Claims
- 1. A method for routing and placement of connectors in an integrated circuit comprising the steps of:
identifying a plurality of at least three long parallel connectors in an integrated circuit design and fabricating at least a first and a third of said plurality of long parallel connectors on a first metallization layer; and promoting at least a second one of said plurality of long parallel connectors to a different second metallization layer and fabricating it thereon.
- 2. The method of claim 1 wherein the integrated circuit is fabricated utilizing a 0.25 micron or smaller fabrication process.
- 3. The method of claim 1 further comprising the steps of:
initially laying out a design for the integrated circuit utilizing at least one less than a total number of available metallization layers for the layout; reserving at least one metallization layer for promotion of long parallel connectors; and promoting said at least second one of said plurality of long parallel connectors to said at least one reserved metallization layer,
- 4. The method of claim 1 further comprising the step of:
systematically and automatically identifying all parallel connectors in the integrated circuit design exceeding a predetermined length in the integrated circuit design.
- 5. The method of claim 1 further comprising the step of:
systematically and automatically identifying all parallel connectors in the integrated circuit design which are switched more rapidly than a predetermined minimum.
- 6. The method of claim 1 further comprising the step of:
fabricating a via to connect the at least second one of said plurality of long parallel connectors to a component on the first metallization layer.
- 7. The method of claim I wherein the plurality of at least three long parallel connectors are bus connectors for connecting processing elements in a multiprocessor array.
- 8. The method of claim 7 wherein said plurality is at least thirty-two.
- 9. A system for routing and placement of connectors in an integrated circuit comprising:
means for identifying a plurality of at least three long parallel connectors in an integrated circuit design and fabricating at least a first and a third of said plurality of long parallel connectors on a first metallization layer; and means for promoting at least a second one of said plurality of long parallel connectors to a different second metallization layer and fabricating it thereon.
- 10. The system of claim 9 wherein the integrated circuit is fabricated utilizing a 0.25 micron or smaller fabrication process.
- 11. The system of claim 9 further comprising:
means for initially laying out a design for the integrated circuit utilizing at least one less than a total number of available metallization layers for the layout; means for reserving at least one metallization layer for promotion of long parallel connectors; and means for promoting said at least second one of said plurality of long parallel connectors to said at least one reserved metallization layer,
- 12. The system of claim 9 further comprising:
means for systematically and automatically identifying all parallel connectors in the integrated circuit design exceeding a predetermined length in the integrated circuit design.
- 13. The system of claim 9 further comprising:
means for systematically and automatically identifying all parallel connectors in the integrated circuit design which are switched more rapidly than a predetermined minimum.
- 14. The system of claim 9 further comprising:
means for fabricating a via to connect the at least second one of said plurality of long parallel connectors to a component on the first metallization layer.
- 15. The system of claim 9 wherein the plurality of at least three long parallel connectors are bus connectors for connecting processing elements in a multiprocessor array.
- 16. The system of claim 15 wherein said plurality is at least thirty-two.
Parent Case Info
[0001] The present invention claims the benefit of U.S. Provisional Application Serial No. 60/251,072 entitled “Methods And Apparatus for Providing Improved Physical Designs and Routing with Reduced Capacitive Power Dissipation” filed Dec. 4, 2000, which is incorporated by reference herein in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60251072 |
Dec 2000 |
US |