| G. Binnig et al., "Surface Studies by Scanning Tunneling Microscopy", Physical Review Letters, pp. 57-61, July 5, 1982. |
| G. Binnig et al., "7.times.7 Reconstruction on Si(111) Resolved in Real Space", Physical Review Letters, pp. 120-123, Jan. 10, 1983. |
| Peter Gwynne, "IBM Researchers Utilize Vacuum Tunneling for High-Resolution Microscopy Technique", Industrial Research & Development, pp. 72-73, May, 1983. |
| B. Kazan et al., "Image-Storage Panels Based on Field-Effect Control of Conductivity", Proceedings of the IEEE, vol. 56 (3), pp. 285-295, Mar. 1968. |
| James A. Amick, "A Review of Electrofax Behavior", RCA Review, pp. 753-769, Dec., 1959. |
| Dessaner & Clark, "Xerography & Related Processes", The Focal Press, pp. 59-61, 1965. |
| M. E. Mochel et al., "Electron Beam Writing on a 20-.ANG. Scale in Metal .beta.-Aluminas", Applied Physics Letters, vol. 42(4), pp. 392-394, Feb. 15, 1983. |