Number | Date | Country | Kind |
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196 37 182 | Sep 1996 | DEX |
Number | Name | Date | Kind |
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4010064 | Patrick | Mar 1977 | |
4556448 | Kim | Dec 1985 | |
4981549 | Yamashita et al. | Jan 1991 | |
5264189 | Yamashita et al. | Nov 1993 | |
5373804 | Tachimori | Dec 1994 | |
5575847 | Kuramochi et al. | Nov 1996 |
Number | Date | Country |
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0170788 | Feb 1986 | EPX |
0644588 | Mar 1995 | EPX |
0716168 | Jun 1996 | EPX |
4442239 | Jun 1995 | DEX |
Entry |
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Proceedings of the 18th International Conference on Defects in Semiconducs, Party, Sendai, Japan, Jul. 23-28, 1995, pp. 1731-1735. |
Journal of Electrochemical Society, vol. 142, No. 9, Sep. 1995, pp. 3189-3192. |