Interface with the device under test [DUT]

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CPC
G01R31/31905

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31905Interface with the device under test [DUT]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Measurement system for identifying aggressor signals
- Patent number 12,140,631
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test interface circuit
- Patent number 12,130,331
- Issue date Oct 29, 2024
- NANYA TECHNOLOGY CORPORATION
- Che-Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component impedance measurement and characterization at high transi...
- Patent number 12,072,362
- Issue date Aug 27, 2024
- Analog Devices, Inc.
- Mohit Gopalraj
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated impedance measurement device and impedance measurement m...
- Patent number 12,038,463
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Stress-testing electrical components using telemetry modeling
- Patent number 12,038,479
- Issue date Jul 16, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,025,663
- Issue date Jul 2, 2024
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Electronic tester and testing method
- Patent number 11,971,450
- Issue date Apr 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Data recorder
- Patent number 11,953,547
- Issue date Apr 9, 2024
- Bae Systems Controls Inc.
- Thomas J. Cummings
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system for characterizing a device under test
- Patent number 11,933,848
- Issue date Mar 19, 2024
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING
Information Patent Grant
Determining charge pump efficiency using clock edge counting
- Patent number 11,927,635
- Issue date Mar 12, 2024
- SanDisk Technologies LLC
- Keyur Payak
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Receiving device, mobile terminal test apparatus provided with rece...
- Patent number 11,892,498
- Issue date Feb 6, 2024
- Anritsu Corporation
- Takasumi Ikebe
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems including imaging devices with objective lens isolato...
- Patent number 11,874,301
- Issue date Jan 16, 2024
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test system configuration adapter systems and methods
- Patent number 11,867,720
- Issue date Jan 9, 2024
- Advantest Corporation
- Eddy Wayne Chow
- G01 - MEASURING TESTING
Information Patent Grant
Vision system for an automated test system
- Patent number 11,867,749
- Issue date Jan 9, 2024
- Teradyne, Inc.
- Jianfa Pei
- G01 - MEASURING TESTING
Information Patent Grant
Device interface board supporting devices with multiple different s...
- Patent number 11,860,229
- Issue date Jan 2, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Time offset method and device for test signal
- Patent number 11,860,226
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,841,392
- Issue date Dec 12, 2023
- Advantest Test Solutiions, Inc.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for checking the functionality of a measuring object
- Patent number 11,815,543
- Issue date Nov 14, 2023
- Neuroloop GmbH
- Fabian Kimmig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling unit specific junction tempera...
- Patent number 11,808,813
- Issue date Nov 7, 2023
- Intel Corporation
- Mahesh Deshmane
- G01 - MEASURING TESTING
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 11,808,812
- Issue date Nov 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing probes for testing integrated electronic c...
- Patent number 11,796,568
- Issue date Oct 24, 2023
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Localized heating/cooling using thermocouple between probe pins
- Patent number 11,796,590
- Issue date Oct 24, 2023
- International Business Machines Corporation
- Pablo Nieves
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated communication link testing
- Patent number 11,789,070
- Issue date Oct 17, 2023
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Detection system and detection method
- Patent number 11,782,093
- Issue date Oct 10, 2023
- AmTRAN TECHNOLOGY Co., Ltd
- Yen-Ting Tung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...
- Publication number 20250012858
- Publication date Jan 9, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20240361386
- Publication date Oct 31, 2024
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING
Information Patent Application
Integrated Impedance Measurement Device and Impedance Measurement M...
- Publication number 20240345146
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT
- Publication number 20240337694
- Publication date Oct 10, 2024
- MONTAGE TECHNOLOGY CO., LTD.
- Dongming LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING A CONTROL DEVICE USING A TEST ASSEMBLY
- Publication number 20240337695
- Publication date Oct 10, 2024
- dSPACE GmbH
- Remigiusz SEILER
- G01 - MEASURING TESTING
Information Patent Application
STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM
- Publication number 20240329137
- Publication date Oct 3, 2024
- International Business Machines Corporation
- Brent William YARDLEY
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD THEREOF
- Publication number 20240302428
- Publication date Sep 12, 2024
- WINBOND ELECTRONICS CORP.
- Kuan-Cheng Chang
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CH...
- Publication number 20240243735
- Publication date Jul 18, 2024
- Intel NDTM US LLC
- Andreas KERBER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...
- Publication number 20240133952
- Publication date Apr 25, 2024
- Intel NDTM US LLC
- Andreas KERBER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
TEST INTERFACE CIRCUIT
- Publication number 20240110980
- Publication date Apr 4, 2024
- NANYA TECHNOLOGY CORPORATION
- Che-Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20240103037
- Publication date Mar 28, 2024
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING
- Publication number 20240085477
- Publication date Mar 14, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME
- Publication number 20240077535
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Soonil KWON
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...
- Publication number 20240069099
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Christian Paul Sommers
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20240044974
- Publication date Feb 8, 2024
- Anritsu Corporation
- Hiroyuki ONUMA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED COMMUNICATION LINK TESTING
- Publication number 20240044975
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...
- Publication number 20240012029
- Publication date Jan 11, 2024
- STMicroelectronics S.r.l
- Alberto PAGANI
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES
- Publication number 20230375611
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chin-Hao Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated Impedance Measurement Device and Impedance Measurement M...
- Publication number 20230366917
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING
- Publication number 20230349972
- Publication date Nov 2, 2023
- KEYUR PAYAK
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC INSTRUMENT FOR ANALYZING A DUT
- Publication number 20230333164
- Publication date Oct 19, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mathias HELLWIG
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20230314512
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
DDR5 SDRAM DIMM SLOT DETECTION SYSTEM AND METHOD THEREOF
- Publication number 20230296673
- Publication date Sep 21, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Jin-Dong Zhao
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...
- Publication number 20230288480
- Publication date Sep 14, 2023
- Intel Corporation
- Mahesh DESHMANE
- G01 - MEASURING TESTING
Information Patent Application
SOLDERLESS HIGH CURRENT, HIGH VOLTAGE, HIGH BANDWIDTH TEST FIXTURE
- Publication number 20230251311
- Publication date Aug 10, 2023
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
Measurement System for Characterizing a Device Under Test
- Publication number 20230251312
- Publication date Aug 10, 2023
- National Instruments Ireland Resources Limited
- Marc Vanden Bossche
- G01 - MEASURING TESTING

