This disclosure relates generally to voltage sensors. More particularly, the described embodiments relate to a device, a method and/or a system for a groundless voltage sensor.
Current voltage sensors come in two varieties: conventional and groundless. Conventional voltage sensors typically connect to ground as a reference point, while groundless sensors do not. The need for a ground connection introduces a creepage path to ground through which current can flow. This path then becomes a safety hazard, and although this may be inconsequential for everyday electrical appliances where voltage is relatively low (110 V-220 V), electrical substations may carry voltages exceeding 500 kV, and this safety hazard becomes very expensive to address from an engineering perspective. Grounded voltage sensors used in such substations are large structures with numerous branches and must extend a considerable distance from the ground in order to avoid electrical breakdown (arcing), and more readily dissipate heat and prevent the risk of electrical fires and explosions. These voltage sensors are high cost, heavy, unwieldy structures that require countless man hours to install and maintain. Contrarily, groundless voltage sensors offer the benefit of a small form factor and do not introduce the safety hazard added by a creepage path where current can flow. Furthermore, groundless voltage sensors are relatively easy to install and maintain. However, current groundless voltage sensors are inaccurate, and in that respect they are more of a voltage estimator, than an actual metering tool. Furthermore, since groundless voltage sensors use infinity as a reference point, in reality, their ability to accurately measure voltage is heavily deprecated by external electrical fields (e.g. from neighboring power lines or other electrical equipment), calibration difficulties, background noise, etc.
In one aspect, a voltage sensing apparatus comprises a signal generator coupled to a first conducting layer and a conductive element, the conductive element having a first voltage. The first conducting layer is separated from the conductive element by an insulating layer. The signal generator is adapted to superimpose a second voltage to the first voltage. The voltage sensing apparatus also comprises a meter disposed between the first conducting layer and a second conducting layer or between the signal generator and the second conducting layer. An output parameter of the meter is a function of one or more of the group consisting of: the first voltage and the second voltage. The second conducting layer substantially surrounds a portion of the first conducting layer.
In another aspect, a method of voltage sensing comprises applying, through a signal generator coupled to a first conducting layer and a conductive element having a first voltage, a second voltage to the first voltage. The first conducting layer is separate from the conductive element by an insulating layer. The method of voltage sensing also comprises outputting a parameter being a function of one or more of the group consisting of: the first voltage and the second voltage. The meter is disposed between the first conducting layer and a second conducting layer or between the signal generator and the second conducting layer. The second conducting layer substantially surrounds the first conducting layer.
The embodiments of this invention are illustrated by way of example and not limitation in the figures of the accompanying drawings, in which like references indicate similar elements and in which:
Other features of the present embodiments will be apparent from the accompanying drawings and from the detailed description that follows.
Example embodiments, as described below, may be used to provide a device, a method and/or a system for a groundless voltage sensor.
Reference is now made to
d∂Q=dα·∂VL (Equation 1.1),
where Q represents the total charge induced on the infinitesimal plane 102. dα is a proportionality factor that depends on the geometry and material properties of the scenario and is of infinitesimal value since the infinitesimal plane 102 is infinitesimally small. Integrating Equation 1.1 yields:
dQ=dα·VL+dβ (Equation 1.2).
In Equation 1.2, dβ is a constant resulting from the integration over VL of Equation 1.1. The derivative over VL in Equation 1.1 is a partial derivative, thus, dβ is not an absolute constant, but only a constant as a function of VL. dβ is a function of the geometry and material properties of the scenario, and also a function dependent on external electric fields. On the other hand, dα is only a function of the geometry and material properties of the scenario, but does not depend on external electric fields. This last conclusion results from applying the principle of superposition to the fields generated by different charged elements.
Reference is now made to
Q=α·VL+β (Equation 1.3),
where α is a parameter that depends on the geometry and properties of the environment around the conductive ring 108. In other words, a is a measurement of the capacitive coupling of the conductive ring 108 to the rest of the universe. As such, a may change if elements of the surrounding environment change. To understand the meaning of β, let's consider what happens when the power line 100 is shorted to ground 110. Equation 1.3 yields:
Q=β (Equation 1.4).
If no external electric fields are present (such as at infinity), no charge would accumulate on the conductive ring 108 and thus β=0. Realistically, forces from external electric fields may cause charge to flow into the conductive ring 108 despite the fact that the conductive ring 108 is at ground potential. Applied to
In realistic conditions, Q depends on parameters α and β. Though the main contribution to Q is given by the term α·VL as shown in Equation 1.3, in order to accurately measure VL at any moment in time, both α and β must be measured in real-time. However, the effect of β must be largely ignored since the electric fields that it depends on can have any shape and can change quickly over time. For practical purposes, β behaves as a random variable with unknown distributions and correlations to measurable variables.
Reference is now made to
Q=α·VL+β (Equation 1.3).
