The present invention relates to a substrate mount for a plasma processing apparatus. In particular, the invention relates to a substrate mount having replaceable inserts for modifying the substrate mount to be suitable for use with different substrates.
Plasma processing may include: plasma deposition, plasma surface activation, plasma etching and plasma cleaning, for example. The type of processing is determined by the plasma species generated which is mainly controlled/tuned by the feed gas and or precursor used. Plasma deposition is a known method for providing conformal coatings to substrates, such as electronics. Plasma surface activation is a known method for changing the surface (e.g. energy) properties of a substrate. Plasma etching is a known method for etching patterns in a substrate, e.g. to fabricate integrated circuits. Plasma cleaning is a known method of removing material from the surface of a substrate.
Plasma processing apparatuses generally comprise a process chamber and a plasma source for providing a plasma within the process chamber. A substrate, e.g. PCB, is placed within the chamber and interacts with the plasma, thus, is processed. In the case of plasma deposition for example, a coating of material formed from the plasma is deposited on the substrate.
The substrate to be processed is supported in the chamber by a substrate mount. These are usually in the form of an aluminium shelf on which the substrates are placed. For some applications, coating is require on opposite sides of the substrate. Therefore, substrates may be held within an aperture in the substrate mount so as to expose both sides of the substrate. The shape of the aperture is specific to the substrate being coated. This is because the aperture needs to hold a substrate of a specific shape but also because certain areas of the substrate may need to be masked so as not to be processed. Typically, the substrate is located within a flexible rubber gasket glued to the metal substrate mount. The gasket acts as a mask.
Substrate mounts are manufactured specifically for a particular substrate. Therefore, different substrate mounts are needed for different substrates. This can be very costly as new substrate mounts need to be made for each different substrate or if a substrate design changes.
The present invention aims to at least partly solve the above problems.
Accordingly, a first aspect of the present invention provides a substrate mount for a plasma processing apparatus comprising: a frame; an aperture within the frame, configured to accommodate an insert, the insert being configured to support a substrate for processing by the plasma processing apparatus; a releasable securing mechanism configured to releasably secure the insert within the aperture such that the insert can be replaced.
Optionally, the frame is formed from a single part. Alternatively, optionally, the frame comprises first and second frame parts, the first and second frame parts being configured to sandwich the insert therebetween.
Optionally, the releasable securing mechanism is configured to releasably secure the first frame part to the second frame part.
Optionally, the releasable securing mechanism is configured to releasably secure the insert to the frame.
Optionally, the securing mechanism comprises a spring element configured to provide a securing force. Optionally, the securing mechanism comprises an abutment member configured to apply the securing force therethrough. Optionally, the abutment member is also the spring element. Optionally, the spring element is separate from but connected to the abutment member. Optionally, the spring element comprises at least one of a coil spring, a leaf spring and a plate spring.
Optionally, the releasable securing mechanism is selectably configurable between a first arrangement configured to secure the insert and a second arrangement configured not to secure the insert.
Optionally, the releasable securing mechanism is configured to rotate between the first arrangement and the second arrangement. Alternatively, optionally, the releasable securing mechanism is configured to slide linearly between the first arrangement and the second arrangement.
Optionally, the releasable securing mechanism comprises a snap-fit mechanism.
Optionally, the aperture comprises a shelf member configured to support the insert within the aperture.
Optionally, the aperture has a rectangular cross-section normal an axis passing through the aperture.
Optionally, the substrate mount comprises a plurality of identical apertures.
According to a second aspect of the invention there is provided an insert configured to be used with the substrate mount of the previous aspect, comprising an aperture for accommodating the substrate.
Optionally, the insert comprises a first insert part and a second insert part, the first and second insert parts being configured to sandwich the substrate therebetween.
Optionally, the insert comprises an alignment member configured to align the first and second insert parts and, optionally, the substrate. Optionally, the alignment member is a rod configured to pass through through-holes in each of the first and second insert parts and, optionally, the substrate.
