Claims
- 1. In a system for testing a device which will pass light therethrough, the improvement comprising a light source for producing light, a plurality of first fiber optics located between said light source and said device to be tested whereby light from said light source will be directed through said device to be tested in a plurality of different small areas of said device, a second plurality of second fiber optics positioned to individually receive light that passes through the different areas of said device to be tested, a plurality of detectors positioned to receive light form individual optical fibers of said second plurality of optical fibers so as to detect any change in the characteristics of the light cause by said device to be tested, a polarizer connected between said light source and said first plurality of optical fibers so as to polarize the light entering said second plurality of optical fibers and said device tested, magnetic means for providing a magnetic field across said device to be tested; and a polarizer analyzer positioned between said device to be detected and said second plurality of optical fibers whereby any Faraday rotation (FR) caused by said device to be tested will be detected by said detectors.
- 2. A system as set forth in claim 1 further comprising a selector means connected to said plurality of detectors so as to individually select and record the outputs of the detectors.
- 3. A system as set forth in claim 2 further comprising a controller and processor connected to said selector means for the determining which detector is to be selected and for storing the information detected, and said controller and processor connected to said magnetic means for reversing the magnetic field so as to provide a reverse FR reading of each area of said device to be detected.
- 4. A device as set forth in claim 3 further comprising a chopper positioned between said light source and said polarizers so as to pulse the output of said light source; and synchronizing means connected between said chopper, selector means and said controller and processor for synchronizing the selected outputs of the detectors.
- 5. A system as set forth in claim 4 further comprising a wavelength selector positioned between said light source and said chopper for determining the wavelength of the light to be passed through said device to be tested, and means connected to said wavelength selector and said controller and processor for controlling said wavelength selector.
- 6. A system as set forth in claim 5 whereby the controller processor in cooperation with the selector means provides a map of the device to be tested and an output display connected to the controller processor for displaying said map.
- 7. In a system for testing a device which will cause Faraday rotation (FR) of polarized light passing therethrough, the improvement comprising a light source for producing polarized light, a first means located between said light source and said device to be tested whereby light from said light source will be directed through said device to be tested, magnetic means positioned so as to produce a magnetic field through said device to be detected so as to cause FR of the polarized light passing through said device, and a plurality of detectors positioned to receive light from individual small areas of said device so as to detect any change in the characteristics of the polarized light cause by said device to be tested.
- 8. A system as set forth in claim 7 further comprising a controller means connected to said magnetic means so as to selectively reverse the direction of the magnetic field.
- 9. A system as set forth in claim 8 further comprising a polarizer analyzer positioned between said device to be detected and said detectors.
- 10. A system as set forth in claim 8 further comprising a conventional means for lowering the wafer temperature.
DEDICATORY CLAUSE
The invention described herein may be manufactured, used, and licensed by or for the Government for governmental purposes without the payment to us of any royalties thereon.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
4498780 |
Banno et al. |
Feb 1985 |
|
4559451 |
Curl |
Dec 1985 |
|
Non-Patent Literature Citations (1)
Entry |
Smith, "Nonvisual Measurement of Collapse Field in Small-Bubble Garnets", v. Sci. Instrum., vol. 52, No. 11, pp. 1737-1748, 11/81. |