Rip stop on flex and rigid flex circuits

Information

  • Patent Grant
  • 10015880
  • Patent Number
    10,015,880
  • Date Filed
    Tuesday, December 9, 2014
    9 years ago
  • Date Issued
    Tuesday, July 3, 2018
    5 years ago
Abstract
A rip stop material is attached at a stress area of a flexible circuit board in order to strengthen the flexible circuit board and minimize ripping and cracking in the polyimide and/or the copper conductors of the circuit. A rip stop transition layer is formed and deposited at a location on the flexible circuit in order to minimize, reduce, if not preventing cracking and ripping of the circuit as it is bent and flexed. The rip stop transition layer can be placed at different locations on and within the flexible circuit in order to minimize cracking and ripping as the flexible circuit is bent, flexed and twisted.
Description
FIELD OF THE INVENTION

The present invention is generally directed to wearable electronics and wearable electronic medical devices. More specifically, the present invention is directed to a means for limiting stress in and strengthening deformable electronics.


BACKGROUND OF THE INVENTION

Electronic devices are increasingly being developed so as to be worn by a user, such as in wearable electronics. As these wearable electronics gain traction in the marketplace, a new breed of devices that are able to bend, flex and stretch must be developed. These mechanical requirements present reliability challenges on mechanical components, circuit boards and interconnects, as well as electronic components. In order to limit the stress and strain to these components while still maintaining flexibility, mechanical provisions must be put in place.


SUMMARY OF THE INVENTION

A rip stop material is attached at a stress area of a flexible circuit board in order to strengthen the flexible circuit board and minimize ripping and cracking of the circuit board and in the polyimide and/or the copper conductors of the circuit. A rip stop transition layer is formed and deposited at a location on the flexible circuit in order to minimize, reduce, if not preventing cracking and ripping of the circuit as it is bent and flexed. The rip stop transition layer can be placed at different locations on and within the flexible circuit in order to minimize cracking and ripping as the flexible circuit is bent, flexed and twisted.


In one aspect, a deformable electronic comprises a deformable electronic body comprising a flexible base with one or more coverlays coupled to the flexible base and a rip stop material deposited at a location on the body in order to minimize, reduce, if not preventing cracking and ripping of the body as the body is flexed. In some embodiments, the rip stop material is deposited at a high stress location of the deformable electronic. Particularly, the rip stop material comprises an open weave interlocking fabric. In some embodiments, the rip stop material is attached to one of a rigid, a rigid-flex, a stretch, a rigid-stretch, and a mechanism housing of the deformable electronic. In some embodiments, the deformable electronic comprises a flexible circuit board. In further embodiments, the rip stop material is attached to one of the inside and the outside of the deformable electronic. In some embodiments, the deformable electronic comprises a plurality of rip stop material layers. In further embodiments, the rip stop material is laminated on a top of the one or more coverlays as a cap of the deformable electronic is laminated. In some embodiments, the rip stop material is laminated on top of the flexible base before the one or more coverlays are laminated. In some embodiments, the rip stop material is deposited at a high twist area of the deformable electronic.


In another aspect, a method of strengthening a deformable electronic comprises forming a rip stop transition layer and depositing the rip stop transition layer at a location on a body of the deformable electronic in order to minimize, reduce, if not preventing cracking and ripping of the body as it is flexed. In some embodiments, the rip stop material is deposited at a high stress location of the deformable electronic. Particularly, the rip stop material comprises an open weave interlocking fabric. In some embodiments, the rip stop material is attached to one of a rigid, a rigid-flex, a stretch, a rigid-stretch, and a mechanism housing of the deformable electronic. In some embodiments, the deformable electronic comprises a flexible circuit board. In further embodiments, the rip stop material is attached to one of the inside and the outsides of the deformable electronic. In some embodiments, the deformable electronic comprises a plurality of rip stop material layers. In further embodiments, the rip stop material is laminated on a top of the one or more coverlays as a cap of the deformable electronic is laminated. In some embodiments, the rip stop material is laminated on top of the flexible base before the one or more coverlays are laminated. In some embodiments, the rip stop material is deposited at a high twist area of the deformable electronic.





