This disclosure relates to systems for forming thin-film layers on substrates using plasma enhanced deposition process.
Traditional plasma physical vapor deposition (PVD) chambers decompose precursor gases to thereby ignite and maintain plasma and accelerate particles from the plasma towards a target having a layer of material to be deposited as a desired thin film on a substrate. However, a bi-product of the plasma process includes electrically insulating species, that can cling to various parts of the chamber and form an insulation layer. As such electrically insulating film accumulates on ground surfaces within the process chamber, the anode in the plasma circuit diminishes in viability. As the firm accumulates and the anode is coated with insulation, the plasma becomes less stable and predictable, and leads to some or all of the following: high incidence of arcing, poor film uniformity, and decreased deposition rate. The arcing rate corresponds directly to the amount of particulation that degrades the thin film quality on the substrate and the overall usefulness of the deposition process.
Cathode design for sputtering system has been previously disclosed, which provides enhanced plasma confinement. The reader is directed to, e.g., U.S. Pat. No. 11,456,162, Harkness I V et al., for example of a cathode design. However, in order to provide continuous ground path in a plasma chamber, it would be beneficial to design an anode structure that prevents accumulation of insulation particles thereupon.
The following summary of the invention is included in order to provide a basic understanding of some aspects and features of the invention. This summary is not an extensive overview of the invention, and as such it is not intended to particularly identify key or critical elements of the invention, or to delineate the scope of the invention. Its sole purpose is to present some concepts of the invention in a simplified form as a prelude to the more detailed description that is presented below.
Disclosed embodiments provide an anode design that preserves conductive ground surfaces by physically shadowing in such a manner as to inhibit coating species from accumulating, while still remaining available to impacting plasma electrons. According to embodiments, an anode design is disclosed in which attraction of charged species to the uncoated regions is avoided by the incorporation of magnetic field lines that thereby re-direct species off linear trajectories. The magnetic lines further filter electrons from coating material species. This phenomenon may be limited by the spatial area remaining still conductive after coating action. Furthermore, as anode current focuses into these narrow spaces, the amount of resultant Joule heating jeopardizes process stability. If the magnet structure used to generate the anode-going fields increases in temperature, there may be field loss due to the Curie Effect.
Aspects of this disclosure include an anode for a plasma chamber, having an anode block having a front surface to face a plasma and a rear surface to face away from the plasma; a magnet positioned within the anode block and generating magnetic field lines extending outwardly from the front surface of the anode block; and an electron filter bar spaced apart and extending over the front surface of the anode block and intercepting at least part of the magnetic field lines.
Aspect of the disclosure further include an anode for a plasma chamber, the anode incorporating an electron filter having exposed surface facing the plasma region within the plasma chamber and a hidden surface facing away from the plasma region, the electron filter generating a mirroring effect to deflect electrons from the plasma onto the hidden surface. The electron filter preferably maintains magnetic mirror ratio (r=B(max)/B(min), where B is the magnetic field intensity) greater than 10, and more preferably greater than 100. The electron filter may generate the mirroring effect by incorporating a magnet having strength greater than 30 MGOe.
Disclosed embodiments provide an anode for a plasma chamber, comprising an anode block having a front surface facing plasma within the plasma chamber and a back surface facing away from the plasma, the anode block having a cavity open to the back surface; a magnet positioned within the cavity, the magnet being smaller than the cavity such that the magnet does not physically contact any part of the anode block; and at least one filter bar having a free end positioned over and spaced from the front surface, the filter bar having electrical contact to ground potential.
In a related aspect, disclosed embodiments provide a plasma processing chamber comprising: a vacuum enclosure; a cathode having a target of sputtering material mounted thereupon, the cathode positioned within the vacuum enclosure; a gas injector; at least one anode, the anode having an anode block and a magnet positioned within the anode block, the magnet generating magnetic field lines leading from the anode block to the cathode, the anode further comprising a filter bar coupled to ground potential and positioned to intercept part of the magnetic field lines.
Disclosed aspects also provide a plasma processing chamber comprising: a vacuum enclosure; two cathodes positioned within the vacuum enclosure, each cathode having a rotating cylindrical target with coating of sputtering material and a magnetron positioned within the cylindrical target; a gas injector positioned on a ceiling of the vacuum enclosure between the two cathodes; at least one anode attached to sidewall of the vacuum enclosure, the anode having an anode block and a magnet positioned within the anode block, the magnet generating magnetic field lines leading from the anode block to the cathode, the anode further comprising a filter bar forming a peninsular extension attached to the anode block at its isthmus and defining a hollow area between the anode block and the filter bar.
The accompanying drawings, which are incorporated in and constitute a part of this specification, exemplify the embodiments of the present invention and, together with the description, serve to explain and illustrate principles of the invention. The drawings are intended to illustrate major features of the exemplary embodiments in a diagrammatic manner. The drawings are not intended to depict every feature of actual embodiments nor relative dimensions of the depicted elements and are not drawn to scale.
