Number | Date | Country | Kind |
---|---|---|---|
5-175423 | Jul 1993 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
3892490 | Uetsuki et al. | Jul 1975 | |
5425964 | Southwell et al. | Jun 1995 |
Number | Date | Country |
---|---|---|
A-0 552 648 | Jul 1993 | EPX |
27 50 421 | May 1979 | DEX |
51-035679 | Mar 1976 | JPX |
78040189 | Oct 1978 | JPX |
1-259175 | Oct 1989 | JPX |
Entry |
---|
M. Oshikri et al., Optical Thickness Monitoring in Dielectric Multilayer Deposition for Surface-Emitting Laser Reflectors, Electronics and Communications in Japan 75 (1992): No. 12, p. 12. |