BRIEF DESCRIPTION OF THE DRAWINGS

Several example embodiments are described with reference to the drawings, wherein like components are provided with like reference numerals. The example embodiments are intended to illustrate, but not to limit, the invention. The drawings include the following figures:



FIG. 1 illustrates a flexible circuit board in accordance with some embodiments.



FIGS. 2A-2C illustrate a flexible circuit board in accordance with some embodiments.



FIG. 3 illustrates a method of strengthening a flexible circuit board in accordance with some embodiments.





DETAILED DESCRIPTION OF THE EMBODIMENTS

Embodiments of the invention are directed to applying a rip stop material to a flexible circuit board in order to strengthen the circuit and minimize, reduce, if not preventing rips and cracks. A rip stop material is attached at a stress area of a flexible circuit board in order to strengthen the flexible circuit board and minimize ripping and cracking in the polyimide and/or the copper conductors of the circuit. A rip stop transition layer is formed and deposited at a location on the flexible circuit in order to minimize, reduce, if not preventing cracking and ripping of the circuit as it is bent and flexed. The rip stop transition layer can be placed at different locations on and within the flexible circuit in order to minimize cracking and ripping as the flexible circuit is bent, flexed and twisted. For example, in some embodiments, the rip stop material is dispersed throughout the circuit as a coverlay, an underlay, and symmetrically positioned within the circuit board as an overlay and an underlay.


Reference will now be made in detail to implementations of mechanical measures for strengthening a flexible circuit board as illustrated in the accompanying drawings. The same reference indicators will be used throughout the drawings and the following detailed description to refer to the same or like parts. In the interest of clarity, not all of the routine features of the implementations described herein are shown and described. It will be appreciated that in the development of any such actual implementation, numerous implementation-specific decisions can be made in order to achieve the developer's specific goals, such as compliance with application and business related constraints, and that these specific goals will vary from one implementation to another and from one developer to another. Moreover, it will be appreciated that such a development effort might be complex and time-consuming, but would nevertheless be a routine undertaking of engineering for those of ordinary skill in the art having the benefit of this disclosure.


Referring now to FIG. 1, a flexible circuit board or deformable electronic is depicted therein. The flexible circuit board 100 comprises a multi-layer body 101 comprising a top cover layer 103, a bottom cover layer 105, a flexible base 107, and a center pre-preg section 111. Although the flexible circuit board 100 is shown having a top coverlay 103 and a bottom coverlay 105, the flexible circuit 100 is able to comprise more or less coverlays as appropriately desired. The center pre-preg section 111 is able to comprise a rigid or flexible section. Particularly, the flexible circuit 100 is able to comprise one or more rigid, rigid-flexible, flexible, stretchable and rigid-stretchable sections. One or more rip stop layers 109 are deposited throughout the body 101 of the flexible circuit. The one or more rip stop layers 109 strengthen the flexible circuit 100 so it is not ripped or cracked as the circuit 100 is bent, flexed, and twisted. The one or more rip stop layers 109 are attached at a specific location in order to strengthen the flexible circuit 100. The one or more rip stop layers 109 are deposited on the inner layers and/or outer layers of the circuit 100 depending upon the desired application.


Interconnects can be formed between one or more rigid component sections and one or more flexible sections of the circuit body. In some embodiments, the interconnects are electrical interconnects, such as conductive traces. In other embodiments, the interconnects are optical interconnects, such as waveguides. It is understood that other types of interconnects are contemplated.


The rip stop material is an open weave fabric comprising a series of threads woven in an interlocking cross-hatching patten. During weaving, the threads are interwoven at regular intervals in the cross-hatch pattern. The cross-hatch pattern and reinforcing technique makes the rip stop material resistant to ripping and tearing while maintaining a high strength to weight ratio. Particularly, the one or more rip stop material layers 109 can be placed in high stress areas of the flexible or rigid stack up in order to minimize ripping and tearing of the flexible circuit 100 and its polyimide and/or copper conductors. In some embodiments, the one or more rip stop material layers 109 utilize a thermal set adhesive embedded within an open weave fabric and are attached to the flexible circuit 100. In some embodiments the one or more rip stop layers 109 are heat resistant. As shown in FIG. 1, the one or more rip stop layers 109 are laminated on a top of the coverlay 103 and the coverlay 105 as a cap is laminated. The cap is able to comprises a rigid or flexible cap.



