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4591795 | McCorkle | May 1986 | |
4730318 | Bogholtz, Jr. et al. | Mar 1988 | |
5111459 | DeVigne | May 1992 | |
5247246 | Loan et al. | Sep 1993 | |
5293079 | Knoch | Mar 1994 | |
5321700 | Brown et al. | Jun 1994 | |
5689515 | Panis | Nov 1997 | |
5694399 | Jacobson et al. | Dec 1997 | |
5712858 | Godiwala et al. | Jan 1998 | |
5752272 | Tanabe | May 1998 | |
5794175 | Conner | Aug 1998 |
Number | Date | Country |
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0 566 823 A2 | Oct 1993 | EP |
0 802 418 A2 | Oct 1997 | EP |
0 802 418 A3 | Oct 1997 | EP |
Entry |
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U.S. patent application No. 08/638,026, filed Apr. 26, 1996, titled “High Speed Serial Data Pin for Automatic Test Equipment”, assigned to the assignee of the present invention. |
SICAN Preliminary Data Sheet for 2.64 GHz Extension System for HP83000, dated May 1997. |
Publication titled “Low Cost ATE Pin Electronics for Multigigabit-per-Second At-Speed Test”, by Keezer et al., date unknown. |
Publication titled “Multiplexing Test System Channels for Data Rates Above 1 Gb/s”, by Keezer, dated 1990. |