Number | Date | Country | Kind |
---|---|---|---|
2002-288531 | Oct 2002 | JP |
Number | Name | Date | Kind |
---|---|---|---|
5256591 | Jun | Oct 1993 | A |
5275965 | Manning | Jan 1994 | A |
5897361 | Egawa | Apr 1999 | A |
5994756 | Umezawa et al. | Nov 1999 | A |
6281081 | Chien et al. | Aug 2001 | B1 |
6436790 | Ito | Aug 2002 | B2 |
20020105034 | Iwata et al. | Aug 2002 | A1 |
20030107103 | Iwata et al. | Jun 2003 | A1 |
Number | Date | Country |
---|---|---|
05-304205 | Nov 1993 | JP |
11-26571 | Jan 1999 | JP |
11-176924 | Jul 1999 | JP |
Entry |
---|
G. Scott et al., NMOS Drive Current Reduction Caused By Transistor Layout And Trench Isolation Induced Stress, IEDM 99-827, pp. 34.4 1-34.4.4, 1999 IEEE. |