Lee, Kang, and Chun. Micromachined Self Aligned Microlens (SAM) For Microcolumn Electron Beam. Microelectric Engineering 35 (1997) 413-416, 1997. |
Choi et al. Fabrication of Microelectron Gun Arrays Using Laser Micromachining. Microelectronic Emgineering 41/42 (1998) 167-170, 1998. |
Despont et al. Microfabrication of Lenses for a Miniaturized Electron Column. Microelectronic Engineering 27 (1995) 467-470, 1995. |
Despont et al. Electron Beam Microcolumn Fabrication and Testing. Microelectronic Engineering 30 (1996) 69-72, 1996. |
Zlatkin, Garcia. Low-energy (300 eV) Versatile Scanning Electron Microscope with 30 nm Resolution. Microelectronic Engineering 45 (1999) 39-46, 1997. |
S. Kleindiek, et al., “Miniature three-axis micropositioner for scanning proximal probe and other applications”, Journal of Vacuum Science & Technology Bulletin, vol. 13, No. 6 Nov./Dec. 1995, pp. 2653-2656. |
T. Chang, et al., “Electron-Beam Microcolumns for Lithography and Related Applications”, Journal of Vacuum Science Technology Bulletin vol. 14, No. 6, pp. 3774-3781, Nov./Dec.1996. |
“The Scanning Tunneling Microscope-What it is and how it works . . . ”, http://www.iap.tuwien.ac.at/www/surface/STM-Gallery/stm-schematic.html. |
“Scanning Tunneling Microscope Update 1997”, http://www.umsl.edu/˜fraundor/stm97×.html. |
E. Kratchmer, et al., “Sub-40 nm resolution 1 keV scanning tunneling microscope field-emission microcolumn”, Journal of Vacuum Science & Technology Bulletin, vol. 12 No. 6 Nov. 1 1994 pp. 3503. |
Patent Abstracts of Japan, vol. 009, No. 023 (E-293), Jan. 30 1985 (JP 59 169130 A. |
K.Y. Lee, et al., “High aspect ration aligned multilayer microstructure fabrication”, Journal of Vacuum Science & Technology Bulletin, vol. 12, No. 6 Nov. 1 1994, pp. 3425-3430. |