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G01R1/06761
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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G01R1/06761
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Patents Grants
last 30 patents
Information
Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
Patent number
12,210,038
Issue date
Jan 28, 2025
TSE CO., LTD.
Young Min Lee
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
Patent number
12,181,494
Issue date
Dec 31, 2024
PROTEC MEMS TECHNOLOGY INC
Yong Ho Cho
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Semiconductor probe
Patent number
12,078,658
Issue date
Sep 3, 2024
Chien Cheng Tien
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming probe head structure
Patent number
12,019,097
Issue date
Jun 25, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Wen-Yi Lin
G01 - MEASURING TESTING
Information
Patent Grant
Sheet connector, sheet set, electrical inspection device, and elect...
Patent number
12,007,410
Issue date
Jun 11, 2024
Mitsui Chemicals, Inc.
Katsunori Nishiura
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam vertical probes with independent arms formed of a high c...
Patent number
12,000,865
Issue date
Jun 4, 2024
Microfabrica Inc.
Uri Frodis
G01 - MEASURING TESTING
Information
Patent Grant
Probes having improved mechanical and/or electrical properties for...
Patent number
11,982,689
Issue date
May 14, 2024
Microfabrica Inc.
Garret R. Smalley
G01 - MEASURING TESTING
Information
Patent Grant
Probe test card and method of manufacturing the same
Patent number
11,933,818
Issue date
Mar 19, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing a measurement probe, and measurement probe
Patent number
11,921,131
Issue date
Mar 5, 2024
Rohde & Schwarz GmbH & Co. KG
Alexander Kunze
G01 - MEASURING TESTING
Information
Patent Grant
Probe tip assembly for testing optical components
Patent number
11,885,830
Issue date
Jan 30, 2024
Lumentum Operations LLC
Sean Burns
G01 - MEASURING TESTING
Information
Patent Grant
Testing head with improved frequency property
Patent number
11,828,774
Issue date
Nov 28, 2023
Technoprobe S.p.A.
Roberto Crippa
G01 - MEASURING TESTING
Information
Patent Grant
Vertical probe arrays and improved methods for making using tempora...
Patent number
11,828,775
Issue date
Nov 28, 2023
Microfabrica Inc.
Michael S. Lockard
G01 - MEASURING TESTING
Information
Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
Patent number
11,821,918
Issue date
Nov 21, 2023
Microfabrica Inc.
Michael S. Lockard
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing probes for testing integrated electronic c...
Patent number
11,796,568
Issue date
Oct 24, 2023
STMicroelectronics S.r.l.
Alberto Pagani
G01 - MEASURING TESTING
Information
Patent Grant
Multi-layer, multi-material micro-scale and millimeter-scale device...
Patent number
11,630,127
Issue date
Apr 18, 2023
University of Southern California
Ming Ting Wu
B32 - LAYERED PRODUCTS
Information
Patent Grant
Probe assembly
Patent number
11,543,430
Issue date
Jan 3, 2023
MPI CORPORATION
Ming-Hsiang Hsieh
G01 - MEASURING TESTING
Information
Patent Grant
Probe test card and method of manufacturing the same
Patent number
11,543,433
Issue date
Jan 3, 2023
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Metal probe structure and method for fabricating the same
Patent number
11,474,128
Issue date
Oct 18, 2022
Princo Corp.
Yi-Lin Chu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Cylindrical body and method for producing same
Patent number
11,408,915
Issue date
Aug 9, 2022
Nidec-Read Corporation
Masami Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe pins with etched tips for electrical die test
Patent number
11,340,258
Issue date
May 24, 2022
Intel Corporation
Joseph D. Stanford
G01 - MEASURING TESTING
Information
Patent Grant
Functional prober chip
Patent number
11,280,825
Issue date
Mar 22, 2022
Xallent LLC
Kwame Amponsah
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probes having improved mechanical and/or electrical properties for...
Patent number
11,262,383
Issue date
Mar 1, 2022
Microfabrica Inc.
Garret R. Smalley
G01 - MEASURING TESTING
Information
Patent Grant
Resistivity probes with curved portions
Patent number
11,249,110
Issue date
Feb 15, 2022
KLA-Tencor Corporation
Walter H. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Probe card device
Patent number
11,221,351
Issue date
Jan 11, 2022
Princo Corp.
Chih-kuang Yang
G01 - MEASURING TESTING
Information
Patent Grant
Probe
Patent number
11,204,370
Issue date
Dec 21, 2021
Kabushiki Kaisha Nihon Micronics
Mika Nasu
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing probes for testing integrated electronic circuits
Patent number
11,169,180
Issue date
Nov 9, 2021
STMicroelectronics S.r.l.
Alberto Pagani
G01 - MEASURING TESTING
Information
Patent Grant
Insulator applied in a probe base and the probe base
Patent number
11,143,675
Issue date
Oct 12, 2021
C.C.P. CONTACT PROBES CO., LTD.
Chien-Yu Hsieh
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe for testing head
Patent number
11,131,690
Issue date
Sep 28, 2021
Technoprobe S.p.A.
