Self test device and self test method for reconfigurable device mounted board

Abstract

A self test device includes an operational element determining unit that calculates, based on operation parameters for the time of operation of a board on which a reconfigurable device is mounted, operational elements used in the devices of the board for the operation, and non-operational elements; an element assignment determining unit that assigns a self-test target from among the non-operational elements; and a testing unit that makes a test signal transmit through a test path that passes through the test target.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic of a reconfigurable device mounted board for which a self-test device performs a self test according to embodiments of the present invention;

FIG. 2 illustrates a table of elements necessary for an operation;

FIG. 3 is a block diagram of the self test device according to embodiments of the present invention;

FIG. 4 is a flowchart of a self test by the self test device;

FIG. 5A is a schematic for illustrating assignment of an element and a bus;

FIG. 5B is a schematic for illustrating the assignment of an element and a bus;

FIG. 5C is a schematic for illustrating the assignment of an element and a bus;

FIG. 6 is a schematic for illustrating an expected value checking test; and

FIG. 7 is a schematic for illustrating a loop back test.

Claims

1. A self test device that performs a self test of a board on which a reconfigurable device is mounted, the self test performed during an operation of the board, the self test device comprising: an element calculating unit configured to calculate operational elements to be used in a device of the board for the operation, and non-operational elements, based on operation parameters for a time of the operation of the board;an element assigning unit configured to assign an element to a self-test target from among the non-operational elements; anda testing unit configured to make a test signal transmit through a test path that passes through the self-test target to perform a test on the self-test target.

2. The self test device according to claim 1, wherein the operation parameters include an amount of data input to the board.

3. The self test device according to claim 1, further comprising a bus number calculating unit configured to calculate, based on the operation parameters, number of buses between devices, the buses necessary for the operation of the board, wherein the element assigning unit is configured to assign the test path that passes through the self-test target and the buses, by connecting devices with the buses based on the non-operational elements and the number of the buses.

4. The self test device according to claim 1, wherein the testing unit includes a test data generating unit configured to generate test data using elements located on the test path to send out to the test path; anda test checker configured to determine a failure site on the test path based on the test data received through the test path.

5. The self test device according to claim 4, wherein the test data includes a pseudorandom code and a fixed pattern, andthe test checker is configured to acquire a test result based on an expected value of the test data.

6. The self test device according to claim 4, wherein the test data generating unit and the test checker are provided in a single device, andthe testing unit is configured to perform a loop back test in which the test path passes through a second device other than the device on which the test data generating unit and the test checker are provided, and is returned at the second device.

7. The self test device according to claim 4, further comprising a failure notifying unit configured to notify the failure site to the element assigning unit and an external management apparatus based on a result of the test.

8. The self test device according to claim 1, wherein the element assigning unit is configured to reassign, when a result of the test is satisfactory, another element to the self-test target from among the non-operational elements, and to request reconfiguration of the board.

9. The self test device according to claim 1, wherein the element assigning unit is configured to reassign, when a result of the test is unsatisfactory, an operation path of the operational elements and the test path such that the failure site is bypassed, and to request reconfiguration of the board.

10. The self test device according to claim 1, wherein the element assigning unit is configured to assign test elements and matrix switch elements to the self-test target from among the non-operational elements.

11. A method of performing a self test of a board on which a reconfigurable device is mounted, the self test performed during an operation of the board, the method comprising: calculating operational elements to be used in a device of the board for the operation, and non-operational elements, based on operation parameters for a time of the operation of the board;assigning an element to a self-test target from among the non-operational elements; andperforming a test by transmitting a test signal through a test path that passes through the self-test target to perform a test on the self-test target.

12. The method according to claim 11, wherein the operation parameters include an amount of data input to the board.

13. The method according to claim 11, further comprising: calculating, based on the operation parameters, number of buses between devices, the buses necessary for the operation of the board; andassigning the test path that passes through the self-test target and the buses by connecting devices with the buses based on the non-operational elements and the number of the buses.

14. The self test device according to claim 11, further comprising: generating test data using elements located on the test path to send out to the test path; anddetermining a failure site on the test path based on the test data received through the test path.

15. The method according to claim 14, wherein the test data includes a pseudorandom code and a fixed pattern, andthe performing a test includes performing the test based on an expected value of the test data to obtain a test result.

16. The method according to claim 14, wherein the generating and the determining are performed in a single device, andthe performing a test includes performing a loop back test in which the test path passes through a second device other than the device in which the generating and the determining are performed, and is returned at the second device.

17. The method according to claim 14, further comprising notifying the failure site based on a result of the test.

18. The method according to claim 11, further comprising: reassigning, when a result of the test is satisfactory, another element to the self-test target from among the non-operational elements; andrequesting reconfiguration of the board.

19. The method according to claim 11, further comprising: reassigning, when a result of the test is unsatisfactory, an operation path of the operational elements and the test path such that the failure site is bypassed; andrequesting reconfiguration of the board.

20. The method according to claim 11, wherein the assigning an element includes assigning test elements and matrix switch elements to the self-test target from among the non-operational elements.