Optionally, the insert comprises a mask formed from a first material and configured to support the substrate such that a portion of the substrate is masked so as not to be processed by the plasma processing apparatus. Optionally, the first material is a flexible material.
Optionally, the insert comprises an insert frame formed from a second material and configured to support the mask. Optionally, the second material is a rigid material.
A third aspect of the invention provides a substrate mount according to the first aspect further comprising the insert according to the second aspect.
A fourth aspect of the invention provides a kit of parts comprising at least one substrate mount according to the first aspect and at least one insert according to the second aspect.
A fifth aspect of the invention provides a plasma processing apparatus for processing a substrate with a plasma, comprising: a processing chamber in which the processing takes place; and at least one substrate mount according to the first aspect or the third aspect.
Further features and advantages of the invention will be described below by way of non-limiting example and with reference to the accompanying drawings, in which:
The present invention provides a substrate mount for a plasma processing apparatus, comprising: a frame 1; an aperture 2 within the frame 1, configured to accommodate an insert 4, the insert 4 being configured to support a substrate 5 for processing by the plasma processing apparatus; a releasable securing mechanism 3 configured to releasably secure the insert 4 within the aperture 2 such that the insert 4 can be replaced.
Accordingly, inserts 4 specific to particular substrates 5 can be replaced by different inserts 4 within the substrate mount, thus avoiding the costly practice of needing a different substrate mount for each different substrate or combination of substrates 5. In other words, the substrate mount of the invention is a universal substrate mount for use with any substrate 5 or combination of substrates 5.
The first part 1A is placed on top of the second part 1B.
The frame 1 may be formed from a rigid material, preferably a metal, e.g. stainless steel, but preferably aluminium. In some cases, the frame 1 may be required to function as an electrode during plasma processing. The surface of the frame 1 comprises a plurality of through-holes 11, preferably circular in cross-section. These allow plasma to move from one side of the frame 1 to another and contribute to more uniform processing.
The frame 1 may include a handle 12 for removing the substrate mount from the plasma chamber.
Examples of the releasable securing mechanism 3 are described in further detail below. The same mechanisms may be used in both of the above embodiments. In other words, the mechanism 3 may be used for securing the first and second frame parts 1A, 1B together and/or securing the insert 4 to the frame 1. The type of mechanism 3 used is not particularly limited provided that it is releasable, i.e. the insert 4 can be easily removed from the frame 1, (preferably manually, without the need for a machine or tool). The mechanism 3 should, however, be suitable for use in a plasma processing apparatus. For example, the materials may be chosen to be compatible with the plasma processing. For example the mechanism 3 may be formed substantially from a metal, e.g. stainless steel or aluminium.
The releasable securing mechanism 3 may comprise a spring element 31 configured to provide a securing force. The securing force may act to press the first and second frame parts 1A, 1B together (as in the case of the first embodiment described above), and/or press the insert 4 and the frame 1 together (as in the case of the second embodiment described above). The spring element 31 may comprise at least one of a coil spring, a leaf spring and a plate spring, for example.
The releasable securing mechanism 3 may comprise an abutment member 32 configured to apply the securing force therethrough. In other words, the force generated by the spring element may be transferred through the abutment member 32.
In the first embodiment, the releasable securing mechanism 3 may be provided on the second frame part 1B, as shown in
In the second embodiment, the releasable securing mechanism 3 may be provided on the frame 1, as show in
However, alternatively, releasable securing mechanism 3 may be provided on both sides of the insert 4 in the aperture 2.
In one example not shown, the abutment member 32 may also be the spring element 31. For example, the abutment member 32 may be formed from a resilient material configured to provide the securing force.
In another example, e.g. as shown in
As shown
The releasable securing mechanism 3 may be selectably configurable between a first arrangement configured to secure the insert 4 and a second arrangement configured not to secure the insert 4.
