Microscale ion trap mass spectrometer

Information

  • Patent Grant
  • 6469298
  • Patent Number
    6,469,298
  • Date Filed
    Monday, September 20, 1999
    25 years ago
  • Date Issued
    Tuesday, October 22, 2002
    22 years ago
Abstract
An ion trap for mass spectrometric chemical analysis of ions is delineated. The ion trap includes a central electrode having an aperture; a pair of insulators, each having an aperture; a pair of end cap electrodes, each having an aperture; a first electronic signal source coupled to the central electrode; a second electronic signal source coupled to the end cap electrodes. The central electrode, insulators, and end cap electrodes are united in a sandwich construction where their respective apertures are coaxially aligned and symmetric about an axis to form a partially enclosed cavity having an effective radius r0 and an effective length 2z0, wherein r0 and/or z0 are less than 1.0 mm, and a ratio z0/r0 is greater than 0.83.
Description




CROSS REFERENCE TO RELATED APPLICATIONS




(Not Applicable)




BACKGROUND OF THE INVENTION




1. Technical Field




This invention relates to mass spectrometers, and more particularly to a submillimeter ion trap for mass spectrometric chemical analysis.




2. Description of the Related Art




Microfabricated devices for liquid-phase analysis have attracted much interest because of their ability to handle small quantities of sample and reagents, measurement speed and reproducibility, and the possibility of integration of several analytical operations on a monolithic substrate. Although the application of microfabricated devices to vapor-phase analysis was first demonstrated 20 years ago, further application of these devices has not been prolific due primarily to poor performance because of mass transfer issues. However, some low pressure analytical techniques, such as mass spectrometry, should be possible with microfabricated instrumentation. Recent reports of microfabricated electrospray ion sources for mass spectrometry make the possibility of miniature ion trap spectrometers especially attractive.




Ion traps of millimeter size and smaller have been used for storage and isolation of ions for optical spectroscopy, though not for mass spectrometry. The principal requirement for ion trap geometry is the presence of a quadrupole component of the radio frequency (RF) electric field. Conventional ion trap electrode constructions include hyperbolic electrodes, a sandwich of planar electrodes, and a single ring electrode. For more information concerning ion trap mass spectrometry, the three-volume treatise entitled: “Practical Aspects of Ion Trap Mass Spectrometry” by Raymond E. March et al. may be considered, and is incorporated herein by reference.




The smallest known quadrupole ion trap that has been evaluated for mass analysis or for isolation of ions of a narrow mass range was a hyperbolic trap with an r


0


value of 2.5 mm, as reported by R. E. Kaiser et al. in


Int. J. of Mass Spectrometry Ion Processes


106, 79 (1997). One problem with this and other small-scale ion traps used in mass spectrometry is their limited spectral resolution. For instance, existing small-scale ion traps typically do not provide useful mass spectral resolution below 1.0-2.0 AMUs (atomic mass units). Moreover, there is a demand for even smaller ion traps, (i.e., submillimeter with r


0


and/or zvalues less than 1.0 mm), for use in mass spectrometry, though ion traps of this size exacerbate the present limitations in mass spectral resolution.




Thus, there was a need for a submillimeter ion trap with improved spectral resolution in performing mass spectrometry.




SUMMARY OF THE INVENTION




The present invention concerns a submillimeter ion trap for mass spectrometric chemical analysis. In the preferred embodiment, the ion trap is a submillimeter trap having a cavity with: 1) an effective length 2z


0


with z


0


less than 1.0 mm; 2) an effective radius r


0


less than 1.0 mm; and 3) a z


0


/r


0


ratio greater than 0.83. Testing demonstrates that a z


0


/r


0


ratio in this range improves mass spectral resolution from a prior limit of approximately 1.0-2.0 AMUs, down to 0.2 AMUs, the result of which is a smaller ion trap with improved mass spectral resolution. Employing smaller ion traps without sacrificing mass spectral resolution opens a wide variety of new applications for mass spectrometric chemical analysis.




The ion trap comprises: a central electrode having an aperture; a pair of insulators, each having an aperture; a pair of end cap electrodes, each having an aperture; a first electronic signal source coupled to the central electrode; and a second electronic signal source coupled to the end cap electrodes. In the preferred embodiment, the central electrode, insulators, and end cap electrodes are united in a sandwich construction where their respective apertures are coaxially aligned and symmetric about an axis to form a partially enclosed cavity having an effective radius r


0


and an effective length 2z


0


. Moreover, r


0


and/or z


0


are less than 1.0 mm, and the ratio z


0


/r


0


is greater than 0.83.











BRIEF DESCRIPTION OF THE DRAWINGS




There are presently shown in the drawings embodiments which are presently preferred, it being understood, however, that the invention is not limited to the precise arrangements and instrumentalities shown, wherein:





FIG. 1

is an exploded perspective view of an ion trap in accordance with the present invention.





FIG. 2

is system view employing the ion trap of

FIG. 1

to perform mass spectrometric chemical analysis.











