Claims
- 1. An arrangement for sensing a temperature rise, comprising
- (a) a film light guide including a first layer comprised of an optically homogeneous material having an index of refraction n.sub.1 in contact with a second layer comprised of a material with an index of refraction n.sub.2 lower than n.sub.1, said first layer having a photoluminescent material dissolved therein;
- (b) light source means for illuminating said first layer of said light guide with light of visible or near infrared wavelengths .lambda..sub.v, wherein a temperature-dependent fraction .alpha. of the intensity of said light of wavelengths .lambda..sub.v is absorbed by said photoluminescent material and re-emitted as luminescence light of wavelengths .lambda..sub.f different from .lambda..sub.v, the value of .alpha. and the intensity of said luminescence light increasing as a known function of the temperature of said first layer; and
- (c) photodetector means for sensing the increase of the intensity of said luminescence light of wavelengths .lambda..sub.f which is emitted from said first layer, said increase being an indicator of the temperature rise.
- 2. An arrangement as claimed in claim 1 and adapted to sense infrared radiation incident on said film light guide, wherein said film light guide is provided with an infrared-absorbing material and said temperature rise is caused by the absorption of said infrared radiation by said infrared-absorbing material.
- 3. An arrangement as claimed in claim 2 and adapted to convert an infrared image into a visible or near infrared image of wavelengths .lambda..sub.f, additional comprising optical means for focusing the infrared image into said film light guide, thereby generating luminescence light image of wavelengths .lambda..sub.f having a two-dimensional intensity distribution indicative of the two-dimensional intensity distribution of the infrared image focused on said film light guide.
- 4. An arrangement as claimed in claim 3 wherein said luminescence light of wavelengths .lambda..sub.f includes wavelengths shorter than .lambda..sub.v.
- 5. A method for sensing a temperature rise, comprising the steps of:
- (a) providing a film light guide including a first layer comprised of an optically homogeneous material having an index of refraction n.sub.1 in contact with a second layer comprised of a material with an index of refraction n.sub.2 lower than n.sub.1, said first layer having a photoluminescent material dissolved therein;
- (b) illuminating said first layer of said light guide with light of visible or near infrared wavelengths .lambda..sub.v, wherein a temperature-dependent fraction .alpha. of the intensity of said light of wavelengths .lambda..sub.v is absorbed by said photoluminescent material and re-emitted as luminescence light of wavelengths .lambda..sub.f different from .lambda..sub.v, the value of .alpha. and the intensity of said luminescence light increasing as a known function of the temperature of said first layer; and
- (c) sensing with photodetector means the increase of the intensity of said luminescence light of wavelengths .lambda..sub.f which is emitted from said first layer, said increase being an indicator of the temperature rise.
- 6. A method as claimed in claim 5 and adapted to sense thermal infrared radiation incident on said film light guide, wherein said film light guide is provided with an infrared-absorbing material and said temperature rise is caused by the absorption of said infrared radiation by said infrared-absorbing material.
- 7. A method as claimed in claim 6 and adapted to convert an infrared image into a visible or near infrared image of wavelengths .lambda..sub.f and additionally comprising the step of
- focusing the infrared image into said film light guide, thereby generating a luminescence light image of wavelengths .lambda..sub.f having a two-dimensional intensity distribution indicative of the two-dimensional intensity distribution of the infrared image focused on said film light guide.
- 8. A method as claimed in claim 7 wherein said luminescence light of wavelengths .lambda..sub.f includes wavelengths shorter than .lambda..sub.v.
CROSS-REFERENCE TO RELATED APPLICATIONS
This is a continuation-in-part (CIP) of application Ser. No. 07/654,809 filed Feb. 13, 1993, now U.S. Pat. No. 5,302,025, which in turn is a division of application Ser. No. 711,062 filed Mar. 12, 1985, now U.S. Pat. No. 5,004,913, which in turn is a CIP of application Ser. No. 608,932 filed May 14, 1984, now U.S. Pat. No. 4,708,494, which in turn is a continuation of application Ser. No. 405,732 filed Aug. 6, 1982, now abandoned. The subject matter of sections 3.0 to 3.2 is covered entirely in the pending application Ser. No. 08/305,252 filed Sep. 13, 1994 and was also covered in application Ser. No. 815,741 filed Jan. 2, 1992 now U.S. Pat. No. 5,363,463, the teachings of which are incorporated herein by reference.
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Divisions (1)
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Continuations (1)
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Continuation in Parts (2)
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