Claims
- 1. A process for producing a stamper in the form of a roller to be used for forming a predetermined pattern on a data recording medium substrate, said process comprising the steps of:
- forming a layer of a photoresist on a stamper substrate in the form of a roller;
- winding a flexible exposure mask, which includes a predetermined pattern, by affixing, to the roller stamper substrate having the photoresist layer thereon, and exposing the roller stamper substrate through the exposure mask to band-like exposure light, while moving the roller stamper substrate and the exposure mask relative to the band-like exposure light;
- subjecting the photoresist layer to development thereby to form on the stamper substrate a pattern of the photoresist corresponding to the pattern of the exposure mask; and
- forming on the stamper substrate an unevenness pattern corresponding to the pattern of the photoresist.
- 2. A process according to claim 1, wherein said pattern of the photoresist is formed on the stamper substrate and then the stamper substrate is subjected to etching, thereby to form an unevenness pattern on the stamper substrate.
- 3. A process according to claim 1, wherein said pattern of the photoresist is formed on the stamper substrate and then a film of a pattern-forming material is formed on the stamper substrate, thereby to form an unevenness pattern of the pattern-forming material on the stamper substrate.
- 4. A process according to claim 1, wherein the roller stamper substrate has a diameter of 50-1000 mm.
- 5. A process according to claim 4, wherein the roller stamper substrate has a diameter of 200-500 mm.
- 6. A process according to claim 1, further comprising exposing the roller stamper substrate having the photoresist layer thereon to light by the medium of a member having a slit.
- 7. A process according to claim 6, wherein said slit has a width of 2-20 mm.
- 8. A process according to claim 1, further comprising preparing the flexible exposure mask by forming a pattern-forming film on a flexible substrate, and patternwise etching the pattern-forming film.
- 9. A process according to claim 8, wherein said flexible substrate transmits ultraviolet light.
- 10. A process according to claim 8, wherein said flexible substrate of the exposure mask comprises quartz glass.
- 11. A process according to claim 8, wherein said flexible substrate of the exposure mask has a thickness of at most 0.5 mm.
- 12. A process according to claim 8, wherein said flexible substrate of the exposure mask has a thickness of 0.1-0.3 mm.
- 13. A process according to claim 8, wherein said pattern-forming film of the exposure mask has a thickness of 500-1200 .ANG..
Priority Claims (1)
Number |
Date |
Country |
Kind |
63-264691 |
Oct 1988 |
JPX |
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Parent Case Info
This application is a continuation of prior application Ser. No. 07/422,639 filed Oct. 17, 1989, now abandoned.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
4778747 |
Ohta et al. |
Dec 1988 |
|
4888266 |
Lacotte et al. |
Dec 1989 |
|
Foreign Referenced Citations (3)
Number |
Date |
Country |
86721 |
Jul 1981 |
JPX |
87203 |
Jul 1981 |
JPX |
236049 |
Oct 1986 |
JPX |
Continuations (1)
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Number |
Date |
Country |
Parent |
422639 |
Oct 1989 |
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