Embodiments of the inventive anode arrangements will now be described with reference to the drawings. Different embodiments may be used for processing different substrates or to achieve different benefits, such as throughput, film uniformity, target utilization, etc. Depending on the outcome sought to be achieved, different features disclosed herein may be utilized partially or to their fullest, alone or in combination with other features, balancing advantages with requirements and constraints. Therefore, certain features and benefits will be highlighted with reference to different embodiments, but are not limited to the disclosed embodiments, and the features may be incorporated in other embodiments or with other combinations.
Embodiments disclosed herein may be implemented in any plasma-based processing chamber, and are especially suitable for plasma enhanced physical vapor deposition (PVD or sputtering). The embodiments are beneficial for chambers wherein polymers, or other insulative materials, are formed as by products during the plasma process and coat the interior of the chamber. Also, the embodiments are beneficial in chambers wherein an anode forms a pathway for electrons, acting as a ground electrode. When such anodes are coated with the insulative material, the process is degraded due to the disruption of the path to ground. Disclosed embodiments avoid such degradation.
Plasma is ignited and maintained by injecting precursor gas from injector assembly 135, which also acts as anode, as will be explained with reference to
A typical use of the above-mentioned setup is to convert a material from the target's stoichiometry to a film comprising an adjusted oxidation state (compared to the original material). Such films generally become dielectric and often present opportunities in the fields of optics, tribology and diffusion to name a few. The most common practice involves introduction of reactive gases (e.g., O, N, H, etc.) during processing that ultimately form the desired bonding and resultant stoichiometry in the film, e.g., SiAlON. This process will often produce an excessive amount of electrons that may cause deleterious plasma damage and heating effects and thereby inhibit film quality. One remedy utilizes an engineered anode to collect the excessive flux and thereby remove it from possible film interaction. However, the adsorbate typically insulates all surfaces on the interior of the chamber and the anode is no exception. Therefore, the plasma tends to become unstable as the anode “disappears”, i.e., it's electrical potential with respect to the plasma is insulated by oxidation material build-up so that from the perspective of charged particles within the plasma, it doesn't exist.
As shown in
Cooling channels 9 are cut into the anode block 3 to allow coolant flow therein to control the temperature of the anode block 3. Additionally, gas delivery line 2 passes through the anode block and provides gas to at least one gas injection orifice 25. The one or more gas injection orifices are provided on a gas distribution plate 5 (also conductive material) that is attached to the top of the anode block 3 and is connected to the gas delivery line 2 to facilitate gas orifice 25 delivery of prescribed gas species to the vacuum environment. Drilled orifices of gas injector 25 are less than 2 mm and more preferably below 1.6 mm in diameter. Such specifications inhibit plasma formation within the plate 5 regardless of the possible electrical potential (as per Paschen's Law). Consequently, less secondary electron generation and consequently lower plasma density forms in the region surrounding the orifice. Also, the at least one orifice is collinear with the highest density of magnet field lines from the magnet 7.
Reverting to
Another embodiment of an anode 15 is shown positioned on the sidewall of the chamber, peripherally of the cathodes 13 and detailed in
Magnet 21 is inserted into cavity in the anode block and is attached to keeper plate 22, wherein no part of the magnet 21 or keeper plate 22 physically contacts the anode block 20, such that a vacuum break is formed between the magnet 21 and keeper plate 22 and the anode block 20. The filter bar 18 is positioned so as to partially cross the magnetic lines emanating from magnet 21, so that some of the magnetic field lines cross the filter bar 18 and some field lines do not cross filter bar 18. Consequently, electrons deflected by the magnetic field would impact the interior surface of the filter bar 18 that faces away from the plasma, and thus remains uncoated by insulating species.
In any of the disclosed embodiments, the anode block may be electrically connected to the chamber body and be at the same potential as the chamber body, e.g., ground potential. Conversely, as exemplified in
With this orientation, the two cathodes 13 impose a flux of adsorbate material upon a substrate 17 positioned on a tray or carrier, which is either stationary or continuously moving at a prescribed velocity (e.g., 1-300 mm/s). In this embodiment, the gas injection assembly 135 incorporating anode 16 is situates on the ceiling of the chamber, at a point midway between the twin cathodes 13, such that the gas injected from the gas injection assembly 135 flows to an area between the targets to maintain plasma between the targets. With this orientation of rotating targets, central gas injection, and symmetrical anodes, a stable process with controllable flow of charge ensues. An important aspect of the above design is further described regarding the confinement of cathode plasma. To ensure that a predominant proportion of the ground-going electron flow proceeds into the designed anode structure, magnetic confinement is required to prevent divergent flow away from such structures. The confinement can be parameterized by analysis of the corresponding current (I) vs. voltage (V) curves. In short, when a plasma is well confined, it takes less voltage to drive the electrons from the cathode to the anode. Therefore, it is necessarily found that the I-V curve slope is a credible statistic to analyze the confinement. Consequently, it is found that a slope of log(I) vs. log(V) greater than at least 3, and more preferable, greater than 4 adequately characterizes a well confined plasma.
