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5496759 | Yue et al. | Mar 1996 | A |
5748519 | Tehrani | May 1998 | A |
5861328 | Tehrani et al. | Jan 1999 | A |
5892708 | Pohm | Apr 1999 | A |
5917749 | Chen et al. | Jun 1999 | A |
6005798 | Sakakima et al. | Dec 1999 | A |
6005800 | Koch et al. | Dec 1999 | A |
6111782 | Sakakima et al. | Aug 2000 | A |
6236590 | Bhattachryya et al. | May 2001 | B1 |
Number | Date | Country |
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0 681 338 | Nov 1995 | EP |
0 936 623 | Aug 1999 | EP |
1 061 592 | Dec 2000 | EP |
Entry |
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Pohm et al., “Experimental and Analytical Properties of 0.2 Micron Wide, Multi-layer, GMR, Memory Elements”, Transactions on Magnetics, vol. 32, No. 5, Sep. 1996. |