, 2009
- n&k Technology, Inc.
- Marc Aho
- G11 - INFORMATION STORAGE
Information Patent Grant
Efficient characterization of symmetrically illuminated symmetric 2...
- Patent number 7,525,672
- Issue date Apr 28, 2009
- n&k Technology, Inc.
- Shuqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Efficient calculation of grating matrix elements for 2-D diffraction
- Patent number 7,505,147
- Issue date Mar 17, 2009
- n&k Technology, Inc.
- Shuqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for examining a disk-shaped sample on an X-Y-t...
- Patent number 7,397,554
- Issue date Jul 8, 2008
- n&k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Integrated local and global optical metrology for samples having mi...
- Patent number 7,397,030
- Issue date Jul 8, 2008
- n&k Technology, Inc.
- Mehdi Balooch
- G01 - MEASURING TESTING
Information Patent Grant
System and method for efficient characterization of diffracting str...
- Patent number 7,391,524
- Issue date Jun 24, 2008
- n&k Technology, Inc.
- Shuqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high intensity small spot optical metrology
- Patent number 7,349,103
- Issue date Mar 25, 2008
- n & k Technology, Inc.
- Mehdi Balooch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometric system with reduced angle of incidence
- Patent number 7,330,256
- Issue date Feb 12, 2008
- n & k Technology, Inc.
- Marc Aho
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optical characterization of a sample over...
- Patent number 7,327,457
- Issue date Feb 5, 2008
- n & k Technology, Inc.
- Ray Hebert
- G02 - OPTICS
Information Patent Grant
Photomask flipper and single direction inspection device for dual s...
- Patent number 7,290,978
- Issue date Nov 6, 2007
- N&K Technology. Inc.
- Daniel Tran
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring overlay alignment using diffraction...
- Patent number 7,289,214
- Issue date Oct 30, 2007
- n & k Technology, Inc.
- Guoguang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase shift measurement using transmittance spectra
- Patent number 7,253,909
- Issue date Aug 7, 2007
- n & k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optical characterization of a sample over...
- Patent number 7,248,364
- Issue date Jul 24, 2007
- n & k Technology, Inc.
- Ray Hebert
- G02 - OPTICS
Information Patent Grant
Optical determination of pattern feature parameters using a scalar...
- Patent number 7,212,293
- Issue date May 1, 2007
- n & k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Compact pinlifter assembly integrated in wafer chuck
- Patent number 7,044,476
- Issue date May 16, 2006
- n & k Technology, Inc.
- Daniel Tran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for examining features on semi-transparent and...
- Patent number 6,891,628
- Issue date May 10, 2005
- n & k Technology, Inc.
- Guoguang Li
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented reflectance system and method for non-destruct...
- Patent number 6,825,933
- Issue date Nov 30, 2004
- n & k Technology, Inc.
- Jeff Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Wafer handling robot having X-Y stage for wafer handling and positi...
- Patent number 6,811,370
- Issue date Nov 2, 2004
- n & k Technology, Inc.
- Dale Buermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous compensation of source and detector drift in optical s...
- Patent number 6,765,676
- Issue date Jul 20, 2004
- n & k Technology, Inc.
- Dale Buermann
- G01 - MEASURING TESTING
Information Patent Grant
Method of inferring optical parameters outside of a measurement spe...
- Patent number 6,710,865
- Issue date Mar 23, 2004
- n & k Technology, Inc.
- Abdul Rahim Forouhi
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring thin-film processes and metrology tool thereof
- Patent number 6,594,025
- Issue date Jul 15, 2003
- N&K Technology. Inc.
- Abdul Rahim Forouhi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for docking a floating test stage in a terrestrial base
- Patent number 6,441,607
- Issue date Aug 27, 2002
- n & k Technology, Inc.
- Dale Buermann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
78886151 - LITTLEFOOT
- Serial number 78886151
- Filing date May 17, 2006
- n&k Technology, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75013202 - N&K
- Serial number 75013202
- Registration number 2031862
- Filing date Nov 1, 1995
- n&k Technology, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

N&K Technology. Inc.

Organization

Patents Grantslast 30 patents

Three dimensional characterization of silicon wafer Vias from combi...

Method and apparatus for phase-compensated sensitivity-enhanced spe...

Combined transmittance and angle selective scattering measurement o...

Automated spatial flipping apparatus and system for photomasks and...

Implementation of rigorous coupled wave analysis having improved ef...

Broadband optical metrology with reduced wave front distortion, chr...

Compact multiple diameters wafer handling system with on-chuck wafe...

System and method for optical photomask inspection through pellicle

Disc clamping device for multiple standard discs

Efficient characterization of symmetrically illuminated symmetric 2...

Efficient calculation of grating matrix elements for 2-D diffraction

Apparatus and method for examining a disk-shaped sample on an X-Y-t...

Integrated local and global optical metrology for samples having mi...

System and method for efficient characterization of diffracting str...

System and method for high intensity small spot optical metrology

Spectrophotometric system with reduced angle of incidence

Apparatus and method for optical characterization of a sample over...

Photomask flipper and single direction inspection device for dual s...

System and method for measuring overlay alignment using diffraction...

Phase shift measurement using transmittance spectra

Apparatus and method for optical characterization of a sample over...

Optical determination of pattern feature parameters using a scalar...

Compact pinlifter assembly integrated in wafer chuck

Method and apparatus for examining features on semi-transparent and...

Computer-implemented reflectance system and method for non-destruct...

Wafer handling robot having X-Y stage for wafer handling and positi...

Simultaneous compensation of source and detector drift in optical s...

Method of inferring optical parameters outside of a measurement spe...

Method of monitoring thin-film processes and metrology tool thereof

Apparatus for docking a floating test stage in a terrestrial base

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

78886151 - LITTLEFOOT

75013202 - N&K