DETAILED DESCRIPTION OF THE INVENTION





FIG. 1

illustrates an ion trap


10


manufactured in accordance with the present invention. While ion trap


10


is shown as a cylindrical-type-geometry trap, the present invention may be incorporated into other known ion trap geometries.




A ring electrode


12


is formed by producing a centrally located hole of appropriate diameter in a stainless steel plate. Here, the hole's radius r


0


is 0.5 mm, so the diameter of the drilled hole in ring electrode


12


is 1.0 mm. The thickneess of ring electrode


12


is approximately 0.9 mm.




Planar end caps


14


and


16


comprise either stainless steel sheets or mesh. The end caps


14


and


16


include a centrally located recess of approximately 1.0 mm diameter, with the bottom surface of the recess having a hole of approximately 0.45 mm diameter. End caps


14


and


16


are separated from ring electrode


12


by insulators


18


and


20


, each of which include a centrally located hole of 1.0 mm diameter. Insulators


18


and


20


may comprise Teflon tape with opposing adhesive surfaces.




The holes in the ring electrode


12


, end caps


14


and


16


, and insulators


18


and


20


are produced using conventional machining techniques. However, the holes could be formed using other methods such as wet chemical etching, plasma etching, or laser machining. Moreover, the conductive materials employed for ring electrode


12


, and end caps


14


and


16


could be other than described above. For example, the conductive materials used could be various other metals, or doped semiconductor material. Similarly, Teflon tape need not necessarily be the material of choice for insulators


18


and


20


. Insulators


18


and


20


could be formed of other plastics, ceramics, or glasses including thin films of such materials on the conductive materials.




The centrally located holes in ring electrode


12


, end caps


14


and


16


, and insulators


18


and


20


are preferably coaxially and symmetrically aligned about a vertical axis (not shown), to permit laser access and ion ejection. When assembled into a sandwich construction, the interior surfaces of ion trap


10


form a generally tubular shape, and bound a partially enclosed cavity with a corresponding cylindrical shape.




The distance between lower surface


22


of upper end cap


14


and upper surface


24


of lower end cap


16


is 2z


0


, where z


0


is 0.5 mm. As previously mentioned, r


0


is approximately 0.5 mm. Thus, the ratio z


0


/r


0


is 1.0, which falls within a desired range which produces improved mass spectral resolution for ion trap


10


during mass spectrometry. A z


0


/r


0


ratio range which is greater than 0.83 is desirable, as testing shows it provides mass spectral resolution down to 0.2 AMUs, achieving a significant improvement over the art.




In the preferred embodiment, ion trap


10


is a submillimeter trap having a cavity with: 1) an effective length 2z


0


with z


0


less than 1.0 mm; 2) an effective radius r


0


less than 1.0 mm; and 3) a z


0


/r


0


ratio greater than 0.83. However, those with skill in the art will appreciate that a z


0


and/or an r


0


greater than or equal to 1.0 mm could be employed while maintaining a z


0


/r


0


ratio greater than 0.83. Similarly, those with skill in the art appreciate that various other changes may be made to ion trap


10


, such as substituting different conductive materials for ring electrode


12


and end caps


14


and


16


. Additionally, the cavity in ion trap


10


need not necessarily be centrally located.





FIG. 2

illustrates a system


26


, which includes ion trap


10


, for performing mass spectrometry. Ion trap


10


is conventionally mounted in a vacuum chamber


28


with a Channeltron electron multiplier detector


34


, manufactured by the Galileo Corp. of Sturbridge, Mass. Detector


34


is located near the central axis of ion trap


10


to detect the generated ions. A Nd:YAG laser source


30


produces a pulsed 266-nm harmonic (˜1 mJ/pulse, ˜5 ns duration, 10 Hz repetition rate) beam focussed by a 250 mm lens


32


through a window in vacuum chamber


28


to generate ions within ion trap


10


. Laser source


30


is a DCR laser made by Quanta Ray Corp. of Mountain View, Calif. A beam stop (not shown) made from copper tubing is placed near detector


34


to intercept laser light emerging from ion trap


10


to minimize ion generation and photoelectron emission external to trap


10


itself. Helium buffer gas at nominally 10


−3


Torr and a sample vapor may be introduced into the vacuum chamber


28


through needle valves (not shown). Ion trap


10


is operated in the mass-selective instability mode, with or without a supplementary dipole field for resonant enhancement of the ejection process.




To provide the radio frequency (RF) signal for ring electrode


12


, a conventional computer


36


provides control signals to amplitude modulator


38


, a DC345 device manufactured by Stanford Research Systems of Sunnyvale, Calif. A conventional frequency generator


40


, implemented with a DC345 device manufactured by Stanford Research Systems, receives signals from amplitude modulator


38


, and outputs the desired trapping voltage and ramp for mass scanning. The output signal from frequency generator


40


is then amplified by a 150 W power amplifier


42


, the 150A100A amplifier manufactured by Amplifier Research of Souderton, Pa., and is applied to ring electrode


12


.