In one example, the releasable securing mechanism 3 may configured to rotate between the first arrangement and the second arrangement. For example, as in the example shown in
In another example, not shown in the drawings, the releasable securing mechanism 3 may be configured to slide linearly between the first arrangement and the second arrangement. For example, the securing mechanism 3 may be a sliding bolt.
Various other releasable securing mechanisms 3 may be used. For example, the releasable securing mechanism 3 may comprise a snap-fit mechanism. Alternatively, the releasable securing mechanism 3 may comprise a bolt, a screw, a latch, a clip or a screw clamp, for example.
Multiple releasable securing mechanisms 3 may be used to secure each insert 4 to the frame 1 or to secure the frame parts 1A, 1B together. The releasable securing mechanisms 3 are preferably arranged on the frame 1 so as not to partially block the through-holes 11 provided within the frame 1 and/or through holes 45 in the insert 4.
The releasable securing mechanisms 3 may be arranged around the aperture 2 so as to evenly distribute the securing force over the substrate. This ensures that the substrate is under minimal stress when processing occurs. Too much stress may lead to unsatisfactory processing. Releasable securing mechanisms 3 may be distributed symmetrically around the aperture 2. An axis of symmetry of the arrangement of releasable securing mechanisms 3 may be the same as an axis of symmetry of the aperture 2.
The aperture 2 of the frame 1 may comprises a shelf member 21 configured to support the insert 4 within the aperture 2. The shelf member 21 may be formed from a part of the frame 1. A shelf member 21 is shown in
In the case of the first embodiment, a shelf member 21 may be provided in each of the first and second frame parts 1A, 1B, e.g. closer to the outside surfaces of the constructed frame 1. In the case of the second embodiment, a single shelf member 21 is provided e.g. on an opposite side of the frame 1 from the releasable securing mechanism 3.
The aperture 2 may be any shape. However, preferably the aperture 2 has a rectangular cross-section normal to an axis passing through the aperture in a thickened direction of the frame 1. Preferably, a plurality of identical apertures 4 are provided in the frame 1.
As shown in
As shown in Fig., the insert 4 may comprise a mask 43 formed from a first material and configured to support the substrate 5 such that a portion of the substrates is masked so as not to be processed by the plasma processing apparatus. The first material may a flexible material. For example, the first material may be one of Flourosilicone, Hypalon, Natural (Gum) Rubber, Neoprene, Nitrile Buna-N, Polyurethane, Santoprene, SBR (Red Rubber), Silicone, Skirtboard, Sponge Rubber, Urethane, VitonĀ® and White FDA Neo/Buna. The insert 4 may comprise through-holes 45 (eg. Circular) configured to allow plasma to pass through the insert. The first material should be compatible with the plasma processing.
Alternatively, as shown in
The insert 4 may be entirely formed from the first material, for example as shown in
Preferably, the second material is a rigid material. The second material may be the same material from which the frame is formed. For example, the second material may be a metal e.g. stainless steel, but preferably aluminium. The insert frame 42 may surround the mask 43, either partially or completely, as viewed from above (in a thickness direction). This mask 43 may be fixed to the frame in a non-releasable manner, e.g. with an adhesive.
The aperture 41 of the insert 4 may comprises a shelf member configured to support the substrate within the aperture 41. The shelf member may be formed by a relatively narrow portion of the aperture 2 such that the substrate 5 is prevented from passing through the aperture 41 beyond the location of the shelf member. The shelf member may be formed by a flat surface on which the substrate 5 can rest. However, this is not essential, e.g. the surface may be sloped relative to the walls of the rest of the aperture. A shelf member may be provided in each of the first and second insert parts 4A, 4B, e.g. closer to the outside surfaces of the constructed insert 4.
The shape of the insert 4 and the shape of the aperture 2 in the frame 1 of the substrate mount should be mutually configured to fit with one another.
It should be understood that variations of the above embodiments and examples are possible within the scope of the invention as defined by the appended claims.
Number | Date | Country | Kind |
---|---|---|---|
1713202.8 | Aug 2017 | GB | national |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/GB2018/052317 | 8/15/2018 | WO | 00 |