(1) Field of the Invention
This invention relates to a compressed ball/pad region layout grid or matrix for printed circuit boards which will carry integrated circuits and possibly other circuit components. The layout allows spacing for conductors and accommodates high density spacing for integrated circuit pads.
(2) Description of the Related Art
U.S. Pat. No. 7,652,379 B2 to Poddar describes a bond pad stack having two conductor layers below a third conductor layer. The third conductor layer has a width that is greater than the width of each of the two conductor layers below the third layer.
U.S. Pat. No. 7,495,296 B2 to Maeda et al. describes a layout of a multi-channel semiconductor integrated circuit having ternary circuits in order to increase the degree of integration.
U.S. Pat. No. 6,168,854 B1 to Gibbs describes a method of manufacturing printed circuit boards having high density conductive patterns comprising at least one pad suitable for forming a solder connection with at least one surface mounted component. A process is also described which applies a resist to a conductive pattern, etching the conducting pattern, and using the resist to form a conducting coating on the conducting pattern.
U.S. Pat. No. 6,057,601 to Lau et al. describes a semiconductor ball grid array package for integrated circuits which have input and output counts higher than 250. The package includes a supporting heat spreader layer having a plurality of saw teeth to penetrate an adhesive layer covering a plurality of ground planes. These ground planes are formed on a backside of a substrate supporting a semiconductor device such that the heat spreader can function as a ground terminal for the semiconductor device.
U.S. Pat. No. 5,818,114 to Pendse et al. describes a radially staggered bonding pad arrangement around the center of a semiconductor die. The bonding pad arrangement allows for increased lead frame density used for wire bonding conductors between the semiconductor circuit pads and the staggered bonding pad arrangement.
U.S. Pat. No. 5,567,655 to Rostoker et al. describes a bond pad layout on semiconductor circuit chips which reduces thermally induced mechanical stresses. The bond pads are equidistant from the centerline of the chip. Bond pads on either side of the centerline are staggered.
Today's standard IC (integrated circuit) package ball/pad region layout is defined by a regular pitch in the x and y direction, as shown in
ICs with a single outside row and/or column of balls/pads may be routed on a PCB (printed circuit board) using a single outer layer of metal. To route ICs with a higher number of rows/columns the PCBs typically have to use multiple layers of metal. Inner rows/columns are then routed on the outside layer only towards a close placed via, which then allows a further signal routing inside a deeper PCB layer. Vias are drilled holes with a layer of copper at the circumference. Standard vias are mechanically drilled and have a typical minimum hole diameter of 200-300 um. Because of mechanical tolerances the connected landing pads of standard vias are typically ≧550 um.
Following the trend for miniaturization and reduced PCB space the ball/pad pitch of ICs with a higher level of integration has been reduced from 0.8 mm and 0.65 mm towards 0.5 mm and 0.4 mm with plans to go even towards 0.3 mm. This has created some challenges for the signal routing on the PCB. But from 0.5 mm pitch standard vias can no longer be placed between balls/pads. For about 0.4 mm or smaller ball/pad pitch it is no longer possible to route signals between regular spaced balls/pad regions.
It is a principal objective of this invention to provide a ball/pad layout scheme that meets manufacturing requirements for a small regular ball/pad region grid and provides additional space between ball/pad regions for increased wiring capability.
This objective is achieved by using a different x and y ball/pad pitches in local areas of the integrated circuit package. A staggered ball/pad region pitch arrangement is used to achieve a reduced pitch in one direction while maintaining a minimum ball to ball (pad to pad) distance. A ball/pad region pitch of about 0.5 mm can be used in the x direction and a pitch of about 0.32 mm in the y direction with alternating rows locating balls/pads at the gaps of adjacent rows. This provides a spacing of about 0.4 mm between nearest balls/pads in adjacent rows. A different ball/pad region pitch can be used in other regions of the integrated circuit package.
Refer now to
Refer now to
Those skilled in the art will readily recognize that different values for the first distance 24 and second distance 30 can be used, which will provide a different third distance 28 for separation between nearest neighbor ball/pad regions. For example a first distance 24 of 0.58 mm and a second distance 30 of 0.29 mm results in a third distance 28 of about 0.41 mm.
While the invention has been particularly shown and described with reference to the preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made without departing from the spirit and scope of the invention.
Number | Date | Country | Kind |
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11368010.2 | Mar 2011 | EP | regional |