In one embodiment, the sensing apparatus 200 may comprise a power line 202, the surface of which may be covered by an insulating sleeve 204. The insulating sleeve 204 may be subsequently covered by a conducting sleeve 206. The insulating sleeve 204 may insulate the power line 202 from the conducting sleeve 206. The power line 202 and the conductive sleeve 206 may be coupled in series with a signal generator 208. The signal generator 208 may inject a voltage signal, thus adding a known difference in potential between the power line 202 and the conducting sleeve 206. As in
In one embodiment, a method of measuring α in Equation 1.3 above may comprise injecting a voltage signal of a known magnitude between the power line 202 and the conducting sleeve 206 through the signal generator 208. The method may further comprise measuring, through the charge meter 214, an extra charge induced on the conductive ring 210 by the voltage signal. α may be a ratio between the extra charge induced on the conductive ring 210 to the voltage signal applied to the conductive sleeve 206. However, using such a method to measure α may lead to inaccurate measurements due to several reasons.
Reference is now made to
Reference is now made to
Summing the signal pulse 306 and the power line voltage 300 may yield
Reference is now made to
ΔQ1=α·(V1+ΔVL1−ΔVG)−α·(V1+ΔVG)=α·(ΔVL1−2·ΔVG) (Equation 3.1).
The change in the charge on the conductive ring 210 of the sensing apparatus 200 from t=t2 to t=t2+Δt is given by
ΔQ2=α·(V2+ΔVL2+ΔVG)−α·(V2−ΔVG)=α·(ΔVL2+2·ΔVG) (Equation 3.2).
V1 and V2 are the voltage of the power line 202 at times t1 and t2 respectively. ΔVL1 and ΔVL2 are the change on the voltage of the power line 202 going from t1 to t1+Δt, and going from t2 to t2+Δt, respectively. ΔVG is the size of the step voltage induced by the signal generator 208. If the signal pulse 310A from signal generator 208 is sufficiently fast such that ΔVG is larger than ΔVL1 and ΔVL2, then ΔQ1 will be negative and ΔQ2 will be positive. This is expected, as the induced voltages at t1 and t2 are of opposite polarity.
Subtracting Equation 3.1 from Equation 3.2 yields
ΔQ2−ΔQ1=4·α·ΔVG+α·(ΔVL2−ΔVL1) (Equation 3.3).
Averaging multiple signal pulses 310A yields
ΔQ2−ΔQ1=4·α·ΔVG+α·ΔVL2−ΔVL1 (Equation 3.4).
Focusing on the term ΔVL2−ΔVL1, ΔVL2 represents the change in the power line voltage 300 from t2 to t2+Δt and ΔVL1 represents the change in the power line voltage 300 from t1 to t1+Δt. Before averaging, (ΔVL2−ΔVL1) can be rewritten as
where m1 and m2 are the slopes of the voltage 302 as a function of time 304 (i.e. dV/dt) at t1 and t2, respectively. Since the change in slope at signal pulse 310A is higher than that of signal pulse 310B, the value of ΔVL2−ΔVL1 will be relatively larger.
Reference is now made to
Two ways to reduce the magnitude of (ΔVL2−ΔVL1) are to reduce the time length of the signal pulse generated by signal generator 208 and to switch the polarity of signal generator 208 very fast.
By reducing the time length of the signal pulse, the change in slope (m2−m1) would be reduced. This is already shown in
By using a signal generator 208 that can switch polarity very fast, Δt can be made very small, further reducing the size of the overall expression on the right side of Equation 3.5.
Although the above two methods reduce the magnitude (and thus, the effect) of (ΔVL2−ΔVL1), taking an average over multiple signal pulses is what cancels out the effect of the change of the power line voltage 300 in our measurement of a. Using a large sample size of signal pulses, the term ΔVL2−ΔVL1 becomes equal to zero. This is because for a sampling scheme not synchronized with the power line voltage 300, the contributing terms are equally likely to be positive or negative with equal amplitudes. Solving for a in Equation 3.4 and averaging enough samples to make ΔVL2−ΔVL1 converge to zero, we have:
where ΔQ1 and ΔQ2 are quantities measured by the charge meter 214 of the sensing apparatus 200 of
In one embodiment, a method of operating the sensing apparatus 200 of
In another embodiment, a real-time calibration method may be implemented in which the signal generator of the sensing apparatus 200 periodically injects signal pulses, and the parameter α may be corrected by a small amount after each signal pulse until the value of parameter α converges. As such, the sensing apparatus 200 may remain in measurement mode, and the data points used to calculate the parameter α may then be acquired together with the data points used to determine the voltage of the power line 202.
Reference is now made to
The sensing apparatus 400 may provide a means for real-time calibration and measurement of the parameter α. However, in practical situations where voltage is very high, the number of samples required to average the term ΔVL2−ΔVL1 increases steeply with the voltage to be measured. For example, a power line may transmit 500 kV at 60 Hz. The signal generator may utilize a sinusoidal calibration signal with a frequency of 20 kHz and a peak voltage of 10V. Let's estimate the number of samples needed to make ΔVL2−ΔVL1 negligible compared to 4·ΔVG in Equation 3.4.