FIGS. 2A-2C illustrate a flexible circuit board or deformable electronic in accordance with some embodiments. The flexible circuit 200 is similar to the flexible circuit as described above in relation to FIG. 1. The flexible circuit board 200 comprises a multi-layer body 201 comprising a top cover layer 203, a bottom cover layer 205, a flexible base 207, and a center pre-preg section 211. Although the flexible circuit board 200 is shown having a top coverlay 203 and a bottom coverlay 205, the flexible circuit 200 is able to comprise more or less coverlays as appropriately desired. The center pre-preg section 211 is able to comprise a rigid or flexible section. One or more rip stop layers 209 are deposited throughout the body 201 of the flexible circuit 200. As described above, the one or more rip stop layers 209 strengthen the flexible circuit 200 so it is not ripped or cracked as the circuit 200 is bent, flexed, and twisted. The one or more rip stop layers 209 are attached at a specific location in order to strengthen the flexible circuit 200. The one or more rip stop layers 209 are deposited on the inner layers and/or outer layers of the circuit 200 depending upon the desired application. Particularly as shown within FIGS. 2A-2C, in the one or more rip stop layers 209 can be dispersed throughout the circuit as a coverlay, an underlay, and symmetrically positioned within the circuit board as an overlay and an underlay.


As shown within FIG. 2A, the one or more rip stop material layers 209 are attached to the flexible base 207. Particularly, the one or more rip stop layers 209 are attached to the flexible base 207 and on opposite sides of the center pre-preg section 211. The one or more rip stop layers 209 are attached at a specific location in order to strengthen the flexible circuit 200 so it is not ripped or cracked as the circuit 200 is bent, flexed, and twisted. The one more rip stop material layers 209 are laminated on top of the flexible base before the coverlays are laminated within the flexible circuit 200. In some embodiments, the one or more rip stop layers 209 utilize a thermal set adhesive and are heat resistant.


As shown within FIG. 2B, one or more rip stop material layers 219 are attached at a high stress area 213 of the flexible circuit 200. Particularly, the high stress area 213 comprises a high twist area of the circuit 200. The one or more rip stop material layers 219 enable the flexible circuit 200 to twist and bend without ripping or cracking. The one or more rip stop layers 209 and the one or more rip stop layers 219 are placed throughout the inside layers and/or the outside layers and at specific locations in order to strengthen and protect the flexible circuit 200. Particularly, the one or more rip stop layers 209 are able to be located at high stress areas such as where the circuit is commonly bent, twisted and flexed.



FIG. 2C shows one or more rip stop material layers 209 attached to the a center pre-preg section 211 and the coverlays. As described above, the center pre-preg section 211 is able to comprise a rigid or flexible section. The one or more rip stop material layers 209 are laminated on top of the center pre-preg section 21 and the coverlays of the flexible circuit 200. In some embodiments, the one or more rip stop layers 209 utilize a thermal set adhesive and are heat resistant.



FIG. 3 illustrates a method of strengthening a deformable electronic such as a flexible circuit board. The method begins in the step 310. In the step 320, a rip stop transition layer is formed. In some embodiments, the rip stop material is an open weave fabric comprising a series of threads woven in an interlocking cross-hatching patten. Then, in the step 330, the rip stop transition layer is deposited at a location on the flexible circuit board in order to minimize, reduce, if not preventing cracking and ripping as the circuit board is flexed. In some embodiments, the rip stop transition layer utilizes a thermal set adhesive and are heat resistant. In some embodiments, the rip stop transition layer is placed in a high stress areas of the flexible or rigid stack up in order to minimize ripping and tearing of the flexible circuit and its polyimide and/or copper conductors. The rip stop transition layer is attached to one or more rigid, rigid-flexible, flexible, stretchable and rigid-stretchable sections of the flexible circuit. Particularly, any number of rip stop transition layers are able to be deposited on the inner layers and/or outer layers of the circuit depending upon the desired application. The method ends in the step 340.