In
The disclosed embodiments provide a deposition system comprising: a vacuum enclosure having sidewalls and ceiling, two sputtering targets positioned inside the vacuum enclosure and defining a plasma area therebetween, each of the sputtering targets having a front surface coated with sputtering material and a back surface, the front surface facing the plasma area; two magnetrons, each positioned behind the back surface of a corresponding one of the two targets; a gas injector mounted onto the ceiling and positioned centrally between the two targets; and a central anode mounted onto the ceiling and positioned centrally between the two targets, the central anode having an anode block and a magnet positioned within the anode block; wherein the two targets, the two magnetrons, and the anode confine plasma within the plasma area to have a slope of log(I) vs. log(V) greater than at least 3 or greater than 4. In embodiments the deposition system further comprises two peripheral anodes, each mounted onto the sidewall and positioned next to a corresponding one of the two targets, each of the peripheral anode comprising an anode block having a cavity, a magnet positioned within the cavity and generating magnetic field lines, and a cantilevered filter bar intercepting at least partially the magnetic field lines.
Also disclosed is a plasma chamber comprising a vacuum enclosure housing a target having a front surface facing a plasma region within the vacuum enclosure and a rear surface facing away from the plasma region, the front surface being coated with sputtering material; a magnetron positioned behind the rear surface igniting the plasma and confining the plasma to the plasma region; an anode position inside the vacuum enclosure and incorporating an electron filter having exposed surface facing the plasma region and a hidden surface facing away from the plasma region, the electron filter generating a mirroring effect to deflect electrons onto the hidden surface. In embodiments, the electron filter maintains magnetic mirror ratio (r=B(max)/B(min), where B is the magnetic field intensity) greater than 10, and more preferably greater than 100. In embodiments, the electron filter incorporates a magnet having strength greater than 30 MGOe. In embodiments, the target is shaped as elongated cylinder and the filter extends to the length of the target, wherein the magnet is formed as an array of magnets extending the length of the target.
While the disclosed embodiments are described in specific terms, other embodiments encompassing principles of the invention are also possible. Further, operations may be set forth in a particular order. The order, however, is but one example of the way that operations may be provided. Operations may be rearranged, modified, or eliminated in any particular implementation while still conforming to aspects of the invention.
All directional references (e.g., upper, lower, upward, downward, left, right, leftward, rightward, top, bottom, above, below, etc. are only used for identification purposes to aid the reader's understanding of the embodiments of the present invention, and do not create limitations, particularly as to the position, orientation, or use of the invention unless specifically set forth in the claims. Joinder references (e.g., attached, coupled, connected, and the like) are to be construed broadly and may include intermediate members between a connection of elements and relative movement between elements. As such, joinder references do not necessarily infer that two elements are directly connected and in fixed relation to each other.
In some instances, components are described with reference to “ends” having a particular characteristic and/or being connected to another part. However, those skilled in the art will recognize that the present invention is not limited to components which terminate immediately beyond their points of connection with other parts. Thus, the term “end” should be interpreted broadly, in a manner that includes areas adjacent, rearward, forward of, or otherwise near the terminus of a particular element, link, component, member or the like. It is intended that all matter contained in the above description or shown in the accompanying drawings shall be interpreted as illustrative only and not limiting. Changes in detail or structure may be made without departing from the spirit of the invention as defined in the appended claims.
It must be noted that as used herein and in the appended claims, the singular forms “a”, “an”, and “the” include plural referents unless the context clearly dictates otherwise.
As will be apparent to those of skill in the art upon reading this disclosure, each of the individual embodiments described and illustrated herein has discrete components and features which may be readily separated from or combined with the features of any of the other several embodiments without departing from the scope or spirit of the present invention.
This Application relates to and claims priority benefit from U.S. Provisional Application Ser. No. 63/434,048, filed on Dec. 20, 2022, and from U.S. Provisional Application Ser. No. 63/431,999, filed on Dec. 12, 2022, and from U.S. Provisional Application Ser. No. 63/431,984, filed on Dec. 12, 2022, and from U.S. Provisional Application Ser. No. 63/431,969, filed on Dec. 12, 2022, and from U.S. Provisional Application Ser. No. 63/431,621, filed on Dec. 9, 2022, and from U.S. Provisional Application Ser. No. 63/431,608, filed on Dec. 9, 2022, the disclosures of which are incorporated herein in their entirety.
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63434048 | Dec 2022 | US | |
63431999 | Dec 2022 | US | |
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63431608 | Dec 2022 | US |