Number | Name | Date | Kind |
---|---|---|---|
4868785 | Jordan et al. | Sep 1989 | |
4894829 | Monie et al. | Jan 1990 | |
5206582 | Ekstedt et al. | Apr 1993 | |
5371851 | Pieper et al. | Dec 1994 | |
5377203 | Khan | Dec 1994 | |
5434805 | Iwasaki | Jul 1995 | |
5446742 | Vahabi et al. | Aug 1995 | |
5541862 | Bright et al. | Jul 1996 | |
5615219 | Keating et al. | Mar 1997 | |
5668745 | Day | Sep 1997 |
Entry |
---|
IMS, "IMS Announces Significant Enhancements in Virtual Test Enviroment" Oct. 21, 1996. |
Bradely et al., "Hewlett-Packard Report", Electronic News, Feb. 10, 1997. |
Cadence Design Systems, "Tester Aim to Cut Costs", Electronic Engineering Times, Aug. 8, 1994. |
Novellino, "Test Station delivers ATE-like Performance", Electronic Design, Oct. 10, 1991. |