Number | Name | Date | Kind |
---|---|---|---|
4293919 | Dasgupta et al. | Oct 1981 | |
4495629 | Zasio et al. | Jan 1985 | |
4782283 | Zasio | Nov 1988 | |
4922457 | Mizukami | May 1990 |
Entry |
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"A Logic Design Structure for LSI Testability", E. B. Eichelberger and T. W. Williams, Proceedings of the 14th Annual Design Automotion Conference, Jun., 1977, pp. 462-468. |
"Testing for Timing Faults in Synchronous Sequential Integrated Circuits", Yashwant K. Malaiya and Ramesh Narayanaswamy, pp. 560-571, Proceedings of the 1983 International Test Conference (IEEE). |