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5794175 | Conner | Aug 1998 | A |
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5812488 | Zager et al. | Sep 1998 | A |
5835969 | Inagaki et al. | Nov 1998 | A |
5983303 | Sheafor et al. | Nov 1999 | A |
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Number | Date | Country |
---|---|---|
0 847 060 | Jun 1998 | EP |
Entry |
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“Meet Synchronous Memory Test Challenges,” Test and Measurement World. (Inc. Electronics Test), vol. 17, No. 1, Jan. 1, 1997, pp. 29-30, 33-34, 36, XP000684737. |