In operation, one or more rip stop transition layers are formed and deposited onto a deformable electronic such as a flexible circuit in order to strengthen the circuit. The rip stop material is attached at a stress area of a flexible circuit board in order to strengthen the flexible circuit board and minimize ripping and cracking of the circuit and the polyimide and/or the copper conductors of the circuit. A rip stop transition layer is formed and deposited at a location on the flexible circuit in order to minimize, reduce, if not preventing cracking and ripping of the circuit as it is bent and flexed. The rip stop transition layer can be placed at different locations on and within the flexible circuit in order to minimize cracking and ripping and the flexible circuit is bent, flexed and twisted.


Specifically, a rip stop layer is bonded inside, outside or to the casing of the flexible circuit. Particularly, rip stop layer is able to bend and move with the flexible circuit in order to minimize, reduce, if not preventing cracking and ripping. Additionally, one or more rip stop layers can be placed in high stress areas of the circuit such as where it is commonly twisted, bent, and flexed. Accordingly, the flexible circuit is strengthened in its high stress areas. In this manner depositing one or more rip stop material layers onto the flexible circuit decreases the chance that the circuit will rip or tear and mechanically fail. Accordingly, applying a rip stop material to a flexible circuit board in order to strengthen the circuit and minimize, reduce, if not preventing rips and cracks as described herein has many advantages.


The present invention has been described in terms of specific embodiments incorporating details to facilitate the understanding of the principles of construction and operation of the invention. Such references, herein, to specific embodiments and details thereof are not intended to limit the scope of the claims appended hereto. It will be apparent to those skilled in the art that modifications can be made in the embodiments chosen for illustration without departing from the spirit and scope of the invention. Specifically it will be apparent to someone of ordinary skill in the art that the invention is able to be used to strengthen any deformable electronic.

Claims
  • 1. A deformable electronic device comprising: a. a deformable electronic device body comprising a center pre-preg section and a flexible base with coverlays coupled to the flexible base; andb. a plurality of rip stop material layers deposited at boundary portions of the pre-preg section and the coverlays but not along entire surfaces of the coverlays, and at inside locations and along a length of the body, wherein at least two of the plurality rip stop material layers are positioned along the same plane within the body.
  • 2. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers is deposited at a high stress location of the deformable electronic device.
  • 3. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers comprises an open weave interlocking fabric.
  • 4. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers is attached to one of a rigid, a rigid-flex, a stretch, a rigid-stretch, and a mechanism housing of the deformable electronic device.
  • 5. The deformable electronic device of claim 1, wherein the deformable electronic device comprises a flexible circuit board.
  • 6. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers is attached to the outsides of the deformable electronic device.
  • 7. The deformable electronic device of claim 1, wherein at least two of the rip stop material layers are laminated along the same plane and on top of one of the coverlays.
  • 8. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers is laminated on top of the flexible base before the coverlays are laminated.
  • 9. The deformable electronic device of claim 1, wherein at least one of the rip stop material layers is deposited at a high twist area of the deformable electronic device.
  • 10. The deformable electronic device of claim 1, wherein each of the coverlays includes a pre-preg area, wherein all pre-preg areas are vertically aligned within the body to form the pre-preg section, wherein the pre-preg section is coupled with a cap at each end of the pre-preg section.
  • 11. The deformable electronic device of claim 10, wherein at least one of plurality of rip stop material layers is in contact with at least a portion of a surface of the pre-preg area of the each of the coverlays, wherein the pre-preg area of the each of the coverlays is centrally located in the each of the coverlays.
  • 12. A method of strengthening a deformable electronic device including a flexible base, coverlays, and a center pre-preg section, that together form a body, the method comprising: a. forming a plurality of rip stop material layers; andb. depositing the plurality of rip stop material layers at inside locations and along a length of the body of the deformable electronic device, and also at boundary potions of the pre-preg section and the coverlays but not along the entire surfaces of the coverlays, wherein at least two of the plurality rip stop material layers are disjointedly positioned along the same horizontal plane within the body.
  • 13. The method of claim 12, wherein at least one of the rip stop material layers is deposited at a high stress location of the deformable electronic device.
  • 14. The method of claim 12, wherein at least one of the rip stop material layers comprises an open weave interlocking fabric.
  • 15. The method of claim 12, wherein at least one of the rip stop material layers is attached to one of a rigid, a rigid-flex, a stretch, a rigid-stretch, and a mechanism housing of the deformable electronic device.
  • 16. The method of claim 12, wherein the deformable electronic device comprises a flexible circuit board.
  • 17. The method of claim 12, wherein at least one of the rip stop material layers is attached to the outsides of the deformable electronic device.
  • 18. The method of claim 12, wherein at least two of the rip stop material layers are laminated along the same plane and on top of one of the coverlays.
  • 19. The method of claim 12, wherein at least one of the rip stop material layer is laminated on top of the flexible base before the coverlays are laminated.
  • 20. The method of claim 12, wherein at least one of the rip stop material layer is deposited at a high twist area of the deformable electronic device.
RELATED APPLICATIONS