Giuseppe Crippa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe card device
Patent number
11,073,537
Issue date
Jul 27, 2021
CHUNGHWA PRECISION TEST TECH. CO., LTD.
Wen-Tsung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Probe tip with embedded skate
Patent number
11,054,443
Issue date
Jul 6, 2021
FormFactor, Inc.
January Kister
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME
Publication number
20250035670
Publication date
Jan 30, 2025
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
Publication number
20250020691
Publication date
Jan 16, 2025
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...
Publication number
20240426872
Publication date
Dec 26, 2024
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
Publication number
20240385221
Publication date
Nov 21, 2024
CHUNGHWA PRECISION TEST TECH. CO., LTD.
HAO-YEN CHENG
G01 - MEASURING TESTING
Information
Patent Application
PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR
Publication number
20240319228
Publication date
Sep 26, 2024
Jung Gyun BAEK
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD STRUCTURE
Publication number
20240302410
Publication date
Sep 12, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Wen-Yi LIN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN
Publication number
20240280609
Publication date
Aug 22, 2024
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
PROBE SHEET WITH CONTACT TIP ON STACKED MULTI-LAYER AND METHOD OF M...
Publication number
20240230717
Publication date
Jul 11, 2024
PROTEC MEMS TECHNOLOGY INC
Yong Ho CHO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
WAFER INSPECTION SYSTEM
Publication number
20240219447
Publication date
Jul 4, 2024
CHROMA ATE INC.
WEI-CHIH CHEN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR
Publication number
20240192253
Publication date
Jun 13, 2024
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR
Publication number
20240183881
Publication date
Jun 6, 2024
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
PROBE AND PROBE CARD
Publication number
20240168056
Publication date
May 23, 2024
Kabushiki Kaisha Nihon Micronics
Mika NASU
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...
Publication number
20240110943
Publication date
Apr 4, 2024
Microfabrica Inc.
Onnik Yaglioglu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A PROBE CARD
Publication number
20240110948
Publication date
Apr 4, 2024
Exaddon AG
Kun-Hsien LIN
G01 - MEASURING TESTING
Information
Patent Application
Multi-Beam Vertical Probes with Independent Arms Formed of a High C...
Publication number
20240103040
Publication date
Mar 28, 2024
Microfabrica Inc.
Uri Frodis
G01 - MEASURING TESTING
Information
Patent Application
Shielded Probes for Semiconductor Testing, Methods for Using, and M...
Publication number
20240094252
Publication date
Mar 21, 2024
Microfabrica Inc.
Jia Li
G01 - MEASURING TESTING
Information
Patent Application
Probe Arrays and Improved Methods for Making and Using Longitudinal...
Publication number
20240094261
Publication date
Mar 21, 2024
Microfabrica Inc.
MIchael S. Lockard
G01 - MEASURING TESTING
Information
Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
Publication number
20240094253
Publication date
Mar 21, 2024
Microfabrica Inc.
Garret R. Smalley
G01 - MEASURING TESTING
Information
Patent Application
Methods of Reinforcing Plated Metal Structures and Independently Mo...
Publication number
20240094247
Publication date
Mar 21, 2024
Microfabrica Inc.
Onnik Yaglioglu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
Publication number
20240085454
Publication date
Mar 14, 2024
Federal Institute of Metrology METAS
Johannes Hoffmann
G01 - MEASURING TESTING
Information
Patent Application
STRIP-SHAPED COMPOSITE MATERIAL FOR PROBE NEEDLES
Publication number
20240061016
Publication date
Feb 22, 2024
Heraeus Deutschland GmbH & Co. KG
Jonas FECHER
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL PROBE ARRAYS AND IMPROVED METHODS FOR MAKING USING TEMPORA...
Publication number
20240061017
Publication date
Feb 22, 2024
Microfabrica Inc.
MIchael S. Lockard
G01 - MEASURING TESTING
Information
Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
Publication number
20240019463
Publication date
Jan 18, 2024
Microfabrica Inc.
MIchael S. Lockard
G01 - MEASURING TESTING
Information
Patent Application
PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...
Publication number
20240012029
Publication date
Jan 11, 2024
STMicroelectronics S.r.l
Alberto PAGANI
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
CONTACT PROBE
Publication number
20230393171
Publication date
Dec 7, 2023
Yokowo Co., Ltd.
Kenichi SATO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A PROBE TIP AND A PROBE TIP MANUFACTURED BY...
Publication number
20230366912
Publication date
Nov 16, 2023
TSE CO., LTD.
Young Min LEE
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
Publication number
20230324435
Publication date
Oct 12, 2023
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Multi-Layer, Multi-Material Micro-Scale and Millimeter-Scale Device...
Publication number
20230324436
Publication date
Oct 12, 2023
University of Southern California
Ming Ting Wu
B32 - LAYERED PRODUCTS
Information
Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
Publication number
20230324438
Publication date
Oct 12, 2023
Technoprobe S.p.A.
Roberto Crippa
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE FOR A PROBE HEAD
Publication number
20230288447
Publication date
Sep 14, 2023
TECHNOPROBE S.P.A.
Stefano FELICI
G01 - MEASURING TESTING