The present invention relates to a semiconductor device capable of improving the assembly efficiency and quality.
Conventionally, assembling for a product is performed in a state where the nuts are placed in a case. There is, therefore, a need to simultaneously connect the case and electrodes to a wiring substrate in a state where the electrodes are inserted in the case, or to attach the case after joining the electrodes.
Patent Literature 1: Japanese Patent Laid-Open No. 2011-66255
In a case where electrode joining and case attachment are simultaneously performed, however, the case is obstructive to cleaning and quality check of the electrode joint portions and reduces the facility with which the cleaning and the quality check are performed. In a case where case attachment is performed after electrode joining, the electrodes are bent after the case attachment and a fault such as a bent defect of the electrodes or a crack in the case resulting from stress caused in the case at the time of electrode bending is caused. Thus, there is a problem of the assembly efficiency and the quality being reduced.
A device for inserting a nut box in a bent portion of an electrode has been proposed (see, for example, Patent Literature 1). However, the nut box is not fixed on the electrode; the nut box comes off from the bent portion; and it was, therefore, impossible to improve the assembly efficiency.
The present invention has been achieved to solve the above-described problem, and an object of the present invention is to provide a semiconductor device capable of improving the assembly efficiency and quality.
A semiconductor device according to the present invention includes: a wiring substrate; an electrode having an opening and a bent portion and joined to the wiring substrate; a nut box having a nut and inserted in the bent portion of the electrode so that the nut is positioned in alignment with the opening of the electrode.; and a case covering the wiring substrate, wherein the nut box and the case are members separate from each other, and the nut box is fixed in the electrode so as not to come off from the bent portion.
The present invention makes it possible to improve the assembly efficiency and quality.
A semiconductor device according to the embodiments of the present invention will be described with reference to the drawings. The same components will be denoted by the same symbols, and the repeated description thereof may be omitted.
An electrode 3 is joined to a wiring substrate 2 on which a plurality of semiconductor elements 1 are mounted. The electrode 3 has openings 4 and a bent portion 5. A nut box 7 with nuts 6 is inserted in the bent portion 5 of the electrode 3. The nuts 6 in the nut box 7 are positioned in alignment with the openings 4 of the electrode 3. The electrode 3 is made of a metallic material for example. The nut box 7 is made of a resin material for example. A case 8 is attached to the wiring substrate 2 so as to cover the plurality of semiconductor elements 1 on the wiring substrate 2. The nut box 7 and the case 8 are members separate from each other.
The electrode 3 has a supporting portion 9 for supporting the nut box 7. An indentation 10 is provided in the supporting portion 9. On the other hand, the nut box 7 has a projection 11. The nut box 7 is fixed in the electrode 3 by fitting the projection 11 of the nut box 7 in the indentation 10 of the supporting portion 9. That is, the nut box 7 is fixed in the electrode 3 so as not to come off from the bent portion 5.
A lead 12 for leading the projection 11 of the nut box 7 into the indentation 10 is provided in the supporting portion 9. The lead 12 is a slope portion provided at the distal end of the supporting portion 9. The projection 11 touches this portion when the nut box 7 is inserted in the bent portion 5 of the electrode 3.
The effects of the present embodiment will be described in comparison with a comparative example.
In a case where electrode joining and case attachment are simultaneously performed, however, the case 8 is obstructive to cleaning and quality check of the electrode 3 joint portions and reduces the facility with which the cleaning and the quality check are performed. In a case where case attachment is performed after electrode joining, the electrodes 3 are bent after the case attachment and a fault such as a bent defect of the electrodes 3 or a crack in the case 8 resulting from stress caused in the case 8 at the time of electrode bending is caused. Thus, there is a problem of the assembly efficiency and the quality being reduced.
In contrast to this, in the present embodiment, the process step of attaching the electrodes to the wiring substrate 2 and the process step of attaching the case 8 to the wiring substrate 2 can be prepared separately from each other. Therefore, it is not necessary that the case 8 be in the state of being attached to the wiring substrate 2 when cleaning and quality check are performed after the electrodes 3 are joined to the wiring substrate 2, thus avoiding reducing the facility with which cleaning and quality check are performed. Also, since the nut box 7 is fixed in the electrode 3, it does not come off from the bent portion 5 at the time of assembly and at the time of use of the product. Thus, the assembly efficiency is improved. Since there is no need to bend the electrodes 3 after attachment of the case, no bent defect of the electrodes 3 and no crack are caused and an improvement quality is achieved.
The provision of the lead 12 in the supporting portion 9 improves the facility with which the nut box 7 is inserted in the bent portion 5 of the electrode 3, thereby achieving a further improvement in assembly efficiency.
Filing Document | Filing Date | Country | Kind |
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PCT/JP2013/058048 | 3/21/2013 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2014/147787 | 9/25/2014 | WO | A |
Number | Name | Date | Kind |
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20110069458 | Nakao et al. | Mar 2011 | A1 |
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20150235965 | Kodaira | Aug 2015 | A1 |
Number | Date | Country |
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2009-081255 | Apr 2009 | JP |
2011-066255 | Mar 2011 | JP |
2011-228351 | Nov 2011 | JP |
1998-0045131 | Sep 1998 | KR |
10-2012-0017902 | Feb 2012 | KR |
2012124209 | Sep 2012 | WO |
2013015031 | Jan 2013 | WO |
Entry |
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International Search Report, PCT/JP2013/058048, Jun. 11, 2013. |
Written Opinion of the International Searching Authority, PCT/JP2013/058048, Jun. 11, 2013. |
Notification of Transmittal of Translation of the International Preliminary Report on Patentability and Translation of Written Opinion of the International Searching Authority; PCT/JP2013/058048 issued on Oct. 1, 2015. |
An Office Action issued by the Korean Patent Office on Aug. 26, 2016, which corresponds to Korean Patent Application No. 10-2015-7025707 and is related to U.S. Appl. No. 14/655,011; with English language translation. |
Number | Date | Country | |
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20150351276 A1 | Dec 2015 | US |