Interface with the device under test [DUT]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated test equipment comprising a plurality of communication in...

Measurement system for identifying aggressor signals

Test interface circuit

Test devices, test systems, and operating methods of test systems

Cyclic loop image representation for waveform data

Component impedance measurement and characterization at high transi...

Integrated impedance measurement device and impedance measurement m...

Stress-testing electrical components using telemetry modeling

Method for semiconductor device interface circuitry functionality a...

Probe head for a testing apparatus of electronic devices with enhan...

Electronic tester and testing method

Data recorder

Measurement system for characterizing a device under test

Determining charge pump efficiency using clock edge counting

Automated test equipment for testing one or more devices under test...

Receiving device, mobile terminal test apparatus provided with rece...

Probe systems including imaging devices with objective lens isolato...

Memory device test method, apparatus, and system, medium, and elect...

Test system configuration adapter systems and methods

Vision system for an automated test system

Device interface board supporting devices with multiple different s...

Time offset method and device for test signal

Integrated test cell using active thermal interposer (ATI) with par...

Assembly for checking the functionality of a measuring object

Apparatus and method for controlling unit specific junction tempera...

Passive carrier-based device delivery for slot-based high-volume se...

Method for manufacturing probes for testing integrated electronic c...

Localized heating/cooling using thermocouple between probe pins

Integrated communication link testing

Detection system and detection method

Patents Applicationslast 30 patents

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...

Integrated Impedance Measurement Device and Impedance Measurement M...

TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT

TESTING A CONTROL DEVICE USING A TEST ASSEMBLY

STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

TESTING DEVICE AND TESTING METHOD THEREOF

IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CH...

DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

TEST INTERFACE CIRCUIT

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING

TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

INTEGRATED COMMUNICATION LINK TESTING

PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...

SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES

Integrated Impedance Measurement Device and Impedance Measurement M...

DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING

ELECTRONIC INSTRUMENT FOR ANALYZING A DUT

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

DDR5 SDRAM DIMM SLOT DETECTION SYSTEM AND METHOD THEREOF

APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...

SOLDERLESS HIGH CURRENT, HIGH VOLTAGE, HIGH BANDWIDTH TEST FIXTURE

Measurement System for Characterizing a Device Under Test