This Patent Application claims priority under 35 U.S.C. 119(e) of the co-pending U.S. provisional patent application Ser. No. 61/916,722, filed on Dec. 17, 2013, and entitled “NANO-COPPER VIA FILL FOR THERMAL PLATED THROUGH HOLE APPLICATIONS,” which is also hereby incorporated by reference in its entirety.

US Referenced Citations (138)
Number Name Date Kind
3471348 Iles Oct 1969 A
4733383 Waterbury Mar 1988 A
4931021 Mohan Jun 1990 A
4956524 Karkow Sep 1990 A
5085922 Murasawa Feb 1992 A
5184827 Suttle Feb 1993 A
5259833 Barnett Nov 1993 A
5326652 Lake Jul 1994 A
5555915 Kanao Sep 1996 A
5778941 Inada Jul 1998 A
5816848 Zimmerman Oct 1998 A
6103971 Sato et al. Aug 2000 A
6160254 Zimmerman Dec 2000 A
6172344 Gordon et al. Jan 2001 B1
6192940 Koma et al. Feb 2001 B1
6307751 Bodony Oct 2001 B1
6339193 Goett et al. Jan 2002 B1
6349201 Ford Feb 2002 B1
6591463 Wang Jul 2003 B2
6711024 Johansson Mar 2004 B1
6743982 Biegelsen Jun 2004 B2
6747227 Marmaropoulos et al. Jun 2004 B2
6805568 Kuzmenka Oct 2004 B2
7019973 Rivera Mar 2006 B2
7041357 Hsieh May 2006 B2
7156127 Moulton et al. Jan 2007 B2
7191803 Orr Mar 2007 B2
7234831 Hanley Jun 2007 B1
7319895 Klefstad-Sillonville Jan 2008 B2
7491892 Biegelson et al. Feb 2009 B2
7494238 Genz Feb 2009 B2
7573727 Hauenstein Aug 2009 B2
7629691 Roush Dec 2009 B2
7641488 Ho Jan 2010 B2
7643305 Lin Jan 2010 B2
7735523 Smith et al. Jun 2010 B2
7786389 Tsukada Aug 2010 B2
7795540 Yamada et al. Sep 2010 B2
8157730 LeBoeuf Apr 2012 B2
8207473 Axisa Jun 2012 B2
8258011 Brun Sep 2012 B2
8269112 Lee Sep 2012 B2
8283602 Augustine et al. Oct 2012 B2
8467726 Shirakata Jun 2013 B2
8469741 Oster Jun 2013 B2
8861220 Loher Oct 2014 B2
8883287 Boyce Nov 2014 B2
9018532 Wesselmann et al. Apr 2015 B2
9247648 Vanfleteren Jan 2016 B2
9340003 Chang May 2016 B2
9418927 Axisa Aug 2016 B2
9538641 Markus Jan 2017 B2
9699893 Matsumoto Jul 2017 B2
9706647 Hsu Jul 2017 B2
9730330 Boyle Aug 2017 B1
20020076948 Farrell Jun 2002 A1
20020094701 Biegelsen Jul 2002 A1
20030093248 Vock May 2003 A1
20030098084 Ragner et al. May 2003 A1
20030111126 Moulton et al. Jun 2003 A1
20030127246 Watanabe Jul 2003 A1
20030129905 Dhawan et al. Jul 2003 A1
20040082189 Totokawa Apr 2004 A1
20040111045 Sullivan Jun 2004 A1
20040192082 Wagner Sep 2004 A1
20040229533 Braekevelt Nov 2004 A1
20040243204 Maghribi Dec 2004 A1
