Electrical connections in semiconductor and electronic components are often made using a protrusion or “ball” of conducting solder, such balls are well known in the industry. They are typically bonded to a pad on a component or Silicone Chip or Silicone Wafer, again these being well known to those experienced in the art. Currently the diameter of the balls ranges from 1 mm to 0.040 mm but future sizes are expected to follow the established trend and become still smaller. The balls are also commonly arranged to be adjacent to each other in the form of complete or partial two dimensional matrixes. The pitch between balls varies but is in the order of two times their diameter. Such balls are often tested by gripping them with a pair of special tweezers and then pulling them to test the strength of their bond to the pad. Such tweezers are usually connected to a load cell and the quality of the bond can then be graded by the force to failure.
To test the bond it is desirable to grip the ball so that the highest possible pull force can be exerted on to the bond. Prior art exists for this using a cavity in each of the opposing jaws of the tweezers that reforms the ball as the jaws close around it. This system is known as CBP, standing for “Cold Ball Pull” or “Cold Bump Pull”.
A problem exists where during repeated use the cavity of the jaws starts to build up with solder. The shape of the cavity is very important and the build-up of solder adversely affects the test performance by reducing the maximum force that can be exerted on to the bond. Because of their small size, cleaning the solder out of the cavities is very difficult. Mechanically cleaning them requires very small tools and very precise alignment of the cleaning tool to the cavity. Such cleaning methods are time consuming and can damage the cavities. This invention provides a means to easily clean the build-up of solder out of the cavities.
According to a first aspect of the present invention there is provided a method of cleaning solder from the jaws of a solder ball test device, the method comprising the steps of:
The gas is heated to a temperature sufficient to melt the solder. It will be appreciated that the temperature to which the gas is heated is below the melting temperature of the material of the jaws. The velocity of the heated gas exiting the nozzle assists in the removal of solder from the jaws.
The step of heating the gas may comprises the steps of:
The heat exchanger may include an electrical heater cartridge. The outlet nozzle may has a typical bore diameter of between 0.5 mm and 1.5 mm. The pressure of the heated gas at the exit from the nozzle may be in the region of 2 to 5 bar. The gas may be heated to a typical temperature of between 200 degrees Centigrade and 500 degrees Centigrade.
The method may further include the step of moving the jaws in the heated gas.
According to a further aspect of the present invention there is provided an apparatus for cleaning solder from the jaws of a solder ball test device, the apparatus including a heat exchanger and a body enclosing the heat exchanger such that a volume is enclosed between the body and the heat exchanger, the apparatus further including an inlet to the volume and an outlet nozzle in fluid communication with said volume wherein, in use, gas under pressure introduced to the volume is heated by the heat exchanger such that heated gas is delivered through the nozzle.
The heat exchanger may include an electrical heater cartridge. The outlet nozzle may have a typical bore diameter of between 0.5 mm and 1.5 mm. The pressure of the heated gas at the exit from the nozzle may be in the region of 2 to 5 bar. The gas may be heated to a typical temperature of between 200 degrees Centigrade and 500 degrees Centigrade.
The apparatus may further include a temperature sensor. The apparatus may further include a heat guard to protect users of the apparatus. The heat guard may include a box to receive molten solder released from the jaws by the heated gas.
Features of the invention will be apparent from the following description of a preferred embodiment described with reference to the accompanying drawings in which:
Under the pressure generated by a pump, a pressurised storage cylinder or other such means, gas flows into the volume 13 through an inlet 14 and over the heat exchanger 2. The temperature of the gas 5 is raised above that of the melting point of solder. The heated gas 5 then exits out of a nozzle 6 of the body 4. The gas exiting out of the nozzle is subsequently used to melt the solder in the cavities 11 of the jaws 8. The velocity of the gas 5 assists in moving the melted solder out of the cavities and away from the jaws 8.
The jaws 8 to be cleaned are only slightly larger than the solder balls 10, typically less than 1 mm. To melt the solder in the cavities 11 the diameter of the heated gas jet does not need to be large; the nozzle 6 bore diameter may typically be between 0.5 to 1.5 mm. The jet though does need to have a relatively high velocity. The total pressure at exit from the nozzle 6 may thus be in the region of 2 to 5 bar.
In a preferred embodiment, the heater 1 is an electrical heater cartridge with its temperature being controlled by a temperature sensor placed in close proximity to it; for example in a hole or aperture 7 extending through the body 4 and into the heat exchanger 2.
In preferred embodiments, the heat exchanger 2 is made from a material with a relatively high heat conductivity whereas the body 4 and support 9 would be preferably, but not exclusively, be made from a material with lower heat conductivity. In a preferred embodiment the assembly would be mounted within a heat guard to protect operators from the hot gas and components. The guard would have a hole in it allowing the jaws 8 to be placed into the hot gas jet for cleaning. The guard may also include a box that the molten solder removed from the jaws 8 is captured in for safe disposal.
Effective cleaning of the cavities 11 requires the jaws 8 to be moved and rotated in the hot gas jet. This can be done manually or by mounting the cleaning system on the same machine that the jaws 8 are used on thereby providing an automatic cleaning station.
Number | Date | Country | Kind |
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1413225.2 | Jul 2014 | GB | national |
Filing Document | Filing Date | Country | Kind |
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PCT/EP2015/066389 | 7/17/2015 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2016/012357 | 1/28/2016 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
3773261 | Helton | Nov 1973 | A |
4022370 | Durney | May 1977 | A |
4136444 | Durney | Jan 1979 | A |
4625355 | Miyashita | Dec 1986 | A |
5969262 | Ino | Oct 1999 | A |
6237422 | Sykes | May 2001 | B1 |
6273317 | Arai | Aug 2001 | B1 |
6685080 | Kee | Feb 2004 | B1 |
7617962 | Kajii | Nov 2009 | B2 |
20020033409 | Cilia | Mar 2002 | A1 |
20020042960 | Hayashi | Apr 2002 | A1 |
20020121149 | Lee | Sep 2002 | A1 |
20040099709 | Chin | May 2004 | A1 |
20060231834 | Yeh | Oct 2006 | A1 |
20080212067 | Gupta | Sep 2008 | A1 |
20080313879 | Jadhav | Dec 2008 | A1 |
20090019941 | Sykes | Jan 2009 | A1 |
20090056469 | Sykes | Mar 2009 | A1 |
20090139303 | Zhang | Jun 2009 | A1 |
20090301216 | Sykes | Dec 2009 | A1 |
20110127316 | Dunlop | Jun 2011 | A1 |
20110214510 | Lilley | Sep 2011 | A1 |
20130099811 | Lee | Apr 2013 | A1 |
20130314117 | Gardell | Nov 2013 | A1 |
Number | Date | Country |
---|---|---|
24 40 005 | Feb 1975 | DE |
2440005 | Feb 1975 | DE |
635 329 | Jan 1995 | EP |
2 386 846 | Nov 2011 | EP |
WO-2005093436 | Oct 2005 | WO |
Entry |
---|
English Machine Translation for DE2440005. |
EPO International Search Report for PCT/EP2015/066389 dated Sep. 23, 2015. |
Number | Date | Country | |
---|---|---|---|
20170209903 A1 | Jul 2017 | US |