The period of the sinusoidal calibration signal will be:
t2−t1=Δt=(½)·( 1/20 kHz)=25μs
ΔVL1 is the change in the power line voltage from t1 to t1+Δt and ΔVL2 is the change in the power line voltage from t2 to t2+Δt. For the power line voltage, we have:
VL(t)=A·Sin(w·t) (Equation 4.1),
where A=500 kV, and w=2·π·60 Hz. To simplify the calculation, let's call t0=t1+Δt. Thus:
ΔVL2−ΔVL1=A·[Sin(w(t0+Δt))−Sin(wt0)]−A·[Sin(wt0)−Sin(w(t0−Δt))] (Equation 4.2)
ΔVL2−ΔVL1=−2A·Sin(wt0)·[1·Cos(wΔt)] (Equation 4.3)
Equation 4.3 tells us that the maximum error will occur when Sin(wt0)=±1. Thus:
|ΔVL2−ΔVL1|MAX322A·[1−Cos(wΔt)] (Equation 4.4)
For a 500 kV power line at 60 Hz, using a 20 kHz calibration signal, the maximum error is 22V. In Equation 3.4, the term related to the effect of the calibration signal is 4·ΔVG=40V. In order to achieve a 0.1% accuracy when measuring the parameter α, enough samples must be average such that ΔVL2−ΔVL1≤40 mV. Using Equation 4.4 and assuming a flat distribution of samples from −22V to 22V, we have that in order to achieve 0.1% accuracy, we would need 100 k samples. Since we obtain a sample for every cycle of the 20 kHz calibration signal, it would take 5 seconds to collect around 100 k samples.
Although the result is feasible in practical situations, there are other contributing sources of error: the digitization error of the digitizer, the signal-to-noise ratio (SNR) of the digitizer, and the noise of the power line itself. Assuming a 16-bit digitizer over a full 500 kV range, the charge induced by the 10V calibration signal (ΔQ) will receive only 1 bit of resolution. The use of 16-bit digitizers is widely prevalent in the industry and is a cost-effective middle ground. As such, the use of higher-bit digitizers may not be feasible for everyday deployment. However, improvements to the sensing apparatus 400 may be introduced to reduce the number of samples needed by 1) increasing the resolution of the digitizer, 2) improving the SNR of the digitizer, and 3) reducing the noise of the power line.
Reference is now made to
The sensing apparatus 500 isolates the conducting sleeve 514 and the op-amp 502 from the rest of the sensing apparatus 500. The analog isolator 506 may be an IC such as a AMC1200 (made by Texas Instruments) and the power isolator 508 may be any isolated DC-to-DC converter. With this isolation, the effective calibration signal applied to the conducting sleeve 514 may be a higher value than the standard 10V typically used for low voltage electronics.
The low side of the step-up transformer 510 may connect between the output of the signal generator 512 and the power line 520. The high side of the step-up transformer 510 may connect between the conducting sleeve 514 and the power line 520. Using this configuration, the output of the step-up transformer 510 will then be the calibration signal (VG as in
where VG is included as an averaged value rather than a fixed value. For every sample collected, the change in charge (ΔQ2−ΔQ1) is measured together with the change in voltage VG. This stream of values would then be used to calibrate α.
Although the present embodiments have been described with reference to specific example embodiments, it will be evident that various modifications and changes may be made to these embodiments without departing from the broader spirit and scope of the various embodiments. For example, the various devices and modules described herein may be enabled and operated using hardware circuitry (e.g., CMOS based logic circuitry), firmware, software or any combination of hardware, firmware, and software (e.g., embodied in a non-transitory machine-readable medium). For example, the various electrical structure and methods may be embodied using transistors, logic gates, and electrical circuits (e.g., application specific integrated (ASIC) circuitry and/or Digital Signal Processor (DSP) circuitry).
In addition, it will be appreciated that the various operations, processes and methods disclosed herein may be embodied in a non-transitory machine-readable medium and/or a machine-accessible medium compatible with a data processing system. Accordingly, the specification and drawings are to be regarded in an illustrative rather than a restrictive sense.
A number of embodiments have been described. Nevertheless, it will be understood that various modifications may be made without departing from the spirit and scope of the claimed invention. In addition, the logic flows depicted in the figures do not require the particular order shown, or sequential order, to achieve desirable results. In addition, other steps may be provided, or steps may be eliminated, from the described flows, and other components may be added to, or removed from, the described systems. Accordingly, other embodiments are within the scope of the following claims.
It may be appreciated that the various systems, methods, and apparatus disclosed herein may be embodied in a machine-readable medium and/or a machine accessible medium compatible with a data processing system (e.g., a computer system or digital control unit), and/or may be performed in any order.
The structures and modules in the figures may be shown as distinct and communicating with only a few specific structures and not others. The structures may be merged with each other, may perform overlapping functions, and may communicate with other structures not shown to be connected in the figures. Accordingly, the specification and/or drawings may be regarded in an illustrative rather than a restrictive sense.
This application claims priority to U.S. Provisional Patent Application Ser. No. 62/195,477, filed Jul. 22, 2015, the entire disclosure of which is hereby expressly incorporated by reference herein.
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Number | Date | Country | |
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62195477 | Jul 2015 | US |