20040259391 Jung Dec 2004 A1
20050022338 Muhlenkamp Feb 2005 A1
20050154264 Lecompte Jul 2005 A1
20050224993 Manepalli et al. Oct 2005 A1
20050280157 Roush Dec 2005 A1
20060000633 Hopper Jan 2006 A1
20060035554 Glaser et al. Feb 2006 A1
20060046471 Kirby Mar 2006 A1
20060128346 Yasui Jun 2006 A1
20060254811 Kirstein Nov 2006 A1
20060282018 Balzano Dec 2006 A1
20070001844 Krill Jan 2007 A1
20070054511 Ittel Mar 2007 A1
20070125295 Sanguinetti Jun 2007 A1
20070190881 Shibaoka et al. Aug 2007 A1
20070232455 Hanoun Oct 2007 A1
20070290305 Oyama Dec 2007 A1
20080060873 Lang Mar 2008 A1
20080157235 Rogers Jul 2008 A1
20080182475 Gnade Jul 2008 A1
20080223844 Cronn Sep 2008 A1
20080224941 Sugiyama Sep 2008 A1
20080241663 Yamashita Oct 2008 A1
20080258314 Yoo Oct 2008 A1
20080271220 Chilton Nov 2008 A1
20090173529 Lee Jul 2009 A1
20090309739 Ezer Dec 2009 A1
20090315320 Finn Dec 2009 A1
20090317639 Axisa Dec 2009 A1
20100090834 Buchnick Apr 2010 A1
20100116526 Arora May 2010 A1
20100325770 Chung Oct 2010 A1
20110063098 Fischer Mar 2011 A1
20110245633 Goldberg Mar 2011 A1
20110119812 Genz May 2011 A1
20110130060 Chung et al. Jun 2011 A1
20110163569 Yoneyama Jul 2011 A1
20110175630 Bhattacharya Jul 2011 A1
20110262785 Johnson Oct 2011 A1
20120050036 Landry Mar 2012 A1
20120176764 Loher Jul 2012 A1
20120314382 Wesselmann Dec 2012 A1
20130160183 Reho Jun 2013 A1
20130161055 Rule Jun 2013 A1
20130183646 Lusted Jul 2013 A1
20130216065 Nguyen Aug 2013 A1
20130220535 Lee Aug 2013 A1
20130247288 Kotos Sep 2013 A1
20130256004 Cotton Oct 2013 A1
20130316551 Day, Jr. Nov 2013 A1
20140124257 Yoshihara May 2014 A1
20140190729 Briggs Jul 2014 A1
20140220422 Rogers Aug 2014 A1
20140275857 Toth Sep 2014 A1
20140299362 Park Oct 2014 A1
20140362020 Rothkopf Dec 2014 A1
20150009129 Song Jan 2015 A1
20150015288 Ma Jan 2015 A1
20150041201 Van Heck Feb 2015 A1
20150068069 Tran Mar 2015 A1
20150091711 Kosonen Apr 2015 A1
20150109124 He Apr 2015 A1
20150122532 Nelson May 2015 A1
20150185944 Magi Jul 2015 A1
20150245777 Della Sep 2015 A1
20150312653 Avrahami Oct 2015 A1
20160007468 Tomikawa Jan 2016 A1
20160034634 Hong Feb 2016 A9
20160132150 Cotton Mar 2016 A1
20160187122 Krimon Jun 2016 A1
20160190880 Lewis Oct 2016 A1
Provisional Applications (2)
Number Date Country
61913830 Dec 2013 US
61916722 Dec 2013 US