1. Field of the Invention
The invention relates to a method of manufacturing a flash memory device.
2. Related Technology
In flash memory devices, space between gate patterns for cells is narrowed as the level of integration increases. Thus, interference capacitance between the gate patterns for cells increases, and cell Vt shift becomes profound by the influence of charging from neighboring cells.
The invention is directed to a method of manufacturing a flash memory device, wherein electrical characteristics of devices can be improved and the level of integration of devices increased by decreasing interference capacitance between gate patterns for cells.
In one embodiment, a method of manufacturing a flash memory device includes the steps of forming gate patterns for cells and gate patterns for select transistors over a semiconductor substrate, forming a buffer insulating layer on the resulting surface including the gate patterns, forming an insulating layer to form void in spaces between the gate patterns for cells, forming a nitride layer on the insulating layer, and forming a spacer on one side of each of the gate patterns for select transistors by a spacer etch process.
In another embodiment, a method of manufacturing a flash memory device includes the steps of forming gate patterns for cells and gate patterns for select transistors over a semiconductor substrate, forming a buffer insulating layer on the resulting surface including the gate patterns, forming an insulating layer to form void in spaces between the gate patterns for cells, etching the insulating layer such that a portion of the insulating layer between the gate patterns for cells remains, and forming a spacer on one side of each of the gate patterns for select transistors.
Specific embodiments according to the invention are described below with reference to the accompanying drawings.
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The insulating layer 109 has a poor gap-fill characteristic. Thus, overhangs occur at the entrance portions having a narrow space as the insulating material is deposited. Consequently, the overhangs are brought in contact with each other to clog the entrance, thus generating the void 400. The insulating layer 109 is preferably formed from a High Density Plasma (HDP) oxide layer or a Tetra Ethyl Ortho Silicate (TEOS) oxide layer. The amount of O2 present in the HDP oxide layer is preferably at least 1.5 times greater than that of SiH4 in order to facilitate the formation of the void 400. Alternatively, the void 400 can be formed using the HDP oxide layer by performing a sputtering process at least once in the middle of the process of depositing the HDP oxide layer so that the entrances can be clogged fast. The HDP oxide layer is preferably formed in a plasma process and is therefore formed in a state where a wafer is maintained in the range of 200° C. to 500° C. in order to minimize damage due to the plasma of the tunnel insulating layer 102 and the dielectric layer 104.
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As described above, in accordance with a method of manufacturing a flash memory device according to the invention, a void is formed between gate patterns for cells. Therefore, interference capacitance between gate patterns for cells can be decreased, thus improving cell Vt shift incurred by charging from neighboring. Accordingly, the level of integration and high function of a flash memory device can be realized.
Furthermore, according to the present invention, a relatively thick spacer formed on one side of each of the gate patterns for select transistors can be formed. It is therefore possible to prevent etch damage to a drain line and a source line at the time of a self-aligned contact process.
The described embodiments of the invention are illustrative and not limiting. Various alternatives and equivalents are possible. Other additions, subtractions, or modifications of the disclosure are intended to fall within the scope of the appended claims.
Number | Date | Country | Kind |
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10-2006-0060493 | Jun 2006 | KR | national |
10-2006-0128669 | Dec 2006 | KR | national |
Number | Name | Date | Kind |
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20060105525 | Kim et al. | May 2006 | A1 |
20070164343 | Matsui et al. | Jul 2007 | A1 |
Number | Date | Country |
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2002-043618 | Feb 2002 | JP |
10-2002-0011500 | Feb 2002 | KR |
10-2002-0064589 | Aug 2002 | KR |
10-2004-0052359 | Jun 2004 | KR |
Number | Date | Country | |
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20080003724 A1 | Jan 2008 | US |