Patent Application
20080274582
The invention relates to a method for producing microcrystalline silicon (μc-Si), particularly (μc-Si:H) p-i-n solar cells as well as stacked solar cells made of amorphous (α-Si:H) and microcrystalline silicon in a p-i-n/p-i-n structure. The invention furthermore relates to a device for carrying out the method.
According to the present state of the art, μc-Si:H solar cells as well as α-Si:H/μc-Si:H solar cells are typically produced in multichamber plasma CVD equipment. The advantage with PECVD (=plasma enhanced chemical vapor deposition) methods of this type is that generally a contamination of the intrinsic absorber layer (i-layer) as a result of boron carry-over from the reactor walls and the electrode surface of the previously produced p-layer is avoided. The disadvantage is that the multichamber processes are time-consuming and therefore cost-intensive.
While in principle the production with single-chamber processes is possible, so far generally these have been conducted only with complex methods, for example with a plasma treatment or the intermediate outward transfer of the substrates to be coated. These production methods have therefore so far been little suited for an industrial production environment.
Single-chamber processes that are able to forego these complex methods have been long known for the production of amorphous solar cells [1]. In contrast, for the production of μc-Si:H solar cells very high hydrogen dilution rates are required, which however turned out to be particularly critical in terms of the carry-over problem. H2 plasmas are generally very reactive and have caustic properties [2].
The production of a μc-Si:H solar cell using the single-chamber process was introduced in 2003 at the “3rd World Conference on Photovoltaic Energy Conversion” in Osaka, Japan. There it was revealed that in a commercial single-chamber reactor, which was used until then for the production of α-Si:H solar cell modules, now μc-Si:H solar cells were being produced with the single-chamber method [3]. Process parameters that were mentioned included the use of an SnO2 substrate, HF-PECVD deposition at 13.56 MHz and hydrosilicon that was highly diluted with hydrogen as the reaction gas. An electrode measuring 12″×15″ was used for the simultaneous coating of four substrates, measuring 12″×15″ respectively. As a result of the simultaneous coating, the very slow growth rate for μc-silicon was advantageously compensated. The substrate temperature was 200° C. For testing the quality of the produced layers, luminous flux voltage curves (I-V), dark current voltage curves (I-V) and the spectral response (QE) were measured. On a surface of about 0.146 cm2 an efficiency of about 5% was achieved. The origin that was mentioned for the extreme non-homogeneity was an insufficient gas distribution when using high HF output.
The present state of the art for μc-Si:H solar cells, as they can currently be produced with multichamber processes, however cannot be achieved by far with the afore-mentioned single-chamber processes in terms of efficiency and homogeneity.
It is the object of the invention to provide a simple, cost-efficient method that is suitable for industrial applications, particularly for the production of solar cells with μc-Si:H layers. Additionally it is the object of the invention to create a device that is suitable for carrying out the afore-mentioned method.
The objects of the invention are attained with a method that has all the characteristics of the main claim as well as with a device that has all the characteristics of the additional independent claim. Advantageous embodiments of the method and the device are disclosed in the claims relating to them.
The method according to the invention for producing μc-Si:H and also α-Si:H/μc-Si:H for solar cells entirely in a single-chamber process produces particularly large-surface homogeneous depositions, which are reflected in significantly higher efficiency rates that those achieved until now with single-chamber processes. The method furthermore overcomes the problem of the disadvantageous boron contamination in the intrinsic μc-silicon layers.
It was demonstrated that through PECVD at 13.56 MHz μc-Si:H can be produced homogeneously on surfaces measuring up to 30×30 cm2 and that as a result high efficiency rates can be achieved in thin-film solar arrays. The deposition regime is characterized by the use of a high deposition pressure and high HF output levels. This combination produces high deposition rates, which achieve good material quality at the same time.
The single-chamber method according to the invention is based on this process. The method for producing homogeneous μc-silicon layers on a substrate, particularly the i- and p-layers for a solar cell with the help of plasma CVD at 13.56 MHz, is carried out in a deposition regime, which can be characterized by the process parameters outlined below. Additionally a process window range is listed, which according to present knowledge is considered particularly suited. This process window, however, can be expanded by using higher frequencies for the deposition. In this event, the process window would optionally expand towards lower pressure levels and greater hydrosilicon concentrations.