When axial modulation is desired, a supplementary voltage from frequency generator


44


, a DC345 device manufactured by Stanford Research Systems, may be applied to end caps


14


and


16


. The output of frequency generator


44


is delivered to a conventional RF amplifier phase inverter


46


before delivery to end caps


14


and


16


. Alternatively, end caps


14


and


16


are grounded. The Channeltron detector's bias voltage, up to 1700 V, is supplied by DC power supply


48


, the BHK-2000-0


1


MG manufactured by Kepco Corp. of Flushing, N.Y. DC power supply


48


may be programmed so that the detector's bias voltage is reduced during the laser pulse to avoid detector preamplifier overload.




The output from detector


34


is amplified by current-to-voltage preamplifier


52


, an SR570 manufactured by Stanford Research Systems, with a gain of 50-200 nA V-


−1


and stored on digital oscilloscope


50


, a TDS 420A manufactured by Tektronix Corp. of Wilsonville, Oreg.




The ion trap


10


described above was machined using conventional materials and methods, and may be produced with any suitable material and method of manufacture. Moreover, those skilled in the art understand that ion trap


10


may be manufactured into versions that could be integrated with other microscale instrumentation.




As described above, ions are generated with ion trap


10


by employing a laser ionization source


30


; however, in an alternative embodiment, electron impact (EI) ionization may be employed. An El source can generate ions from atomic or molecular species that are difficult to ionize with laser pulses.




When employing an EI source, it is preferably located within the vacuum chamber


28


, which houses ion trap


10


. This permits the EI source, ion trap


10


, and detector


34


to be self-contained, and therefore, much smaller in overall size than when the external pulsed laser


30


is used. Employing this self-contained arrangement minimizes mass spectrometer size. The size of the ion trap


10


and the associated sampling and detecting components are compatible with micromachining capabilities.




Moreover, those skilled in the art appreciate that any ion production method that works with a laboratory instrument could be used with ion trap


10


. For example, electrospray ionization or matrix-assisted laser desorption/ionization (MALDI) could be used most notably for large molecules such as biomolecules. Chemical ionization and other forms of charge exchange are also suitable methods of sample ionization.




Additionally, the interior surface of ion trap


10


has been described as having a generally tubular shape, and bounding a partially enclosed cavity with a corresponding cylindrical shape. However, those skilled in the art understand that other conventional ion trap geometries could be employed while maintaining a submillimeter ion trap, as described, namely one having a z


0


/r


0


ratio greater than 0.83. In instances where other than cylindrical geometry is employed for ion trap


10


, an average effective r


0


could be used for z


0


/r


0


determination. Similarly, for various other ion trap geometries, an average effective length 2z


0


could be employed for ratio determination.




While the foregoing specification illustrates and describes the preferred embodiments of this invention, it is to be understood that the invention is not limited to the precise construction herein disclosed. The invention can be embodied in other specific forms without departing from the spirit or essential attributes. Accordingly, reference should be made to the following claims, rather than to the foregoing specification, as indicating the scope of the invention.



Claims
  • 1. An ion trap mass spectrometer for chemical analysis, comprising:a) a central electrode having an aperture; b) a pair of insulators, each having an aperture; c) a pair of end cap electrodes, each having an aperture; d) a first electronic signal source coupled to the central electrode; and e) a second electronic signal source coupled to the end cap electrodes; f) said central electrode, insulators, and end cap electrodes being united in a sandwich construction where their respective apertures are coaxially aligned and symmetric about an axis to form a partially enclosed cavity having an effective radius r0 and an effective length 2z0, wherein at least one of r0 and z0 are less than 1.0 mm, and a ratio z0/r0 is greater than 0.83.
  • 2. The ion trap of claim 1 wherein the central electrode is annular.
  • 3. The ion trap of claim 1 wherein the cavity is cylindrical in shape.
  • 4. The ion trap of claim 1 wherein the effective length 2z0 comprises the distance between opposing interior surfaces of the end cap electrodes.
  • 5. The ion trap of claim 1 wherein r0 and z0 are both less than 1.0 mm.
  • 6. The ion trap of claim 1 wherein the ionization source comprises a laser beam source.
  • 7. The ion trap of claim 1 wherein the ionization source comprises an electron impact (EI) ionization source.
  • 8. The ion trap of claim 1 wherein the central electrode is manufactured using a doped semiconductor material.
  • 9. The ion trap of claim 1 wherein the end cap electrodes are manufactured using a doped semiconductor material.
  • 10. The ion trap of claim 1 wherein the insulators are manufactured using a film of one of a plastic, a ceramic, and a glass.
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT

This invention was made with government support under contract DE-AC05-96OR22464, awarded by the United States Department of Energy to Lockheed Martin Energy Research Corporation, and the United States Government has certain rights in this invention.

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5386115 Freidhoff et al. Jan 1995 A
6087658 Kawato Jul 2000 A
Foreign Referenced Citations (2)
Number Date Country
0336990 Oct 1989 EP
0383961 Aug 1990 EP
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