SEMICONDUCTOR DEVICE

Abstract

An object is to provide a technique capable of enhancing electrical characteristics and reliability of a semiconductor device. The semiconductor device includes a plurality of semiconductor chips, a plurality of electrodes each being electrically connected to each of the plurality of semiconductor chips, a sealing member, and a joint part. The sealing member covers the plurality of semiconductor chips, and parts being connected to the plurality of semiconductor chips, of the plurality of electrodes. The joint part is disposed outside the sealing member to electrically connect parts which are not covered by the sealing member, of the plurality of electrodes.

Description

TECHNICAL FIELD

The present invention relates to a semiconductor device in which semiconductor chips are covered by a sealing member.

BACKGROUND ART

Proposed is a semiconductor device in which a plurality of semiconductor chips are covered by a package (a sealing member) (for example, Patent Document 1).

PRIOR ART DOCUMENTS

Patent Documents

Patent Document 1: Japanese Patent Application Laid-Open No. 2005-12053

SUMMARY

Problem to be Solved by the Invention

Since capacity (current) in such a semiconductor device is increasing, it is required to operate a large number of semiconductor chips in the package evenly and parallely. As a result, it is desired to flow current evenly in each semiconductor chip and therefore adjust potentials of insulating substrates which mount the semiconductor chips. It is also desired to reduce an electrical oscillation (an oscillation) due to an unbalance of the potentials.

Furthermore, a configuration of adopting a resin such as a silicone gel to the package has a problem that expansion force of the resin in high temperature generates a negative influence on an electrical connection between the semiconductor chip and an electrode, thereby reducing a lifetime of the device.

The present invention therefore has been made to solve the above-mentioned problems and an object of the present invention is to provide a technique capable of enhancing electrical characteristics and reliability of a semiconductor device.

Means to Solve the Problem

A semiconductor device according to the present invention includes a plurality of semiconductor chips, a plurality of electrodes each being electrically connected to each of the plurality of semiconductor chips, a sealing member covering the plurality of semiconductor chips and parts being connected to the plurality of semiconductor chips, of the plurality of electrodes, and a joint part disposed outside the sealing member to electrically connect parts which are not covered by the sealing member, of the plurality of electrodes.

Effects of the Invention

According to the present invention, provided is the joint part disposed outside the sealing member to electrically connect parts which are not covered by the sealing member, of the plurality of electrodes. Accordingly, the electrical characteristics and reliability of the semiconductor device can be enhanced.

These and other objects, features, aspects and advantages of the present invention will become more apparent from the following detailed description of the present invention when taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF DRAWINGS

[FIG. 1] A plan view schematically illustrating a configuration of a part of a related semiconductor device.

[FIG. 2] A perspective view illustrating a configuration of a part of the related semiconductor device.

[FIG. 3] A diagram of the configuration of the part of the related semiconductor device seen from a side part of an electrode.

[FIG. 4] A perspective view illustrating a configuration of a part of a semiconductor device according to an embodiment 1.

[FIG. 5] A diagram of the configuration of the part of the semiconductor device according to the embodiment 1 seen from a side part of an electrode.

[FIG. 6] A perspective view illustrating a configuration of a part of a semiconductor device according to a modification example.

[FIG. 7] A diagram of the configuration of the part of the semiconductor device according to the modification example seen from a side part of an electrode.

[FIG. 8] A perspective view illustrating a configuration of a part of a semiconductor device according to a modification example.

[FIG. 9] A diagram of the configuration of the part of the semiconductor device according to the modification example seen from a side part of an electrode.

[FIG. 10] A perspective view illustrating a configuration of a part of a semiconductor device according to a modification example.

[FIG. 11] A diagram of the configuration of the part of the semiconductor device according to the modification example seen from a side part of an electrode.

[FIG. 12] A perspective view illustrating a configuration of a part of a semiconductor device according to a modification example.

[FIG. 13] A diagram of the configuration of the part of the semiconductor device according to the modification example seen from a side part of an electrode.

DESCRIPTION OF EMBODIMENT(S)

Embodiment 1

Described firstly is a semiconductor device relating to a semiconductor device according to the embodiment 1 of the present invention (referred to “the related semiconductor device” hereinafter) before the semiconductor device according to the embodiment 1 is described.