Process Parameters for the μc-Si:H Absorber Layer (i-Layer):
Process Parameters for the μc-Si:H p-Layer:
Analogous to the i-layer, the μ-Si:H p-layer is produced in a deposition regime using a high deposition pressure and high HF output. In comparison with the i-layer, the hydrosilicon concentration is set to a higher level and has, for example 0.004 sccm/cm2 SiH4 (0.04 slm/m2) and 1.43 sccm/cm2H2 (14.3 slm/m2).
In the method according to the invention, typically a plasma excitation frequency of 13.56 MHz is used, however also other, particularly higher, excitation frequency levels, for example 27 or 40.5 Hz (n-multiple of 13.56 Hz), are possible.
Optionally, also buffer layers can be applied when producing solar cells with microcrystalline silicon layers. The use of a buffer layer with a high H2 dilution on the p/i interface advantageously further reduces the carry-over problem.
Process Parameters for an Optional μc-Si:H Buffer Layer:
A suitable μc-Si:H buffer layer, just like the μc-Si:H p-layer and i-layer, can be produced with a deposition regime using a high deposition pressure and high HF output. The hydrosilicon concentration and/or the hydrosilicon flow is set as high as for the μc-Si:H p-layer, however the buffer layer is deposited intrinsically, meaning without the addition of doping gas.
The effectiveness of a solar cell is generally greater the more defined the transition is from the p-layer to the i-layer, i.e. the area in which the recombination takes place. Typically, during the deposition of the i-layer on a highly doped p-layer carry-over occurs, during which boron is introduced in the i-layer. It has proven also to be advantageous if initially a slightly doped buffer layer of 5 to 100 nm with only low boron doping in the range of 1*1017 to 1*1019 atoms/cm3 is applied on the highly doped p-layer and only then the i-layer is deposited thereon. As a result, boron carry-over is advantageously considerably lower, and the produced layer sequence can generally be reproduced.
The device suitable for carrying out the method according to the invention comprises in addition to a conventional PECVD apparatus an optimized showerhead electrode, which is responsible for homogeneous gas distribution and supply as well as for feeding the HF output. With this, particularly large-surface homogeneous coatings are possible. The distribution stages are set to the conductance values to the deposition regime.
The object of the invention will be explained in more detail hereinafter with reference to the figures and exemplary embodiments, without limiting the object of the invention.
Using the single-chamber method according to the invention, μc-Si:H solar cell modules with efficiencies of up to 7.7% with an aperture surface (effectively used surface) of 64 cm2 and α-Si:H/μc-Si:H modules with efficiencies of up to 10.6% with an aperture surface of likewise 64 cm2 were produced. These values correspond to the state of the art as mentioned for known multichamber processes. The process parameters for the single-chamber process according to the invention are listed in the table. The substrate used was textured ZnO. The deposition rate was about 30 nm/min.
The layer thickness of the Si-layers was less than 2 mm. The contact that was used was ZnO/Ag. In order to verify the output of the solar cells that was produced, a standard measurement (STC) was carried out (AM 1.5, 100 mW/cm2, 25° C.). To this end, the single-chamber method according to the invention is particularly suited for producing solar cells for larger surfaces also on an industrial scale. Increasing the scale of the method to surfaces measuring 1×1 m or even greater therefore typically does not present a problem.
In the drawing:
An additional buffer layer on the critical p/i interface, combined with the afore-mentioned deposition regime, during the production of μc-Si:H solar cells using a single-chamber process generally likewise produces high efficiency levels and moreover offers the advantage that the properties can be adjusted such that they can be regularly reproduced. Furthermore it was found that with this deposition regime the n/p transition during the production of α-Si:H/μc-Si:H solar cells can also be produced in a higher quality. The amorphous solar cells within the α-/Si:H/μc-Si:H solar cells can also be produced by using a buffer layer on the p/i interface.
| Number | Date | Country | Kind |
|---|---|---|---|
| 10 2004 003 761.2 | Jan 2004 | DE | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/DE2004/002752 | 12/16/2004 | WO | 00 | 7/21/2008 |