FIG. 1 is a plan view schematically illustrating a configuration of a part of the related semiconductor device. The related semiconductor device in FIG. 1 includes an insulating substrate 1, a plurality of semiconductor chips 2, and a plurality of electrodes 3.

The plurality of semiconductor chips 2 is mounted on the insulating substrate 1. In the description hereinafter, the number of the plurality of semiconductor chips 2 are two, however, three or more is also applicable as matter of course. The semiconductor chips 2 may include a semiconductor made of silicon, or may include a wide band gap semiconductor made of silicon carbide, gallium nitride, or diamond, for example.

Each of the plurality of electrodes 3 is electrically connected to each of the plurality of semiconductor chips 2. FIG. 2 is a perspective view illustrating a configuration of a part of the related semiconductor device (a peripheral part of the electrodes 3). In the description hereinafter, the electrode 3 is electrically connected to the semiconductor chip 2 (not shown in FIG. 2) via a metal member such as a connection part 4 provided on the insulating substrate 1, for example. However, the configuration is not limited thereto, but the electrode 3 may be directly connected to the semiconductor chip 2, for example.

The electrode 3 has substantially a long-plate shape. One end portion 3a of the electrode 3 in a longitudinal direction has a tapered shape, and is connected to the connection part 4. The other end portion 3b of the electrode 3 in the longitudinal direction has a through hole, and is connected to an electrical component such as a bus bar or a capacitor (not shown).

FIG. 3 is a diagram of the configuration of the part of the related semiconductor device (the peripheral part of the electrodes 3) seen from a side part of the electrode 3 having substantially the long-plate shape. The related semiconductor device includes a sealing ember 5 made of a resin such as a silicone gel, for example. The sealing member 5 has a configuration of covering the plurality of semiconductor chips 2 (not shown in FIG. 3) and the parts being connected to the plurality of semiconductor chips 2 (one end portions 3a), of the plurality of electrodes 3.

Since the plurality of electrodes 3 are insulated from each other in the related semiconductor device having the above configuration, there is a problem that current cannot flow in the plurality of semiconductor chips 2 evenly and parallely. Moreover, an unbalance of potentials in the plurality of electrodes 3 is relatively large, so that there is a problem that an electrical oscillation due to the unbalance is relatively large.

In the meanwhile, the semiconductor device according to the present embodiment 1 described hereinafter is capable of solving those problems. The same reference numerals as those described in the embodiment 1 will be assigned to the same or similar constituent element described in the description hereinafter, and the different constituent elements are mainly described.

FIG. 4 is a perspective view illustrating a configuration of a part of the semiconductor device according to the present embodiment 1, and FIG. 5 is a drawing of the configuration of the part of the semiconductor device seen from a side part of the electrode 3. FIG. 4 and FIG. 5 correspond to FIG. 2 and FIG. 3, respectively. The semiconductor device according to the present embodiment 1 includes a joint part 6. The joint part 6 cannot be actually seen from the side part of the electrode 3, however, joint part 6 is indicated by a region filled in black color for convenience in FIG. 5 and the subsequent drawings similar to FIG. 5.

The joint part 6 electrically connects parts which are not covered by the sealing member 5, of the plurality of electrodes 3. In the present embodiment 1, the joint part 6 is located between two adjacent electrodes 3 to connect the two adjacent electrodes 3. The joint part 6 has a long-plate shape (flat-plate shape), and a surface of the joint part 6 and a surface of the electrode 3 form one flat surface as illustrated in FIG. 5. The electrode 3 and the joint part 6 having such a configuration can be formed by a press working, for example.

The joint part 6 is disposed above the sealing member 5. However, the configuration of the joint part 6 is not limited thereto, but any configuration is applicable as long as the joint part 6 is disposed outside the sealing member 5.

In the semiconductor device according to the present embodiment 1 having such a configuration, the joint part 6 electrically connects the plurality of electrodes 3. According to such a configuration, the potentials of the plurality of electrodes 3 are equalized, thus an amount of current flowing into the metal member such as the connection part 4 located on the insulating substrate 1 and flowing into the plurality of semiconductor chips 2 can be equalized. That is to say, a branch current can be improved. The unbalance of the potentials in the plurality of electrodes 3 can be suppressed, thus the effect of suppressing the electrical oscillation can also be expected. Accordingly, the electrical characteristics of the semiconductor device can be enhanced.

Assumed herein is a configuration that the joint part 6 is located in the sealing member 5 as a different configuration from that of the present embodiment 1. In such a configuration, when the sealing member 5 expands, expansion force acts in a direction of distancing the joint part 6 from the insulating substrate 1. That is to say, the expansion force of peeling off the electrode 3 from the connection part 4 occurs. In the meanwhile, in the present embodiment 1, the joint part 6 is disposed outside the sealing member 5. The influence of the expansion force can be therefore suppressed, thus the reliability of the semiconductor device at the time of the temperature rise can be enhanced, and then the lifetime of the semiconductor device can be increased.

Modification Example

The shape of the joint part 6 is not limited to the patternless long-plate shape as illustrated in FIG. 4 and FIG. 5. For example, as illustrated in FIG. 6 and FIG. 7, slits may be formed in the flat surface of the joint part 6. According to such a configuration, a possibility of operating the plurality of semiconductor chips equally and parallely can be enhanced. When the number of slits is adjusted, the effect of obtaining the more appropriate electrical characteristics can be expected.

As illustrated in FIG. 8 and FIG. 9, the joint part 6 may have a wavelike shape having a constant width in a planar view. The planar view herein indicates that the joint part 6 is seen from an out-of-plane direction of the joint part 6. According to such a configuration, a movement (a difference of the movement) of the two electrodes 3 joined by the joint part 6 at the time of the thermal expansion can be reduced. As a result, stress applied to the connection part 4 can be reduced.

As illustrated in FIG. 10 and FIG. 11, the joint part 6 may have a truss shape in a planar view. According to such a configuration, a mechanical strength and flexibility of the joint part 6 can be enhanced. As a result, a distance D between the two electrodes 3 joined by the joint part 6 can be increased.

As illustrated in FIG. 12 and FIG. 13, for example, an outline of one end portion 6a on the sealing member 5 side (on the connection part 4 side) in both end portions which are not connected to the electrodes 3, in the joint part 6, may have a curved shape protruding toward an inner side of the joint part 6. That is to say, the joint part 6 may have an arch shape in a planar view. According to such a configuration, as illustrated in FIG. 13, for example, the electrode 3 can equally receive a load F caused by the electrical component such as the bus bar or the capacitor. As a result, a balance of the stress applied to the connection part 4 can be controlled.

According to the present invention, the above embodiments can be appropriately varied or omitted within the scope of the invention.

The present invention has been shown and described in detail, the foregoing description is in all aspects illustrative and not restrictive. It is therefore understood that numerous modifications and variations can be devised without departing from the scope of the invention.

EXPLANATION OF REFERENCE SIGNS

2 semiconductor chip, 3 electrode, 5 sealing member, 6 joint part

Claims

1. A semiconductor device, comprising: a plurality of semiconductor chips;a plurality of electrodes each being electrically connected to each of the plurality of semiconductor chips;a sealing member covering the plurality of semiconductor chips and parts being connected to the plurality of semiconductor chips, of the plurality of electrodes; anda joint part disposed outside the sealing member to electrically connect parts which are not covered by the sealing member, of the plurality of electrodes, whereinthe plurality of electrodes and the joint part are made up of a single member.

2. The semiconductor device according to claim 1, wherein the joint part has a flat-plate shape, andthe joint part is located between two of the plurality of electrodes adjacent to each other to connect the two of the plurality of electrodes.

3. The semiconductor device according to claim 2, wherein a slit is formed in a flat surface of the joint part.

4. The semiconductor device according to claim 2, wherein the joint part has a wavelike shape in a planar view.

5. The semiconductor device according to claim 2, wherein the joint part has a truss shape in a planar view.

6. The semiconductor device according to claim 2, wherein an outline of one end portion on the sealing member side in both end portions which are not connected to the plurality of electrodes, in the joint part, has a curved shape protruding toward an inner side of the joint part.